1.
Sziray, J
Test Generation for Short-Circuit Faults in Digital Circuits
In: Kóczy, LT; Pozna, CR; Kacprzyk, J (eds.) Issues and Challenges of Intelligent Systems and Computational Intelligence
Cham (Németország), Germany : Springer International Publishing, (2014) pp. 313-319. , 7 p.
Publication:2541524 Admin approved Core Chapter in Book (Study )
Study (Chapter in Book) | Scientific[2541524] [Admin approved]
2.
J, Sziray
Evaluation of Boolean Graphs in Software Testing
In: Szakál, Anikó (eds.) Proceedings of IEEE 9th International Conference on Computational Cybernetics (ICCC 2013)
Bp, Hungary : IEEE (2013) pp. 225-230. , 6 p.
Publication:2400401 Admin approved Core Chapter in Book (Conference paper ) Scientific
Conference paper (Chapter in Book) | Scientific[2400401] [Admin approved]
3.
József, Sziray
Test Generation for Short-circuit Faults in Digital Circuits pp. 46-50.
In: Alex, Tormási; László, T Kóczy; Claudiu, Radu Pozna (eds.) Fifth Győr Symposium and First Hungarian-Polish Joint Conference on Computational Intelligence
Győr, Hungary : Széchenyi István Egyetem, (2012)
Publication:2414627 Admin approved Core Conference paper (Conference paper )
Conference paper (Conference paper) | Scientific[2414627] [Admin approved]
4.
Benyó, B ; Kondorosi, K ; Sziray, J
Operációs rendszerek alapjai
Budapest, Hungary : Logsoft Informatikai Bt. (2012) , 210 p.
ISBN: 9789638950512
Publication:2362961 Admin approved Core Book (Textbook for higher education ) | Educational
Textbook for higher education (Book) | Educational[2362961] [Admin approved]
5.
Sziray, J
Szakértői rendszerek alapjai
Budapest, Hungary : Logsoft Informatikai Bt. (2012) , 134 p.
ISBN: 9789638950505
Publication:2362933 Admin approved Core Book (Textbook for higher education ) | Educational
Textbook for higher education (Book) | Educational[2362933] [Admin approved]
6.
J, Sziray
Test Design of Digital Systems
Győr, Hungary : Széchenyi University Press (2012) , 158 p.
ISBN: 9789639819900
Publication:2362924 Admin approved Core Book (Monograph )
Monograph (Book) | Scientific[2362924] [Admin approved]
7.
Sziray, J
Test calculation for logic and short-circuit faults in digital circuits
In: Szakál, Anikó (eds.) Proceedings of the IEEE 16th International Conference on Intelligent Engineering Systems 2012
Piscataway (NJ), United States of America : IEEE (2012) pp. 121-124. Paper: 6249815 , 4 p.
DOI Scopus Teljes dokumentum Google scholar hash
Publication:2224389 Admin approved Core Citing Chapter in Book (Conference paper ) Scientific
Conference paper (Chapter in Book) | Scientific[2224389] [Admin approved]
8.
J, Sziray
Complexity Comparisons in Test Generation for Logic Circuits
In: IEEE 13-th International Workshop on Microprocessor Test and Verification (MTV-2011)
(2011) pp. 46-52. , 7 p.
Publication:2431542 Admin approved Core Conference paper (Conference paper ) Scientific
Conference paper (Conference paper) | Scientific[2431542] [Admin approved]
9.
J, Sziray
Complexity Comparisons in Test Calculation
WORLD ACADEMY OF SCIENCE ENGINEERING AND TECHNOLOGY 7 : 79 pp. 1126-1132. , 7 p. (2011)
Publication:2363023 Admin approved Core Journal Article (Conference paper in journal ) Scientific
Conference paper in journal (Journal Article) | Scientific[2363023] [Admin approved]
10.
Sziray, J ; Gaul, G
Vállalati információs rendszerek I.
Budapest, Hungary : Logsoft Informatikai Bt. (2011) , 214 p.
ISBN: 9789630828420
Publication:2362978 Admin approved Core Book (Textbook for higher education ) | Educational
Textbook for higher education (Book) | Educational[2362978] [Admin approved]
2024-05-02 01:24