Structural integrity monitoring of composite patch repairs using wavelet analysis and neural networks

Amaravadi, Venkata K; Mitchell, Kyle; Rao, Vittal S; Derriso, Mark M

English
    Identifiers
    • MTMT: 21020203
    Citation styles: IEEEACMAPAChicagoHarvardCSLCopyPrint
    2025-04-25 16:46