TY  - CHAP
AU  - Sziray, József
ED  - Kóczy, T. László
ED  - Pozna, Claudiu Radu
ED  - Kacprzyk, J
TI  - Test Generation for Short-Circuit Faults in Digital Circuits
T2  - Issues and Challenges of Intelligent Systems and Computational Intelligence
PB  - Springer Netherlands
CY  - Cham (Németország)
SN  - 9783319032054
T3  - Studies in Computational Intelligence, ISSN 1860-949X ; 530.
PY  - 2014
SP  - 313
EP  - 319
PG  - 7
UR  - https://m2.mtmt.hu/api/publication/2541524
ID  - 2541524
LA  - English
DB  - MTMT
ER  - 

TY  - CHAP
AU  - Sziray, József
ED  - Szakál, Anikó
TI  - Evaluation of Boolean Graphs in Software Testing
T2  - Proceedings of IEEE 9th International Conference on Computational Cybernetics (ICCC 2013)
PB  - IEEE
CY  - Budapest
SN  - 1479900605
PY  - 2013
SP  - 225
EP  - 230
PG  - 6
UR  - https://m2.mtmt.hu/api/publication/2400401
ID  - 2400401
LA  - English
DB  - MTMT
ER  - 

TY  - CONF
AU  - Sziray, József
ED  - Tormási, Alex
ED  - Kóczy, T. László
ED  - Pozna, Claudiu Radu
TI  - Test Generation for Short-circuit Faults in Digital Circuits
T2  - Fifth Győr Symposium and First Hungarian-Polish Joint Conference on Computational Intelligence
PB  - Széchenyi István Egyetem
C1  - Győr
PY  - 2012
SP  - 46
EP  - 50
UR  - https://m2.mtmt.hu/api/publication/2414627
ID  - 2414627
LA  - English
DB  - MTMT
ER  - 

TY  - BOOK
AU  - Benyó, Balázs István
AU  - Kondorosi, Károly
AU  - Sziray, József
TI  - Operációs rendszerek alapjai
ET  - 0
PB  - Logsoft Informatikai Bt.
CY  - Budapest
PY  - 2012
SP  - 210
SN  - 9789638950512
UR  - https://m2.mtmt.hu/api/publication/2362961
ID  - 2362961
LA  - Hungarian
DB  - MTMT
ER  - 

TY  - BOOK
AU  - Sziray, József
TI  - Szakértői rendszerek alapjai
ET  - 0
PB  - Logsoft Informatikai Bt.
CY  - Budapest
PY  - 2012
SP  - 134
SN  - 9789638950505
UR  - https://m2.mtmt.hu/api/publication/2362933
ID  - 2362933
LA  - Hungarian
DB  - MTMT
ER  - 

TY  - BOOK
AU  - Sziray, József
TI  - Test Design of Digital Systems
ET  - 0
PB  - Széchenyi University Press
CY  - Győr
PY  - 2012
SP  - 158
SN  - 9789639819900
UR  - https://m2.mtmt.hu/api/publication/2362924
ID  - 2362924
N1  - Hozzáférhető:
http://zoldhajtas.sze.hu/downloadmanager/download/nohtml/1/id/5648/
LA  - English
DB  - MTMT
ER  - 

TY  - CHAP
AU  - Sziray, József
ED  - Szakál, Anikó
TI  - Test calculation for logic and short-circuit faults in digital circuits
T2  - Proceedings of the IEEE 16th International Conference on Intelligent Engineering Systems 2012
PB  - Institute of Electrical and Electronics Engineers (IEEE)
CY  - Piscataway (NJ)
SN  - 9781467326940
PY  - 2012
SP  - 121
EP  - 124
PG  - 4
DO  - 10.1109/INES.2012.6249815
UR  - https://m2.mtmt.hu/api/publication/2224389
ID  - 2224389
N1  - #Könyv Szerző ismeretlen
AB  - In the first part, the paper presents a test calculation principle which serves for producing tests of logic faults in digital circuits. The name of the principle is composite justification. The considered fault model includes stuck-at-0/1 logic faults. Both single and multiple faults are included. In this paper only combinational logic is taken into consideration. The computations are performed at the gate level. In the second part of the paper, the composite justification is extended to an other fault class, namely, short-circuit faults. A short circuit is an erroneous galvanic coupling between two circuit lines. The calculation principle is comparatively simple. It is based only on successive line-value justification, and it yields an opportunity to be realized by an efficient computer program. © 2012 IEEE.
LA  - English
DB  - MTMT
ER  - 

TY  - CONF
AU  - Sziray, József
TI  - Complexity Comparisons in Test Generation for Logic Circuits
T2  - IEEE 13-th International Workshop on Microprocessor Test and Verification (MTV-2011)
SN  - 9781457721014
PY  - 2011
SP  - 46
EP  - 52
PG  - 7
UR  - https://m2.mtmt.hu/api/publication/2431542
ID  - 2431542
LA  - English
DB  - MTMT
ER  - 

TY  - JOUR
AU  - Sziray, József
TI  - Complexity Comparisons in Test Calculation
JF  - WORLD ACADEMY OF SCIENCE ENGINEERING AND TECHNOLOGY
J2  - WASET
VL  - 7
PY  - 2011
IS  - 79
SP  - 1126
EP  - 1132
PG  - 7
SN  - 1307-6892
UR  - https://m2.mtmt.hu/api/publication/2363023
ID  - 2363023
LA  - English
DB  - MTMT
ER  - 

TY  - BOOK
AU  - Sziray, József
AU  - Gaul, G
TI  - Vállalati információs rendszerek I.
ET  - 0
PB  - Logsoft Informatikai Bt.
CY  - Budapest
PY  - 2011
SP  - 214
SN  - 9789630828420
UR  - https://m2.mtmt.hu/api/publication/2362978
ID  - 2362978
LA  - Hungarian
DB  - MTMT
ER  -