TY  - JOUR
AU  - Németh, Péter
AU  - Mugnaioli, E
AU  - Gemmi, M
AU  - Czuppon, György
AU  - Demény, Attila
AU  - Spötl, C
TI  - A nanocrystalline monoclinic CaCO3 precursor of metastable aragonite
JF  - SCIENCE ADVANCES
J2  - SCI ADV
VL  - 4
PY  - 2018
IS  - 12
PG  - 7
SN  - 2375-2548
DO  - 10.1126/sciadv.aau6178
UR  - https://m2.mtmt.hu/api/publication/30347426
ID  - 30347426
LA  - English
DB  - MTMT
ER  - 

TY  - JOUR
AU  - Krett, Gergely
AU  - Szabó, Attila
AU  - Felföldi, Tamás
AU  - Márialigeti, Károly
AU  - Kériné Borsodi, Andrea
TI  - The effect of reconstruction works on planktonic bacterial diversity of a unique thermal lake revealed by cultivation, molecular cloning and next generation sequencing
JF  - ARCHIVES OF MICROBIOLOGY
J2  - ARCH MICROBIOL
VL  - 199
PY  - 2017
IS  - 8
SP  - 1077
EP  - 1089
PG  - 13
SN  - 0302-8933
DO  - 10.1007/s00203-017-1379-9
UR  - https://m2.mtmt.hu/api/publication/3273962
ID  - 3273962
N1  - Megjegyzés-26978458
N1 Molecular Sequence Numbers: GENBANK: LN835423:LN835465, LT575238:LT575362
LA  - English
DB  - MTMT
ER  - 

TY  - JOUR
AU  - Demény, Attila
AU  - Németh, Péter
AU  - Czuppon, György
AU  - Leél-Őssy, Szabolcs
AU  - Szabó, Máté Zoltán
AU  - Judik, Katalin
AU  - Németh, Tibor
AU  - Stieber, J
TI  - Formation of amorphous calcium carbonate in caves and its implications for speleothem research
JF  - SCIENTIFIC REPORTS
J2  - SCI REP
VL  - 6
PY  - 2016
SN  - 2045-2322
DO  - 10.1038/srep39602
UR  - https://m2.mtmt.hu/api/publication/3158886
ID  - 3158886
LA  - English
DB  - MTMT
ER  - 

TY  - JOUR
AU  - Lábár, János
AU  - Adamik, Miklós
AU  - Barna B., Péter
AU  - Czigány, Zsolt
AU  - Fogarassy, Zsolt
AU  - Horváth, Zsolt Endre
AU  - Geszti, Olga
AU  - Misják, Fanni
AU  - Morgiel, J
AU  - Radnóczi, György
AU  - Sáfrán, György
AU  - Székely, Lajos
AU  - Szuts, T
TI  - Electron Diffraction Based Analysis of Phase Fractions and Texture in Nanocrystalline Thin Films, Part III: Application Examples
JF  - MICROSCOPY AND MICROANALYSIS
J2  - MICROSC MICROANAL
VL  - 18
PY  - 2012
IS  - 2
SP  - 406
EP  - 420
PG  - 15
SN  - 1431-9276
DO  - 10.1017/S1431927611012803
UR  - https://m2.mtmt.hu/api/publication/1962341
ID  - 1962341
AB  - In this series of articles, a method is presented that performs (semi) quantitative phase analysis for nanocrystalline transmission electron microscope samples from selected area electron diffraction (SAED) patterns. Volume fractions and degree of fiber texture are determined for the nanocrystalline components. The effect of the amorphous component is minimized by empirical background interpolation. First, the two-dimensional SAED pattern is converted into a one-dimensional distribution similar to X-ray diffraction. Volume fractions of the nanocrystalline components are determined by fitting the spectral components, calculated for the previously identified phases with a priori known structures. These Markers are calculated not only for kinematic conditions, but the Blackwell correction is also applied to take into account dynamic effects for medium thicknesses. Peak shapes and experimental parameters (camera length, etc.) are refined during the fitting iterations. Parameter space is explored with the help of the Downhill-SIMPLEX. The method is implemented in a computer program that runs under the Windows operating system. Part I presented the principles, while part II elaborated current implementation. The present part III demonstrates the usage and efficiency of the computer program by numerous examples. The suggested experimental protocol should be of benefit in experiments aimed at phase analysis using electron diffraction methods.
LA  - English
DB  - MTMT
ER  - 

TY  - JOUR
AU  - Lábár, János
TI  - Electron Diffraction Based Analysis of Phase Fractions and Texture in Nanocrystalline Thin Films, Part II: Implementation
JF  - MICROSCOPY AND MICROANALYSIS
J2  - MICROSC MICROANAL
VL  - 15
PY  - 2009
IS  - 1
SP  - 20
EP  - 29
PG  - 10
SN  - 1431-9276
DO  - 10.1017/S1431927609090023
UR  - https://m2.mtmt.hu/api/publication/141130
ID  - 141130
LA  - English
DB  - MTMT
ER  - 

TY  - JOUR
AU  - Lábár, János
TI  - Electron diffraction based analysis of phase fractions and texture in nanocrystalline thin films, Part I: Principles
JF  - MICROSCOPY AND MICROANALYSIS
J2  - MICROSC MICROANAL
VL  - 14
PY  - 2008
IS  - 4
SP  - 287
EP  - 295
PG  - 9
SN  - 1431-9276
DO  - 10.1017/S1431927608080380
UR  - https://m2.mtmt.hu/api/publication/1177893
ID  - 1177893
AB  - A method for phase analysis, similar to the Rietveld method in X-ray
diffraction, was not developed for electron diffraction (ED) in the
transmission electron microscope (TEM), mainly due to the dynamic
nature of ED. Nowadays, TEM laboratories encounter many thin samples
with grain size in the 1-30 nm range, not too far from the kinematic ED
conditions. This article describes a method that performs (semi)
quantitative phase analysis for nanocrystalline samples from selected
area electron diffraction (SAED) patterns. Fractions of the different
nanocrystalline components are determined from rotationally symmetric
ring patters. Both randomly oriented nanopowders and textured
nanopowders, observed from the direction of the texture axis produce
such SAED patterns. The textured fraction is determined as a separate
component by Fitting the spectral components, calculated for the
previously identified phases with a priori known structures, to the
measured distribution. The Blackman correction is applied to the set of
kinematic diffraction lines to take into account dynamic effects for
medium grain size. Parameters of the peak shapes and the other
experimental parameters are refined by exploring the parameter space
with the help of the Downhill-SIMPLEX. Part I presents the principles,
while future publication of Parts II and III will elaborate on current
implementation and will demonstrate its usage by examples, respectively.
LA  - English
DB  - MTMT
ER  -