mtmt
The Hungarian Scientific Bibliography
Previous page
23 elements on 3 page(s), 3 element listed, page number 3 shown.
Next page
Public search
Magyarul
Visualization options
Language
Abstract
Type information
Comments
Status information
Links
Only independent citations
Citations
None
Number
Short
Details
Full
Sorting
-
Published year
Title
First page or ArtNo
Created
Citing papers
Citation count
Status
Type
Sub type
Category
OA type
MTMT ID
Journal
Language
▼
▲
-
Published year
Title
First page or ArtNo
Created
Citing papers
Citation count
Status
Type
Sub type
Category
OA type
MTMT ID
Journal
Language
▼
▲
-
Published year
Title
First page or ArtNo
Created
Citing papers
Citation count
Status
Type
Sub type
Category
OA type
MTMT ID
Journal
Language
▼
▲
List size
10
20
50
100
1000
5000
Switch to:
XML
JSON
Export list:
As bibliography
RIS
BIBTEX
21.
Janos, Baumgartner
;
Tunde, Tarczali
;
Zoltan, Sule
Reliability Analysis of Business Processes by P-graph Methodology
In: Pigler-Lakner, Rozália (eds.)
ASCONIKK 2014 : Abstracts
Veszprém, Hungary :
Pannon Egyetem
(2014)
75 p.
pp. 14-15. , 2 p.
Publication:3100563
Published
Core
Chapter in Book (Abstract )
Scientific
Abstract (Chapter in Book) | Scientific
[3100563]
[Approved]
22.
Janos, Baumgartner
;
Tunde, Tarczali
;
Zoltan, Sule
Reliability Analysis of Business Processes by P-graph Methodology
In: Rozália, Pigler Lakner (eds.)
ASCONIKK 2014: Extended Abstracts : IV. Information Security
Veszprém, Hungary :
University of Pannonia
,
(2014)
pp. 5-10. , 6 p.
Publication:3100422
Admin approved
Core
Chapter in Book (Conference paper )
Conference paper (Chapter in Book) | Scientific
[3100422]
[Admin approved]
23.
Baumgartner, J.
;
M., Frits
;
I., Heckl
;
B., Bertok
Track closure management system
(2013)
InnoRail 2013, Budapest, Hungary, October 28-30, 2013.
,
Publication:30729622
Admin approved
Core
Miscellaneous (Not classified )
Scientific
Not classified (Miscellaneous) | Scientific
[30729622]
[Admin approved]
2024-05-18 21:08
×
Export list as bibliography
Citation styles:
IEEE
ACM
APA
Chicago
Harvard
Print
Copy