11.
Sárkány, Zoltán ; Vass-Varnai, András ; Rencz, Márta
Analysis of concurrent failure mechanisms in IGBT structures during active power cycling tests
In: IEEE (eds.) 2014 IEEE 16th Electronics Packaging Technology Conference (EPTC)
Piscataway (NJ), United States of America : Institute of Electrical and Electronics Engineers (2014) pp. 650-654. Paper: 7028349 , 5 p.
DOI WoS Scopus
Publication:2846370 Published Core Citing Chapter in Book (Conference paper ) Scientific
Citing papers: 6 | Independent citation: 5 | Self citation: 1 | Unknown citation: 0 | Number of citations in WoS: 5 | Number of citations in Scopus: 3 | WoS/Scopus assigned: 5 | Number of citations with DOI: 5
Conference paper (Chapter in Book) | Scientific[2846370] [Approved]
All citations+mentions: 6, External citations: 5, Self citations: 1, Unhandled citations: 0
12.
Sarkany, Zoltán ; Vass-Varnai, András ; Rencz, Márta
Separation of failure modes in short cycle time power cycling experiments
In: Chris, Bailey; Marta, Rencz; Bernhard, Wunderle (eds.) 20th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC'14)
New York City, United States of America : IEEE (2014) Paper: 1021 , 5 p.
DOI WoS Scopus
Publication:2846311 Published Core Citing Chapter in Book (Conference paper ) Scientific
Conference paper (Chapter in Book) | Scientific[2846311] [Approved]
13.
Zoltan, Sarkany ; Andras, Vass-Varnai ; Marta, Rencz
Comparison of different power cycling strategies for accelerated lifetime testing of power devices
In: Electronics System-Integration Technology Conference (ESTC), 2014
(2014) pp. 1-5. Paper: 6962833 , 5 p.
DOI Scopus
Publication:2846271 Admin approved Core Citing Conference paper (Conference paper ) Scientific
Citing papers: 6 | Independent citation: 6 | Self citation: 0 | Unknown citation: 0 | Number of citations in WoS: 4 | Number of citations in Scopus: 3 | WoS/Scopus assigned: 5 | Number of citations with DOI: 6
Conference paper (Conference paper) | Scientific[2846271] [Admin approved]
All citations+mentions: 6, External citations: 6, Self citations: 0, Unhandled citations: 0
14.
Balázs, Plesz ; András, Vass-Várnai
Characterization of solar cells by thermal transient testing
MICROELECTRONICS JOURNAL 45 : 12 pp. 1710-1715. , 6 p. (2014)
DOI WoS Scopus
Publication:2828102 Validated Core Journal Article (Article ) Scientific
Citing papers: 5 | Independent citation: 3 | Self citation: 2 | Unknown citation: 0 | Number of citations in WoS: 2 | Number of citations in Scopus: 2 | WoS/Scopus assigned: 2 | Number of citations with DOI: 3
Article (Journal Article) | Scientific[2828102] [Validated]
All citations+mentions: 5, External citations: 3, Self citations: 2, Unhandled citations: 0
15.
Andras, Vass-Varnai ; Zoltan, Sarkany ; Attila, Szel ; Marta, Rencz
Simulation Based Method to Eliminate the Effect of Electrical Transients from Thermal Transient Measurements
In: International Conference on Electronics Packaging, ICEP 2014
Toyama, Japan, New York City, United States of America : IEEE (2014) pp. 591-595. , 5 p.
DOI WoS Scopus
Publication:2699447 Published Core Citing Chapter in Book (Conference paper ) Scientific
Citing papers: 4 | Independent citation: 2 | Self citation: 2 | Unknown citation: 0 | Number of citations in WoS: 4 | Number of citations in Scopus: 3 | WoS/Scopus assigned: 4 | Number of citations with DOI: 4
Conference paper (Chapter in Book) | Scientific[2699447] [Approved]
All citations+mentions: 4, External citations: 2, Self citations: 2, Unhandled citations: 0
16.
Zoltan, Sarkany ; Andras, Vass-Varnai ; Sandor, Laky ; Marta, Rencz
Thermal Transient Analysis of Semiconductor Device Degradation in Power Cycling Reliability Tests with Variable Control Strategies
In: Paul, Wesling; Kathe, Erickson (eds.) Thirtieth Annual SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT SYMPOSIUM
New York City, United States of America : Institute of Electrical and Electronics Engineers (2014) 259 p. pp. 236-241. , 6 p.
DOI WoS Scopus
Publication:2699395 Admin approved Core Citing Chapter in Book (Conference paper ) Scientific
Citing papers: 8 | Independent citation: 8 | Self citation: 0 | Unknown citation: 0 | Number of citations in WoS: 8 | Number of citations in Scopus: 4 | WoS/Scopus assigned: 8 | Number of citations with DOI: 8
Conference paper (Chapter in Book) | Scientific[2699395] [Admin approved]
All citations+mentions: 8, External citations: 8, Self citations: 0, Unhandled citations: 0
17.
Andras, Vass-Varnai ; Zoltan, Sarkany ; Barna, Csaba ; Sandor, Laky ; Marta, Rencz
A possible method to assess the accuracy of a TIM tester
In: International conference on Electronics Packaging, ICEP 2013
(2013) Paper: B11
Publication:2698364 Admin approved Core Conference paper (Conference paper )
Conference paper (Conference paper) | Scientific[2698364] [Admin approved]
18.
Sárkány, Zoltán ; Vass-Varnai, András ; Rencz, Márta
Investigation of die-attach degradation using power cycling tests
In: Ashok, Anand (eds.) 2013 IEEE 15th Electronics Packaging Technology Conference (EPTC 2013)
Zurich, Switzerland : Trans Tech Publications Ltd. (2013) pp. 780-784. Paper: 6745827 , 5 p.
DOI WoS Scopus
Publication:2696522 Published Core Citing Chapter in Book (Conference paper ) Scientific
Citing papers: 10 | Independent citation: 10 | Self citation: 0 | Unknown citation: 0 | Number of citations in WoS: 8 | Number of citations in Scopus: 7 | WoS/Scopus assigned: 9 | Number of citations with DOI: 8
Conference paper (Chapter in Book) | Scientific[2696522] [Approved]
All citations+mentions: 10, External citations: 10, Self citations: 0, Unhandled citations: 0
19.
Andras, Vass-Varnai ; Sandor, Laky ; Zoltan, Sarkany ; Csaba, Barna ; Marta, Rencz
Issues of finding a proper golden-reference sample for TIM tester calibration
In: Wesling, P; Erickson, K (eds.) 29th IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM'13)
New York City, United States of America : IEEE Press (2013) 288 p. pp. 200-205. Paper: 6526829 , 6 p.
DOI WoS Scopus
Publication:2696519 Published Core Citing Chapter in Book (Conference paper ) Scientific
Conference paper (Chapter in Book) | Scientific[2696519] [Approved]
20.
Zoltan, Sarkany ; Andras, Vass-Varnai ; Gusztav, Hantos ; Marta, Rencz
Failure prediction of IGBT modules based on power cycling tests
In: Raad, P E; Rencz, M; Wunderle, B; Poppe, A (eds.) 19th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC 2013)
New York City, United States of America : Institute of Electrical and Electronics Engineers (2013) 389 p. pp. 270-273. , 4 p.
DOI WoS Scopus
Publication:2696514 Published Core Chapter in Book (Conference paper ) Scientific
Citing papers: 10 | Independent citation: 10 | Self citation: 0 | Unknown citation: 0 | Number of citations in WoS: 10 | Number of citations in Scopus: 5 | WoS/Scopus assigned: 10 | Number of citations with DOI: 10 (Not published: 1)
Conference paper (Chapter in Book) | Scientific[2696514] [Approved]
All citations+mentions: 10, External citations: 10, Self citations: 0, Unhandled citations: 0
2024-05-19 19:35