Smart Structures and Materials 2002: Smart Structures and Integrated Systems

Porter, Davis L [ed.]

English

Published: International Society for Optics and Photonics, Washington D.C., United States of America, Bellingham (WA), United States of America 2002

Series: Proceedings of SPIE 0277-786X 1996-756X

Identifiers

MTMT: 30036930

Chapters

Amaravadi Venkata K et al. Structural integrity monitoring of composite patch repairs using wavelet analysis and neural networks. (2002) In: Smart Structures and Materials 2002: Smart Structures and Integrated Systems pp. 156-166

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2025-04-25 02:59