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      <comment>Department of Electron Devices, Faculty of Electrical Engineering and Informatics, Budapest University of Technology and Economics, Magyar tudosok korutja 2, Budapest, H-1117, Hungary            
            Department of Electrical and Electronics Engineering, Thi-Qar University, P.O.B 0535, Nassiriya, 64001, Iraq            
            Export Date: 22 September 2022            
            Correspondence Address: Abdulrazzaq, A.K.; Department of Electron Devices, Magyar tudosok korutja 2, Hungary; email: ali.k.abdulrazzaq@edu.bme.hu</comment>
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&lt;div class=&quot;lastModified&quot;&gt;Utolsó módosítás: 2022.09.28. 14:11 Andódy Katalin (BME admin4)
&lt;/div&gt;




	&lt;pre class=&quot;comment&quot; style=&quot;margin-top: 0; margin-bottom: 0;&quot;&gt;&lt;u&gt;Megjegyzés&lt;/u&gt;: Department of Electron Devices, Faculty of Electrical Engineering and Informatics, Budapest University of Technology and Economics, Magyar tudosok korutja 2, Budapest, H-1117, Hungary            
            Department of Electrical and Electronics Engineering, Thi-Qar University, P.O.B 0535, Nassiriya, 64001, Iraq            
            Export Date: 22 September 2022            
            C...&lt;/pre&gt;

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      <abstractText>Limits of development of conventional silicon-based integrated 
circuits get closer. More and more effort is done
to develop new devices for integrated circuits. A promising 
structure is based on the semiconductor-to-metal
phase change of vanadium-dioxide at about 67 °C. In these 
circuits the information is carried by combined thermal
and electrical currents. For device modelling and circuit 
design, accurate distributed electro-thermal transient
simulation is mandatory. This paper is the first one to 
present an electro-thermal transient simulation
method for VO2 devices operating in real-world conditions. The 
paper presents three VO2 material models, the
algorithmic extension of an electro-thermal field simulator to 
be able to handle hysteresis and the transient simulation
issues of VO2 and the modelling of VO2 based devices. The 
paper compares measured and simulated device
characteristics.</abstractText>
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    &lt;div class=&quot;mtid&quot;&gt;&lt;span class=&quot;long-pub-mtid&quot;&gt;Közlemény: 3204967&lt;/span&gt;
    | &lt;span class=&quot;status-data status-ADMIN_APPROVED&quot;&gt; 	Admin láttamozott
  &lt;/span&gt;
        
	&lt;span class=&quot;oldId&quot;&gt;Régi azonosító: 3204967&lt;/span&gt; | 
	
Forrás	 Idéző
	
	
    | &lt;span class=&quot;type-subtype&quot;&gt;Folyóiratcikk
			( Szakcikk
			
			)
		&lt;/span&gt;
      		| &lt;span class=&quot;pub-category&quot;&gt;Tudományos&lt;/span&gt;
	| &lt;span class=&quot;publication-sourceOfData&quot;&gt;kézi felvitel&lt;/span&gt;
&lt;/div&gt;


&lt;div class=&quot;lastModified&quot;&gt;Utolsó módosítás: 2021.01.15. 16:10 Sövény Emese (BME admin 5)
&lt;/div&gt;




	&lt;pre class=&quot;comment&quot; style=&quot;margin-top: 0; margin-bottom: 0;&quot;&gt;&lt;u&gt;Megjegyzés&lt;/u&gt;: WoS:hiba:000417774400046 2020-08-29 11:08 cikkazonosító nem egyezik&lt;/pre&gt;

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