@inproceedings{MTMT:34448273,
	title = {Thermal Transient Tests with Programmed Powering on Wide Bandgap Power Devices of Non-Monotonous and Time-Variant Characteristics},
	url = {https://m2.mtmt.hu/api/publication/34448273},
	author = {Ress, Sándor László and Sárkány, Zoltán and Kerecsen Istvánné Rencz, Márta and Farkas, Gábor},
	booktitle = {2023 29th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)},
	doi = {10.1109/THERMINIC60375.2023.10325869},
	unique-id = {34448273},
	abstract = {Thermal transient testing of semiconductor devices needs a well-defined power level for heating and proper data acquisition for recording the change of a thermally sensitive device parameter. While the latter is fully solved by up-to-date thermal testers, power level setting is typically limited to forcing varying current levels on two pin devices, such as diodes. Other proposed methods need trials for setting the power and have poor stability.The paper presents a methodology for applying power in various test arrangements, on devices with three pins such as MOSFETs, IGBTs, BJTs and HEMTs. A simple analog circuitry is proposed which ensures thermally and electrically stable powering and an exact operating voltage and current.Several simulation and measurement experiments prove that a novel solution based on fast drain-source voltage change at constant current ensures optimal powering in reliability tests and short electric distortion in transient tests. © 2023 IEEE.},
	keywords = {wide band gap semiconductors; high electron mobility transistors; Data acquisition; Energy gap; MOSFETS; Transient analysis; Thermal transient testing; Thermal transient testing; Reliability testing; Reliability testing; well testing; MOSFET; High power; High power; Wide-band-gap semiconductors; Drain current; Power levels; Power MOSFET; MOS-FET; Wide-band-gap semiconductor; Thermal transients; Transient tests},
	year = {2023},
	orcid-numbers = {Ress, Sándor László/0000-0003-4611-0718; Kerecsen Istvánné Rencz, Márta/0000-0003-4183-3853}
}

@inproceedings{MTMT:33698131,
	title = {Accelerating the Thermal Transient Testing by a Novel Temperature Sensitive Parameter Calibration Method based on I-V Characteristic Measurement},
	url = {https://m2.mtmt.hu/api/publication/33698131},
	author = {Ress, Sándor László and Sarkany, Zoltan and Farkas, Gabor and Kerecsen Istvánné Rencz, Márta},
	booktitle = {Proceedings of the 28th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC'22)},
	doi = {10.1109/THERMINIC57263.2022.9950658},
	unique-id = {33698131},
	abstract = {Thermal characterisation of each large power module or assembly is inevitable in the industry. Thermal transient testing provides not only generic thermal parameters but also the root causes of potential failures. The major bottleneck in this process is the long time needed for the calibration of a thermally sensitive parameter of the semiconductor devices, opposed to the actual measurement time which is a few tens of seconds. The article presents a methodology which replaces the lengthy measurement of a parameter at many temperatures by a complete current-voltage sweep fulfilled below a second and some calculations based on semiconductor physics. The method also may predict the high temperature behaviour of wide band gap semiconductor components, needed for lifetime estimation.},
	keywords = {THERMODYNAMICS; wide band gap semiconductors; In situ testing; Thermal transient testing; Engineering, Electrical & Electronic},
	year = {2022},
	pages = {1-4},
	orcid-numbers = {Ress, Sándor László/0000-0003-4611-0718; Kerecsen Istvánné Rencz, Márta/0000-0003-4183-3853}
}

@{MTMT:33589494,
	title = {On the Accuracy and Repeatability of Thermal Transient Measurements},
	url = {https://m2.mtmt.hu/api/publication/33589494},
	author = {Poppe, András and Kerecsen Istvánné Rencz, Márta},
	booktitle = {Theory and Practice of Thermal Transient Testing of Electronic Components},
	doi = {10.1007/978-3-030-86174-2_8},
	unique-id = {33589494},
	year = {2022},
	pages = {353-369},
	orcid-numbers = {Poppe, András/0000-0002-9381-6716; Kerecsen Istvánné Rencz, Márta/0000-0003-4183-3853}
}

@{MTMT:33589490,
	title = {The Use of Thermal Transient Testing},
	url = {https://m2.mtmt.hu/api/publication/33589490},
	author = {Kerecsen Istvánné Rencz, Márta and Farkas, Gábor and Sárkány, Zoltán and Vass-Várnai, András},
	booktitle = {Theory and Practice of Thermal Transient Testing of Electronic Components},
	doi = {10.1007/978-3-030-86174-2_7},
	unique-id = {33589490},
	year = {2022},
	pages = {319-352},
	orcid-numbers = {Kerecsen Istvánné Rencz, Márta/0000-0003-4183-3853}
}

@{MTMT:33589207,
	title = {Theoretical Background of Thermal Transient Measurements},
	url = {https://m2.mtmt.hu/api/publication/33589207},
	author = {Farkas, Gábor and Poppe, András and Kerecsen Istvánné Rencz, Márta},
	booktitle = {Theory and Practice of Thermal Transient Testing of Electronic Components},
	doi = {10.1007/978-3-030-86174-2_2},
	unique-id = {33589207},
	year = {2022},
	pages = {7-96},
	orcid-numbers = {Poppe, András/0000-0002-9381-6716; Kerecsen Istvánné Rencz, Márta/0000-0003-4183-3853}
}

@{MTMT:33589178,
	title = {Why Was Written and How to Read This Book},
	url = {https://m2.mtmt.hu/api/publication/33589178},
	author = {Kerecsen Istvánné Rencz, Márta and Farkas, Gábor},
	booktitle = {Theory and Practice of Thermal Transient Testing of Electronic Components},
	doi = {10.1007/978-3-030-86174-2_1},
	unique-id = {33589178},
	year = {2022},
	pages = {1-5},
	orcid-numbers = {Kerecsen Istvánné Rencz, Márta/0000-0003-4183-3853}
}

@book{MTMT:33589137,
	title = {Theory and Practice of Thermal Transient Testing of Electronic Components},
	url = {https://m2.mtmt.hu/api/publication/33589137},
	isbn = {9783030861735},
	doi = {10.1007/978-3-030-86174-2},
	editor = {Kerecsen Istvánné Rencz, Márta and Farkas, Gábor and Poppe, András},
	publisher = {Springer Netherlands},
	unique-id = {33589137},
	year = {2022},
	orcid-numbers = {Kerecsen Istvánné Rencz, Márta/0000-0003-4183-3853; Poppe, András/0000-0002-9381-6716}
}

@inproceedings{MTMT:33339115,
	title = {Concepts for high throughput LED testing using high-speed optical transients of LEDs},
	url = {https://m2.mtmt.hu/api/publication/33339115},
	author = {Poppe, András and Hantos, Gusztáv and Hegedüs, János and Csuti, Péter and Kerecsen Istvánné Rencz, Márta},
	booktitle = {Proceedings of the 28th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC'22)},
	doi = {10.1109/THERMINIC57263.2022.9950671},
	unique-id = {33339115},
	abstract = {To extract parameter sets for Spice-like multidomain models of LEDs needs appropriate set of input data, including forward current - flux, and forward current -forward voltage characteristics of LED packages, performed under isothermal conditions at known values of the junction temperature also known as isothermal IVL characterization, along with the dynamic thermal properties of the LED package in question. The optical and thermal laboratory test procedures, if properly combined, may provide the right set of test data, if both the forward current and the junction temperature are swept over the foreseen operating domain of the LED package to be modelled. The major bottleneck however is, that the industry standard laboratory test procedures (both the optical and thermal ones) require reaching the operating steady state before the actual data acquisition can start, resulting in an impedingly long measurement time. The goal of the present work is to provide an overview of the options of speeding up the overall measurement procedure or the average throughput of the tests for a LED population that provides a representative set of data for multi-domain modelling.},
	keywords = {THERMODYNAMICS; Engineering, Electrical & Electronic; LED testing; isothermal IVL characterization; multi-domain measurement of LEDs},
	year = {2022},
	orcid-numbers = {Poppe, András/0000-0002-9381-6716; Hantos, Gusztáv/0000-0002-0401-2098; Hegedüs, János/0000-0003-4792-6225; Csuti, Péter/0000-0001-9508-3993; Kerecsen Istvánné Rencz, Márta/0000-0003-4183-3853}
}

@inproceedings{MTMT:33085919,
	title = {Thermal Transient Testing Alternatives for the Characterisation of GaN HEMT Power Devices},
	url = {https://m2.mtmt.hu/api/publication/33085919},
	author = {Sárkány, Zoltán and Musolino, Mattia and Sitta, Alessandro and Calabretta, Michele and Farkas, Gábor and Németh, Márk and Kerecsen Istvánné Rencz, Márta},
	booktitle = {Proceedings of the 28th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC'22)},
	unique-id = {33085919},
	abstract = {Despite all the advancements, thermal characterization of GaN HEMT devices is still a challenging task today. In this paper we present a new transient measurement approach utilizing the gate current as temperature sensitive electric parameter (TSEP) and compare the results to the data captured using the channel resistance (Vds). The experienced differences are small, but repeatable. We examine the various factors that could cause artifacts in each method, but no evidence of measurement error was found.},
	year = {2022},
	orcid-numbers = {Kerecsen Istvánné Rencz, Márta/0000-0003-4183-3853}
}

@article{MTMT:31665383,
	title = {Investigation of the motion of magnetic nanoparticles in microfluidics with a micro domain model},
	url = {https://m2.mtmt.hu/api/publication/31665383},
	author = {Pálovics, Péter and Kerecsen Istvánné Rencz, Márta},
	doi = {10.1007/s00542-020-05077-0},
	journal-iso = {MICROSYST TECHNOL},
	journal = {MICROSYSTEM TECHNOLOGIES},
	volume = {28},
	unique-id = {31665383},
	issn = {0946-7076},
	abstract = {In this paper the magnetic nanoparticle (MNP) dynamics in a microfluidic device is investigated in the presence of an external magnetic field. The nanoparticles are used for enzyme-substrate reaction measurements, where the enzyme is immobilized to the surface of the nanoparticles. During the measurements the microreactors, called microchambers are filled up with the MNPs where the distribution of the nanoparticles significantly influences the results of the further reaction measurements. In this paper the procedure of the nanoparticle aggregation is investigated numerically in the microchamber in a micro domain simulation space. First the acting forces on the MNPs are examined from the different phenomena. An in-house numerical model is presented where the dynamics of several MNPs are simulated in the micro-size domain. This model is also embedded in the open source CFD software OpenFOAM. The theoretical calculations and the simulations show that the particle-particle interaction due to magnetization plays an important role during the aggregation procedure. The particles in the magnetic field cluster over the time into chains, which phenomenon is in good agreement with the literature. A theoretical model of the chain dynamics is also established, which is compared to the simulation results. The presented micro domain model was later used to improve an Eulerian-Eulerian based two-phase CFD model and solver, which is able to model the complete MNP aggregation procedure in the magnetic field in macroscopic domains.},
	year = {2022},
	eissn = {1432-1858},
	pages = {1545-1559},
	orcid-numbers = {Pálovics, Péter/0000-0002-0108-3448; Kerecsen Istvánné Rencz, Márta/0000-0003-4183-3853}
}