TY  - JOUR
AU  - Kohári, Zsolt
AU  - Csendes, A
AU  - Székely, Vladimir
AU  - Kerecsen Istvánné Rencz, Márta
TI  - Thermal investigation of monolithic structures
JF  - MICROELECTRONICS JOURNAL
J2  - MICROELECTRON J
VL  - 28
PY  - 1997
IS  - 3
SP  - 317
EP  - 325
PG  - 9
SN  - 0026-2692
DO  - 10.1016/S0026-2692(96)00035-3
UR  - https://m2.mtmt.hu/api/publication/2606977
ID  - 2606977
AB  - In this paper a comparison of a thermal investigation of typical IC structures and a microstructure sample using different methods will be presented. Different simulation methods and, for the IC structure, liquid crystal measurements are compared. The results show that for the investigated structures there are possibilities other than using robust and resource consuming FEM tools.
LA  - English
DB  - MTMT
ER  - 

TY  - JOUR
AU  - Székely, Vladimir
TI  - On the representation of infinite-length distributed RC one-ports
JF  - IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II - ANALOG AND DIGITAL SIGNAL PROCESSING
J2  - IEEE T CIRCUITS-II
VL  - 38
PY  - 1991
IS  - 7
SP  - 711
EP  - 719
PG  - 9
SN  - 1057-7130
DO  - 10.1109/31.135743
UR  - https://m2.mtmt.hu/api/publication/2670980
ID  - 2670980
AB  - The paper describes new representations of infinite distributed RC one-ports. Two new functions are introduced: the dipole intensity function (as the generalization of pole-zero pattern) and the time-constant density (as the generalization of the discrete time-constant set of a lumped network). Relations between the new representations and the complex impedance are presented. The use of the new representations is demonstrated by some examples.
LA  - English
DB  - MTMT
ER  - 

TY  - JOUR
AU  - Székely, Vladimir
AU  - Poppe, András
TI  - Novel Tools for Thermal and Electrical Analysis of Circuits
JF  - ELECTROSOFT
J2  - ELECTROSOFT
VL  - 1
PY  - 1990
IS  - 4
SP  - 234
EP  - 252
PG  - 19
SN  - 0269-9184
UR  - https://m2.mtmt.hu/api/publication/2607102
ID  - 2607102
LA  - English
DB  - MTMT
ER  - 

TY  - CONF
AU  - Székely, Vladimir
AU  - K., Tarnay
AU  - Kerecsen Istvánné Rencz, Márta
AU  - F., Masszi
AU  - P., Baji
ED  - Ribényi, A
TI  - The use of TRANZ-TRAN circuit simulation program in IC design
T2  - Proceedings of the 3rd Microelectronics Conference of the Socialist Countries (Microelectronics'82)
PY  - 1982
SP  - 147
EP  - 148
PG  - 2
UR  - https://m2.mtmt.hu/api/publication/2608920
ID  - 2608920
LA  - English
DB  - MTMT
ER  - 

TY  - JOUR
AU  - Székely, Vladimir
TI  - Accurate Calculation of Device Heat Dynamics: a Special Feature of the TRANZ-TRAN Circuit-Analysis Program
JF  - ELECTRONICS LETTERS
J2  - ELECTRON LETT
VL  - 9
PY  - 1973
IS  - 6
SP  - 132
EP  - 134
PG  - 3
SN  - 0013-5194
UR  - https://m2.mtmt.hu/api/publication/2667285
ID  - 2667285
LA  - English
DB  - MTMT
ER  - 

TY  - JOUR
AU  - Székely, Vladimir
AU  - Tarnay, Kálmán
TI  - Accurate Algorithm for Temperature Calculation of Devices in Nonlinear-Circuit-Analysis Programs
JF  - ELECTRONICS LETTERS
J2  - ELECTRON LETT
VL  - 8
PY  - 1972
IS  - 19
SP  - 470
EP  - 472
PG  - 3
SN  - 0013-5194
UR  - https://m2.mtmt.hu/api/publication/2667284
ID  - 2667284
LA  - English
DB  - MTMT
ER  -