@inproceedings{MTMT:2668775,
	title = {Contracting Current Paths in Vanadium Dioxide Thin Films},
	url = {https://m2.mtmt.hu/api/publication/2668775},
	author = {Bein, Márton and Mizsei, János},
	booktitle = {Proceedings of the 17th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC'11)},
	unique-id = {2668775},
	abstract = {Vanadium dioxide (VO2) has been extensively investigated due to 
		its thermal-induced metal-insulator transition (MIT) at about 67 
		oC; which can be lowered by doping. During the transition from 
		semiconductor to metallic phase electrical conductivity can 
		increase by up to 3-4 orders of magnitude, while optical 
		reflectance can drop by almost 50%. Possible applications 
		include thermally controlled electrical and optical switches. As 
		the thin film is conductive optical changes can be induced 
		electrically by Joule-heating.
		In this paper we present electro-optical measurements carried 
		out on 100 nm thick VO2 thin films deposited on sapphire 
		substrates. Phase transitions were electrically induced in 
		contacted films and observed using an optical microscope. Strong 
		spatial inhomogeneity has been detected: a few micron wide dark 
		path connected the two contacts. The visible channel is a 
		metallic area within the semiconducting film as the domain 
		undergoes a MIT because of the Joule-heat of the flowing 
		current.
		The optically observable fine structure found suggests that VO2 
		thin films could be used to visualize isotherms with a 
		resolution of a few microns, similar to that of liquid crystals. 
		Possible benefits include the simple and reliable use of the 
		once deposited solid phase precision films and a higher 
		resolution compared to liquid crystal thermography.},
	year = {2011},
	pages = {66-69},
	orcid-numbers = {Mizsei, János/0000-0003-3411-1502}
}

@article{MTMT:2606972,
	title = {Thermal mapping with liquid crystal method},
	url = {https://m2.mtmt.hu/api/publication/2606972},
	author = {Csendes, A and Székely, Vladimir and Kerecsen Istvánné Rencz, Márta},
	doi = {10.1016/0167-9317(95)00350-9},
	journal-iso = {MICROELECTRON ENG},
	journal = {MICROELECTRONIC ENGINEERING},
	volume = {31},
	unique-id = {2606972},
	issn = {0167-9317},
	abstract = {Good resolution thermal mapping can be achieved by using liquid crystals. The article presents a new, high resolution automated measuring equipment, which executes the measurement and the evaluation process under computer control. The equipment was developed especially for micro-thermography of integrated circuits. The paper presents the practical aspects of the liquid crystal measuring method. Resolution and accuracy features of the method are also discussed.},
	year = {1996},
	eissn = {1873-5568},
	pages = {281-290},
	orcid-numbers = {Kerecsen Istvánné Rencz, Márta/0000-0003-4183-3853}
}