1.
Piscataway (NJ), United States of America : IEEE (2021) pp. 178-181. , 4 p.
Publication:32236558 Validated Core Citing Chapter in Book (Conference paper ) Scientific
Citing papers: 1 | Independent citation: 0 | Self citation: 1 | Unknown citation: 0 | Number of citations in WoS: 1 | Number of citations in Scopus: 1 | WoS/Scopus assigned: 1 | Number of citations with DOI: 1
Conference paper (Chapter in Book) | Scientific[32236558] [Validated]
All citations+mentions: 1, External citations: 0, Self citations: 1, Unhandled citations: 0
2.
ENERGIES 13 : 13 Paper: 3447 (2020)
Publication:31369246 Validated Core Citing Journal Article (Article ) Scientific
Citing papers: 6 | Independent citation: 3 | Self citation: 3 | Unknown citation: 0 | Number of citations in WoS: 4 | Number of citations in Scopus: 4 | WoS/Scopus assigned: 5 | Number of citations with DOI: 6
Article (Journal Article) | Scientific[31369246] [Validated]
All citations+mentions: 6, External citations: 3, Self citations: 3, Unhandled citations: 0
3.
Piscataway (NJ), United States of America : IEEE (2020) pp. 97-102. Paper: 9420495 , 6 p.
Publication:31778148 Validated Core Citing Chapter in Book (Conference paper ) Scientific
Conference paper (Chapter in Book) | Scientific[31778148] [Validated]
4.
New York City, United States of America : IEEE (2019) pp. 1-4. Paper: 8923402 , 4 p.
Publication:30842714 Published Core Citing Chapter in Book (Conference paper ) Scientific
Citing papers: 4 | Independent citation: 0 | Self citation: 4 | Unknown citation: 0 | Number of citations in WoS: 3 | Number of citations in Scopus: 4 | WoS/Scopus assigned: 4 | Number of citations with DOI: 4
Conference paper (Chapter in Book) | Scientific[30842714] [Approved]
All citations+mentions: 4, External citations: 0, Self citations: 4, Unhandled citations: 0
5.
Paolucci, Federico ; Marchegiani, Giampiero ; Strambini, Elia ; Giazotto, Francesco
PHYSICAL REVIEW APPLIED 10 : 2 Paper: 024003 , 10 p. (2018)
Publication:27606379 Admin approved Citing Journal Article (Article ) Scientific
Article (Journal Article) | Scientific[27606379] [Admin approved]
6.
MICROELECTRONICS RELIABILITY 79 pp. 387-394. , 8 p. (2017)
Publication:3204967 Admin approved Core Citing Journal Article (Article ) Scientific
Citing papers: 12 | Independent citation: 6 | Self citation: 6 | Unknown citation: 0 | Number of citations in WoS: 10 | Number of citations in Scopus: 9 | WoS/Scopus assigned: 11 | Number of citations with DOI: 11
Article (Journal Article) | Scientific[3204967] [Admin approved]
All citations+mentions: 12, External citations: 6, Self citations: 6, Unhandled citations: 0
7.
New York City, United States of America : IEEE (2016) 349 p. pp. 307-310. , 4 p.
Publication:3117643 Validated Core Citing Chapter in Book (Conference paper ) Scientific
Citing papers: 2 | Independent citation: 1 | Self citation: 1 | Unknown citation: 0 | Number of citations in WoS: 1 | Number of citations in Scopus: 2 | WoS/Scopus assigned: 2 | Number of citations with DOI: 2
Conference paper (Chapter in Book) | Scientific[3117643] [Validated]
All citations+mentions: 2, External citations: 1, Self citations: 1, Unhandled citations: 0
8.
In: Chris, Bailey; Bernhard, Wunderle; Sebastian, Volz (eds.) 2015 21st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
New York City, United States of America : IEEE (2015) Paper: 7389599 , 6 p.
Publication:2953874 Published Core Citing Chapter in Book (Conference paper ) Scientific
Citing papers: 2 | Independent citation: 2 | Self citation: 0 | Unknown citation: 0 | Number of citations in WoS: 1 | Number of citations in Scopus: 2 | WoS/Scopus assigned: 2 | Number of citations with DOI: 2
Conference paper (Chapter in Book) | Scientific[2953874] [Approved]
All citations+mentions: 2, External citations: 2, Self citations: 0, Unhandled citations: 0
9.
J, Mizsei ✉ ; M C, Bein ; J, Lappalainen ; L, Juhász ; B, Plesz
MATERIALS TODAY: PROCEEDINGS 2 : 8 pp. 4272-4279. , 8 p. (2015)
Publication:2984697 Validated Core Citing Journal Article (Conference paper in journal ) Scientific
Citing papers: 11 | Independent citation: 4 | Self citation: 7 | Unknown citation: 0 | Number of citations in WoS: 8 | Number of citations in Scopus: 10 | WoS/Scopus assigned: 10 | Number of citations with DOI: 10
Conference paper in journal (Journal Article) | Scientific[2984697] [Validated]
All citations+mentions: 11, External citations: 4, Self citations: 7, Unhandled citations: 0
10.
J, Mizsei ; M C, Bein ; J, Lappalainen ; L, Juhász
MICROELECTRONICS JOURNAL 46 : 12 A pp. 1175-1178. , 4 p. (2015)
Publication:2976582 Validated Core Citing Journal Article (Article ) Scientific
Citing papers: 8 | Independent citation: 2 | Self citation: 6 | Unknown citation: 0 | Number of citations in WoS: 7 | Number of citations in Scopus: 6 | WoS/Scopus assigned: 8 | Number of citations with DOI: 8
Article (Journal Article) | Scientific[2976582] [Validated]
All citations+mentions: 8, External citations: 2, Self citations: 6, Unhandled citations: 0
11.
In: Franz, M; Krammer, O; Nicolics, J; Wohlrabe, H (eds.) 38th International Spring Seminar on Electronics Technology (ISSE)
Piscataway (NJ), United States of America : IEEE (2015) pp. 61-65. , 5 p.
Publication:2954107 Validated Core Citing Chapter in Book (Conference paper ) Scientific
Citing papers: 3 | Independent citation: 1 | Self citation: 2 | Unknown citation: 0 | Number of citations in WoS: 2 | Number of citations in Scopus: 3 | WoS/Scopus assigned: 3 | Number of citations with DOI: 3
Conference paper (Chapter in Book) | Scientific[2954107] [Validated]
All citations+mentions: 3, External citations: 1, Self citations: 2, Unhandled citations: 0
12.
In: Chris, Bailey; Marta, Rencz; Bernhard, Wunderle (eds.) 20th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC'14)
New York City, United States of America : IEEE (2014) Paper: 6972509 , 3 p.
Publication:2739978 Published Core Citing Chapter in Book (Conference paper ) Scientific
Conference paper (Chapter in Book) | Scientific[2739978] [Approved]
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