TY - JOUR AU - Lábár, János AU - Adamik, Miklós AU - Barna B., Péter AU - Czigány, Zsolt AU - Fogarassy, Zsolt AU - Horváth, Zsolt Endre AU - Geszti, Olga AU - Misják, Fanni AU - Morgiel, J AU - Radnóczi, György AU - Sáfrán, György AU - Székely, Lajos AU - Szuts, T TI - Electron Diffraction Based Analysis of Phase Fractions and Texture in Nanocrystalline Thin Films, Part III: Application Examples JF - MICROSCOPY AND MICROANALYSIS J2 - MICROSC MICROANAL VL - 18 PY - 2012 IS - 2 SP - 406 EP - 420 PG - 15 SN - 1431-9276 DO - 10.1017/S1431927611012803 UR - https://m2.mtmt.hu/api/publication/1962341 ID - 1962341 AB - In this series of articles, a method is presented that performs (semi) quantitative phase analysis for nanocrystalline transmission electron microscope samples from selected area electron diffraction (SAED) patterns. Volume fractions and degree of fiber texture are determined for the nanocrystalline components. The effect of the amorphous component is minimized by empirical background interpolation. First, the two-dimensional SAED pattern is converted into a one-dimensional distribution similar to X-ray diffraction. Volume fractions of the nanocrystalline components are determined by fitting the spectral components, calculated for the previously identified phases with a priori known structures. These Markers are calculated not only for kinematic conditions, but the Blackwell correction is also applied to take into account dynamic effects for medium thicknesses. Peak shapes and experimental parameters (camera length, etc.) are refined during the fitting iterations. Parameter space is explored with the help of the Downhill-SIMPLEX. The method is implemented in a computer program that runs under the Windows operating system. Part I presented the principles, while part II elaborated current implementation. The present part III demonstrates the usage and efficiency of the computer program by numerous examples. The suggested experimental protocol should be of benefit in experiments aimed at phase analysis using electron diffraction methods. LA - English DB - MTMT ER - TY - GEN AU - Lábár, János AU - Adamik, Miklós AU - Agócs, Emil AU - Barna B., Péter AU - Geszti, Olga AU - Horváth, Zsolt Endre AU - Grasin, R AU - Lestyán, G AU - Misják, Fanni AU - Radnóczi, György AU - Sáfrán, György AU - Székely, Lajos AU - Szűts, T AU - Veisz, Bernadett TI - A new method for electron diffraction based analysis of phase fractions and texture in nano-crystalline thin films PY - 2008 UR - https://m2.mtmt.hu/api/publication/1804244 ID - 1804244 LA - English DB - MTMT ER - TY - JOUR AU - Gurbán, Sándor AU - Gergely, György AU - Menyhárd, Miklós AU - Adam, J AU - Adamik, Miklós AU - Daróczi, Csaba Sándor AU - Tóth, J AU - Varga, D AU - Csík, Attila AU - Gruzza, B TI - Ag, Ge and Sn reference samples for elastic peak electron spectroscopy (EPES), used for experimental determination of the inelastic mean free path and the surface excitation parameter JF - SURFACE AND INTERFACE ANALYSIS J2 - SURF INTERFACE ANAL VL - 34 PY - 2002 IS - 1 SP - 206 EP - 210 PG - 5 SN - 0142-2421 DO - 10.1002/sia.1284 UR - https://m2.mtmt.hu/api/publication/1116014 ID - 1116014 AB - Reference samples are needed for experimental determination of the inelastic mean free path (IMFP) of electrons by elastic peak electron spectroscopy (EPES). High-quality (microcrystalline mirror) Ni reference samples were used for IMFP measurements. For surface excitation parameter experiments, new types of reference samples are needed. They should exhibit pronounced surface-loss spectra, such as amorphous Ge (aGe), Sri and Ag. A new procedure is presented for their preparation. Microcrystalline Ag and Sri reference samples were deposited on highly polished (by Buehler alumina alpha micropolish 10 brass (60% Cu, 40% Zn) substrates. Electrolytic deposition was used for Ag and for Sri and resulted in excellent surface quality. The average surface roughness r(av) was checked by scanning tunnelling microscopy or atomic force microscopy before and after Ar+ ion bombardment cleaning. Typical r(av) values were 4-6 nm for Ag, 3-4 nm for Sri and 2-4 nm for brass substrate. The aGe sample was deposited by magnetron sputtering or by evaporation in a high vacuum on an Si substrate. Its r(av) was 4-5 nm. The samples were studied by EPES/reflection electron energy-loss spectroscopy, covering the 0.2-5 keV energy range, with the ESA 31 HSA electron spectrometer. The IMFP of Sri was determined by EPES. The surface excitation parameters for the Si, Ge and Sri samples were determined from their inelastic scattering cross-section spectra. For Ag the surface excitation parameter was estimated by using the above reference samples. LA - English DB - MTMT ER - TY - CONF AU - Lábár, János AU - Adamik, Miklós ED - Bailey, GW ED - Price, RL ED - Voelkld, E ED - Musselman, IH TI - ProcessDiffraction V1.2: NEw possibilities in manipulating electron diffraction ring patterns T2 - Microscopy and Microanalysis V7. Suppl 2 PB - Springer-Verlag London Ltd C1 - New York, New York C1 - London PY - 2001 SP - 372 EP - 373 PG - 2 UR - https://m2.mtmt.hu/api/publication/1800619 ID - 1800619 LA - English DB - MTMT ER - TY - JOUR AU - Ariake, J AU - Kiya, T AU - Honda, N AU - Ouchi, K AU - Adamik, Miklós AU - Czigány, Zsolt AU - Sáfrán, György AU - Radnóczi, György TI - Preparation of double layered perpendicular recording media with extremely high resolution JF - IEEE TRANSACTIONS ON MAGNETICS J2 - IEEE T MAGN VL - 37 PY - 2001 IS - 4 SP - 1573 EP - 1576 PG - 4 SN - 0018-9464 DO - 10.1109/20.950904 UR - https://m2.mtmt.hu/api/publication/1191198 ID - 1191198 AB - In a double layered perpendicular magnetic recording medium, recording resolution and time decay of output signal have been studied. Introduction of a stacked intermediate layer (NiFeNb/Ti) between a soft magnetic back layer and a storage layer improves magnetic property of the storage layer. The stacked intermediate layer can reduce the initial growth layer of the storage layer by hetero-epitaxial growth. Time decay of output signal for a medium with the stacked intermediate layer was suppressed within -0.4 dB at 1000 seconds after recording at 100 kFRPI. A reproduced signal at an extremely high linear density of 950 kFRPI has been confirmed by a CF-SPT head for writing and a GMR head with track width of 0.4 micrometer for reading. LA - English DB - MTMT ER - TY - JOUR AU - Adamik, Miklós AU - Barna B., Péter AU - Tomov, I TI - Texture and Grain Structure in Polycrystalline Silver Films Deposited by Partially Ionised Beam JF - VACUUM J2 - VACUUM VL - 61 PY - 2001 IS - 2-4 SP - 251 EP - 255 PG - 5 SN - 0042-207X DO - 10.1016/S0042-207X(01)00125-7 UR - https://m2.mtmt.hu/api/publication/139704 ID - 139704 LA - English DB - MTMT ER - TY - CONF AU - Ariake, J AU - Kiya, T AU - Honda, N AU - Ouchi, K AU - Adamik, Miklós AU - Czigány, Zsolt AU - Sáfrán, György AU - Radnóczi, György ED - Hiroaki, Muraoka ED - Setsuo, Yamamoto TI - Preparation of double layered perpendicular recording media with high resolution and low noise properties T2 - Proceedings 5th Perpendicular Magnetic Recording Conference (PMRC 2000) PY - 2001 SP - 23 EP - 24 PG - 2 UR - https://m2.mtmt.hu/api/publication/139624 ID - 139624 LA - English DB - MTMT ER - TY - JOUR AU - Tomov, I AU - Adamik, Miklós AU - Barna B., Péter TI - Texture and secondary extinction of vacuum deposited Ag films JF - MATERIALS SCIENCE FORUM J2 - MATER SCI FORUM VL - 321-324 PY - 2000 SP - 400 EP - 405 PG - 6 SN - 0255-5476 DO - 10.4028/www.scientific.net/MSF.321-324.400 UR - https://m2.mtmt.hu/api/publication/22656360 ID - 22656360 LA - English DB - MTMT ER - TY - CONF AU - Radnóczi, György AU - Czigány, Zsolt AU - Barna B., Péter AU - Adamik, Miklós AU - Ariake, J AU - Honda, N AU - Ouchi, K ED - Tomanek, P ED - Kolarik, R TI - Cross sectional transmission electron microscopic investigation of thin films for perpendicular magnetic recording media T2 - Proceedings of the 12th European Congress on Electron Microscopy C1 - Brno PY - 2000 SP - 175 EP - 176 PG - 2 UR - https://m2.mtmt.hu/api/publication/1201810 ID - 1201810 LA - English DB - MTMT ER - TY - JOUR AU - Radnóczi, György AU - Barna B., Péter AU - Adamik, Miklós AU - Czigány, Zsolt AU - Ariake, J AU - Honda, N AU - Ouchi, K TI - Growth structure of thin films for perpendicular magnetic recording media JF - CRYSTAL RESEARCH AND TECHNOLOGY J2 - CRYST RES TECHNOL VL - 35 PY - 2000 IS - 6-7 SP - 707 EP - 711 PG - 5 SN - 0232-1300 DO - 10.1002/1521-4079(200007)35:6/7<707::AID-CRAT707>3.0.CO;2-N UR - https://m2.mtmt.hu/api/publication/1189831 ID - 1189831 AB - Thin film systems composed of Co-Cr-Nb-PI, Ti, Co-Zr-Nb, Co-Cr and permalloy layers have been deposited onto glass substrates in order to investigate the correlation between the magnetic behaviour and microstructure. The grains of the Co-Cr-Nb-Pt films show oriented growth on the permalloy grains, whereas their growth is started by the formation of an amorphous layer on a Ti layer. A better magnetic performance was observed when Ti or Zr containing intermadiate layers were applied between the permalloy and Co-Cr-Nb-Pt film. LA - English DB - MTMT ER -