1.
Al-abassi, Salam A. W. ; Darwish, Mahmoud ; Pohl, László ; Mizsei, János ; Neumann, Péter
Comparative multiphysics simulation of VO2 based lateral devices
In: Vadim, Tsoi; Lorenzo, Codecasa; Bernhard, Wunderle (eds.) Proceedings of the 27th International Workshop on THERMal INvestigations of ICs and Systems (THERMINIC'21 online)
Piscataway (NJ), United States of America : IEEE (2021) pp. 178-181. , 4 p.
DOI IEEE Xplore REAL WoS Scopus Google scholar
Publication:32236558 Validated Core Citing Chapter in Book (Conference paper ) Scientific
Citing papers: 1 | Independent citation: 0 | Self citation: 1 | Unknown citation: 0 | Number of citations in WoS: 1 | Number of citations in Scopus: 1 | WoS/Scopus assigned: 1 | Number of citations with DOI: 1
Conference paper (Chapter in Book) | Scientific[32236558] [Validated]
All citations+mentions: 1, External citations: 0, Self citations: 1, Unhandled citations: 0
2.
Darwish, Mahmoud ; Neumann, Péter ; Mizsei, János ; Pohl, László ✉
Electro-Thermal Simulation of Vertical VO2 Thermal-Electronic Circuit Elements
ENERGIES 13 : 13 Paper: 3447 (2020)
DOI WoS Scopus Other URL Full text
Publication:31369246 Validated Core Citing Journal Article (Article ) Scientific
Citing papers: 6 | Independent citation: 3 | Self citation: 3 | Unknown citation: 0 | Number of citations in WoS: 4 | Number of citations in Scopus: 4 | WoS/Scopus assigned: 5 | Number of citations with DOI: 6
Article (Journal Article) | Scientific[31369246] [Validated]
All citations+mentions: 6, External citations: 3, Self citations: 3, Unhandled citations: 0
3.
Darwish, Mahmoud ; Neumann, Péter ; Mizsei, János** ; Pohl, László ✉
Study of Dynamic Simulation for Thermal-Electronic Logic Circuits
In: IEEE (eds.) Proceedings of the 26th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
Piscataway (NJ), United States of America : IEEE (2020) pp. 97-102. Paper: 9420495 , 6 p.
DOI IEEE Xplore Scopus
Publication:31778148 Validated Core Citing Chapter in Book (Conference paper ) Scientific
Conference paper (Chapter in Book) | Scientific[31778148] [Validated]
4.
László, Pohl ; Mahmoud, Darwish ; János, Mizsei
Electro-Thermal Investigation of SMT Resistors for Thermal-Electrical Logic Circuits by Simulation
In: 2019 25TH INTERNATIONAL WORKSHOP ON THERMAL INVESTIGATIONS OF ICS AND SYSTEMS (THERMINIC 2019)
New York City, United States of America : IEEE (2019) pp. 1-4. Paper: 8923402 , 4 p.
DOI IEEE Xplore WoS Scopus
Publication:30842714 Published Core Citing Chapter in Book (Conference paper ) Scientific
Citing papers: 4 | Independent citation: 0 | Self citation: 4 | Unknown citation: 0 | Number of citations in WoS: 3 | Number of citations in Scopus: 4 | WoS/Scopus assigned: 4 | Number of citations with DOI: 4
Conference paper (Chapter in Book) | Scientific[30842714] [Approved]
All citations+mentions: 4, External citations: 0, Self citations: 4, Unhandled citations: 0
5.
Paolucci, Federico ; Marchegiani, Giampiero ; Strambini, Elia ; Giazotto, Francesco
Phase-Tunable Thermal Logic: Computation with Heat
PHYSICAL REVIEW APPLIED 10 : 2 Paper: 024003 , 10 p. (2018)
DOI WoS
Publication:27606379 Admin approved Citing Journal Article (Article ) Scientific
Article (Journal Article) | Scientific[27606379] [Admin approved]
6.
László, Pohl ; Soma, Ur ; János, Mizsei
Thermoelectrical modelling and simulation of devices based on VO2
MICROELECTRONICS RELIABILITY 79 pp. 387-394. , 8 p. (2017)
DOI ScienceDirect WoS Scopus
Publication:3204967 Admin approved Core Citing Journal Article (Article ) Scientific
Citing papers: 12 | Independent citation: 6 | Self citation: 6 | Unknown citation: 0 | Number of citations in WoS: 10 | Number of citations in Scopus: 9 | WoS/Scopus assigned: 11 | Number of citations with DOI: 11
Article (Journal Article) | Scientific[3204967] [Admin approved]
All citations+mentions: 12, External citations: 6, Self citations: 6, Unhandled citations: 0
7.
Soma, Ur ; János, Mizsei ; László, Pohl
Modelling of the Thermoelectrical Performance of Devices Based on VO2
In: András, Poppe (eds.) 2016 22nd International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC'16)
New York City, United States of America : IEEE (2016) 349 p. pp. 307-310. , 4 p.
DOI IEEE Xplore WoS Scopus Google scholar
Publication:3117643 Validated Core Citing Chapter in Book (Conference paper ) Scientific
Citing papers: 2 | Independent citation: 1 | Self citation: 1 | Unknown citation: 0 | Number of citations in WoS: 1 | Number of citations in Scopus: 2 | WoS/Scopus assigned: 2 | Number of citations with DOI: 2
Conference paper (Chapter in Book) | Scientific[3117643] [Validated]
All citations+mentions: 2, External citations: 1, Self citations: 1, Unhandled citations: 0
8.
János, Mizsei ; Márton, C Bein ; Jyrki, Lappalainen ; László, Juhász
Thermal-Electronic Circuits: Basics, Simulations, Experiments
In: Chris, Bailey; Bernhard, Wunderle; Sebastian, Volz (eds.) 2015 21st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
New York City, United States of America : IEEE (2015) Paper: 7389599 , 6 p.
DOI WoS Scopus
Publication:2953874 Published Core Citing Chapter in Book (Conference paper ) Scientific
Citing papers: 2 | Independent citation: 2 | Self citation: 0 | Unknown citation: 0 | Number of citations in WoS: 1 | Number of citations in Scopus: 2 | WoS/Scopus assigned: 2 | Number of citations with DOI: 2
Conference paper (Chapter in Book) | Scientific[2953874] [Approved]
All citations+mentions: 2, External citations: 2, Self citations: 0, Unhandled citations: 0
9.
J, Mizsei ✉ ; M C, Bein ; J, Lappalainen ; L, Juhász ; B, Plesz
The Phonsistor – A Novel VO2 Based Nanoscale Thermal-electronic Device and Its Application in Thermal-electronic Logic Circuits (TELC)
MATERIALS TODAY: PROCEEDINGS 2 : 8 pp. 4272-4279. , 8 p. (2015)
DOI WoS Scopus
Publication:2984697 Validated Core Citing Journal Article (Conference paper in journal ) Scientific
Citing papers: 11 | Independent citation: 4 | Self citation: 7 | Unknown citation: 0 | Number of citations in WoS: 8 | Number of citations in Scopus: 10 | WoS/Scopus assigned: 10 | Number of citations with DOI: 10
Conference paper in journal (Journal Article) | Scientific[2984697] [Validated]
All citations+mentions: 11, External citations: 4, Self citations: 7, Unhandled citations: 0
10.
J, Mizsei ; M C, Bein ; J, Lappalainen ; L, Juhász
Thermal-electronic logic circuits: Scaling down
MICROELECTRONICS JOURNAL 46 : 12 A pp. 1175-1178. , 4 p. (2015)
DOI ScienceDirect WoS Scopus
Publication:2976582 Validated Core Citing Journal Article (Article ) Scientific
Citing papers: 8 | Independent citation: 2 | Self citation: 6 | Unknown citation: 0 | Number of citations in WoS: 7 | Number of citations in Scopus: 6 | WoS/Scopus assigned: 8 | Number of citations with DOI: 8
Article (Journal Article) | Scientific[2976582] [Validated]
All citations+mentions: 8, External citations: 2, Self citations: 6, Unhandled citations: 0
11.
Mizsei, J ; Bein, M C ; Juhasz, L ; Jelinek, E
Thermal-electronic devices and thermal-electronic logic circuits (TELC)
In: Franz, M; Krammer, O; Nicolics, J; Wohlrabe, H (eds.) 38th International Spring Seminar on Electronics Technology (ISSE)
Piscataway (NJ), United States of America : IEEE (2015) pp. 61-65. , 5 p.
DOI WoS Scopus
Publication:2954107 Validated Core Citing Chapter in Book (Conference paper ) Scientific
Citing papers: 3 | Independent citation: 1 | Self citation: 2 | Unknown citation: 0 | Number of citations in WoS: 2 | Number of citations in Scopus: 3 | WoS/Scopus assigned: 3 | Number of citations with DOI: 3
Conference paper (Chapter in Book) | Scientific[2954107] [Validated]
All citations+mentions: 3, External citations: 1, Self citations: 2, Unhandled citations: 0
12.
János, Mizsei ; Márton, C Bein ; Jyrki, Lappalainen ; László, Juhász
Scaling of Thermal-Electronic Logic Circuits
In: Chris, Bailey; Marta, Rencz; Bernhard, Wunderle (eds.) 20th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC'14)
New York City, United States of America : IEEE (2014) Paper: 6972509 , 3 p.
DOI WoS Scopus
Publication:2739978 Published Core Citing Chapter in Book (Conference paper ) Scientific
Conference paper (Chapter in Book) | Scientific[2739978] [Approved]
2026-04-16 00:12