TY  - JOUR
AU  - Kovács, Gábor
AU  - Pap, Zoltán
AU  - Le Viet, D
AU  - Wu Hen Chang, Antal
AU  - Csopaki, Gyula
TI  - Applying Mutation Analysis to SDL Specifications
JF  - LECTURE NOTES IN COMPUTER SCIENCE
J2  - LNCS
VL  - 2708
PY  - 2003
SP  - 269
EP  - 284
PG  - 16
SN  - 0302-9743
DO  - 10.1007/3-540-45075-0_16
UR  - https://m2.mtmt.hu/api/publication/2606946
ID  - 2606946
N1  - WoS:hiba:000185073200016 2020-08-27 02:45 típus nem egyezik
AB  - Mutation analysis is a fault based testing method used initially for code based software testing, and lately for specification based testing and validation as well. In this paper, the method is applied to SDL (Specification and Description Language) specifications. It is used to automate the process of conformance test generation and selection for telecommunications protocols. We present two algorithms for automatic test generation and selection. These provide the basis of the Test Selector tool developed at the Budapest University of Technology and Economics. We present the results of an empirical study using the tool.
LA  - English
DB  - MTMT
ER  - 

TY  - JOUR
AU  - Csöndes, Tibor
AU  - Kotnyek, Balázs
AU  - Zoltán, Szabó János
TI  - Application of heuristic methods for conformance test selection
JF  - EUROPEAN JOURNAL OF OPERATIONAL RESEARCH
J2  - EJOR
VL  - 142
PY  - 2002
IS  - 1
SP  - 203
EP  - 218
PG  - 16
SN  - 0377-2217
DO  - 10.1016/S0377-2217(01)00284-3
UR  - https://m2.mtmt.hu/api/publication/2654494
ID  - 2654494
LA  - English
DB  - MTMT
ER  -