1.
Ress, S. ✉ ; Sarkany, Z. ; Rencz, M. ; Farkas, G.
Thermal Transient Tests with Programmed Powering on Wide Bandgap Power Devices of Non-Monotonous and Time-Variant Characteristics
In: Poppe, András (eds.) 2023 29th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
Bp, Hungary : Institute of Electrical and Electronics Engineers (2023) Paper: 10325869 , 8 p.
DOI IEEE Xplore WoS Scopus
Publication:34448273 Admin approved Core Citing Chapter in Book (Conference paper ) Scientific
Conference paper (Chapter in Book) | Scientific[34448273] [Admin approved]
2.
Rencz, Márta ✉ ; Farkas, Gábor ; Sárkány, Zoltán ; Vass-Várnai, András
The Use of Thermal Transient Testing
In: Rencz, Marta ✉; Farkas, Gábor; Poppe, András (eds.) Theory and Practice of Thermal Transient Testing of Electronic Components
Cham, Switzerland : Springer (2022) pp. 319-352. Paper: Chapter 7 , 34 p.
DOI Scopus Other URL
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3.
Farkas, Gábor ✉ ; Poppe, András ; Sárkány, Zoltán ; Vass-Várnai, András
Thermal Transient Measurements on Various Electronic Components
In: Rencz, Marta ✉; Farkas, Gábor; Poppe, András (eds.) Theory and Practice of Thermal Transient Testing of Electronic Components
Cham, Switzerland : Springer (2022) pp. 209-318. Paper: Chapter 6 , 110 p.
DOI Scopus Other URL
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4.
Farkas, Gábor ✉
Fundamentals of Thermal Transient Measurements
In: Rencz, Marta ✉; Farkas, Gábor; Poppe, András (eds.) Theory and Practice of Thermal Transient Testing of Electronic Components
Cham, Switzerland : Springer (2022) pp. 171-208. Paper: Chapter 5 , 38 p.
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5.
Farkas, Gábor ✉
Temperature-Dependent Electrical Characteristics of Semiconductor Devices
In: Rencz, Marta ✉; Farkas, Gábor; Poppe, András (eds.) Theory and Practice of Thermal Transient Testing of Electronic Components
Cham, Switzerland : Springer (2022) pp. 139-169. Paper: Chapter 4 , 31 p.
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6.
Poppe, András ✉ ; Farkas, Gábor
Thermal Metrics
In: Rencz, Marta ✉; Farkas, Gábor; Poppe, András (eds.) Theory and Practice of Thermal Transient Testing of Electronic Components
Cham, Switzerland : Springer (2022) pp. 97-137. Paper: Chapter 3 , 41 p.
DOI Scopus Other URL
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7.
Farkas, Gábor ; Poppe, András ✉ ; Rencz, Márta
Theoretical Background of Thermal Transient Measurements
In: Rencz, Marta ✉; Farkas, Gábor; Poppe, András (eds.) Theory and Practice of Thermal Transient Testing of Electronic Components
Cham, Switzerland : Springer (2022) pp. 7-96. Paper: Chapter 2 , 90 p.
DOI Scopus Other URL
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8.
Rencz, Márta ✉ ; Farkas, Gábor
Why Was Written and How to Read This Book
In: Rencz, Marta ✉; Farkas, Gábor; Poppe, András (eds.) Theory and Practice of Thermal Transient Testing of Electronic Components
Cham, Switzerland : Springer (2022) pp. 1-5. Paper: Chapter 1 , 5 p.
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9.
Rencz, Marta ✉ (eds.) ; Farkas, Gábor (eds.) ; Poppe, András (eds.)
Theory and Practice of Thermal Transient Testing of Electronic Components
Cham, Switzerland : Springer Netherlands (2022)
DOI ISBN: 9783030861735 ISBN: 9783030861742 Scopus Other URL
Publication:33589137 Published Core Book (Monograph ) Scientific | Import with error
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10.
Sárkány, Zoltán ; Musolino, Mattia ; Sitta, Alessandro ; Calabretta, Michele ; Farkas, Gábor ; Németh, Márk ; Rencz, Márta
Thermal Transient Testing Alternatives for the Characterisation of GaN HEMT Power Devices
In: Proceedings of the 28th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC'22)
Dublin, Ireland : Institute of Electrical and Electronics Engineers (2022) Paper: 110 , 5 p.
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2024-04-19 19:25