@article{MTMT:3204967,
	title = {Thermoelectrical modelling and simulation of devices based on VO2},
	url = {https://m2.mtmt.hu/api/publication/3204967},
	author = {Pohl, László and Soma, Ur and Mizsei, János},
	doi = {10.1016/j.microrel.2017.03.027},
	journal-iso = {MICROELECTRON RELIAB},
	journal = {MICROELECTRONICS RELIABILITY},
	volume = {79},
	unique-id = {3204967},
	issn = {0026-2714},
	abstract = {Limits of development of conventional silicon-based integrated 
		circuits get closer. More and more effort is done
		to develop new devices for integrated circuits. A promising 
		structure is based on the semiconductor-to-metal
		phase change of vanadium-dioxide at about 67 °C. In these 
		circuits the information is carried by combined thermal
		and electrical currents. For device modelling and circuit 
		design, accurate distributed electro-thermal transient
		simulation is mandatory. This paper is the first one to 
		present an electro-thermal transient simulation
		method for VO2 devices operating in real-world conditions. The 
		paper presents three VO2 material models, the
		algorithmic extension of an electro-thermal field simulator to 
		be able to handle hysteresis and the transient simulation
		issues of VO2 and the modelling of VO2 based devices. The 
		paper compares measured and simulated device
		characteristics.},
	year = {2017},
	eissn = {1872-941X},
	pages = {387-394},
	orcid-numbers = {Pohl, László/0000-0003-2390-1381; Mizsei, János/0000-0003-3411-1502}
}

@article{MTMT:2908301,
	title = {Advancing the thermal stability of 3D ICs using logi-thermal simulation},
	url = {https://m2.mtmt.hu/api/publication/2908301},
	author = {Nagy, Gergely and Horváth, Péter and Pohl, László and Poppe, András},
	doi = {10.1016/j.mejo.2015.06.025},
	journal-iso = {MICROELECTRON J},
	journal = {MICROELECTRONICS JOURNAL},
	volume = {46},
	unique-id = {2908301},
	issn = {0959-8324},
	year = {2015},
	eissn = {1879-2391},
	pages = {1114-1120},
	orcid-numbers = {Horváth, Péter/0009-0006-0097-259X; Pohl, László/0000-0003-2390-1381; Poppe, András/0000-0002-9381-6716}
}

@inproceedings{MTMT:2698758,
	title = {Thermal-Electronic Integrated Logic},
	url = {https://m2.mtmt.hu/api/publication/2698758},
	author = {Mizsei, János and Jyrki, Lappalainen and Bein, Márton},
	booktitle = {19th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC 2013)},
	doi = {10.1109/THERMINIC.2013.6675249},
	unique-id = {2698758},
	year = {2013},
	pages = {128-134},
	orcid-numbers = {Mizsei, János/0000-0003-3411-1502}
}

@inproceedings{MTMT:2668775,
	title = {Contracting Current Paths in Vanadium Dioxide Thin Films},
	url = {https://m2.mtmt.hu/api/publication/2668775},
	author = {Bein, Márton and Mizsei, János},
	booktitle = {Proceedings of the 17th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC'11)},
	unique-id = {2668775},
	abstract = {Vanadium dioxide (VO2) has been extensively investigated due to 
		its thermal-induced metal-insulator transition (MIT) at about 67 
		oC; which can be lowered by doping. During the transition from 
		semiconductor to metallic phase electrical conductivity can 
		increase by up to 3-4 orders of magnitude, while optical 
		reflectance can drop by almost 50%. Possible applications 
		include thermally controlled electrical and optical switches. As 
		the thin film is conductive optical changes can be induced 
		electrically by Joule-heating.
		In this paper we present electro-optical measurements carried 
		out on 100 nm thick VO2 thin films deposited on sapphire 
		substrates. Phase transitions were electrically induced in 
		contacted films and observed using an optical microscope. Strong 
		spatial inhomogeneity has been detected: a few micron wide dark 
		path connected the two contacts. The visible channel is a 
		metallic area within the semiconducting film as the domain 
		undergoes a MIT because of the Joule-heat of the flowing 
		current.
		The optically observable fine structure found suggests that VO2 
		thin films could be used to visualize isotherms with a 
		resolution of a few microns, similar to that of liquid crystals. 
		Possible benefits include the simple and reliable use of the 
		once deposited solid phase precision films and a higher 
		resolution compared to liquid crystal thermography.},
	year = {2011},
	pages = {66-69},
	orcid-numbers = {Mizsei, János/0000-0003-3411-1502}
}