TY - JOUR AU - Kovács, Gábor AU - Pap, Zoltán AU - Le Viet, D AU - Wu Hen Chang, Antal AU - Csopaki, Gyula TI - Applying Mutation Analysis to SDL Specifications JF - LECTURE NOTES IN COMPUTER SCIENCE J2 - LNCS VL - 2708 PY - 2003 SP - 269 EP - 284 PG - 16 SN - 0302-9743 DO - 10.1007/3-540-45075-0_16 UR - https://m2.mtmt.hu/api/publication/2606946 ID - 2606946 N1 - WoS:hiba:000185073200016 2020-08-27 02:45 típus nem egyezik AB - Mutation analysis is a fault based testing method used initially for code based software testing, and lately for specification based testing and validation as well. In this paper, the method is applied to SDL (Specification and Description Language) specifications. It is used to automate the process of conformance test generation and selection for telecommunications protocols. We present two algorithms for automatic test generation and selection. These provide the basis of the Test Selector tool developed at the Budapest University of Technology and Economics. We present the results of an empirical study using the tool. LA - English DB - MTMT ER - TY - JOUR AU - Csöndes, Tibor AU - Kotnyek, Balázs AU - Zoltán, Szabó János TI - Application of heuristic methods for conformance test selection JF - EUROPEAN JOURNAL OF OPERATIONAL RESEARCH J2 - EJOR VL - 142 PY - 2002 IS - 1 SP - 203 EP - 218 PG - 16 SN - 0377-2217 DO - 10.1016/S0377-2217(01)00284-3 UR - https://m2.mtmt.hu/api/publication/2654494 ID - 2654494 LA - English DB - MTMT ER -