1.
Cardoso, André Gil ; Barros, Hugo ; Hantos, Gusztav
Fabrication, Performance and Reliability of a Thermally Enhanced Wafer Level Fan Out Demonstrator with Integrated Heatsink
In: András, Poppe (eds.) 2016 22nd International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC'16)
New York City, United States of America : IEEE (2016) 349 p. pp. 336-344. , 9 p.
DOI IEEE Xplore WoS Scopus
Publication:3148012 Validated Core Chapter in Book (Conference paper ) Scientific
Citing papers: 2 | Independent citation: 2 | Self citation: 0 | Unknown citation: 0 | Number of citations in WoS: 1 | Number of citations in Scopus: 1 | WoS/Scopus assigned: 2 | Number of citations with DOI: 1
Conference paper (Chapter in Book) | Scientific[3148012] [Validated]
All citations+mentions: 2, External citations: 2, Self citations: 0, Unhandled citations: 0
2026-04-19 23:22