@CONFERENCE{MTMT:30881278,
	title = {Measurement-Based Multi-Domain Modeling of LEDs for “Industry 4.0”},
	url = {https://m2.mtmt.hu/api/publication/30881278},
	author = {Bein, Márton and Bornoff, Robin and Farkas, Gábor and Gaal, Lajos and Poppe, András and Kerecsen Istvánné Rencz, Márta},
	booktitle = {Proceedings of The 18th Intersociety Conference on Thermomechanical Phenomena in Electronic Systems (ITHERM'19)},
	doi = {10.1109/ITHERM.2019.8757371},
	unique-id = {30881278},
	abstract = {The Industry 4.0 initiative targets the digitalization of design and manufacturing processes. The aim of the Delphi4LED project is to trigger this transition in the solid-state lighting industry by developing testing and modelling methodologies aimed at multi-domain characterization of LED based products. The multi-domain model sums up the following parts: the electrical and optical domain is based on semiconductor physics, for the latter the key is the balance of diffusion and recombination effects realistically representing the low-current and high-current decay of efficiency. The geometry domain defines the thermal boundary and supposed to be temperature independent. For the thermal domain compact modeling and model order reduction are discussed; the suggested model is based on the one previously proposed in DELPHI project. Finally a new JEDEC standard is proposed encompassing multiple thermal test environments for a power LED which enable identifying case boundaries.},
	year = {2019},
	pages = {23-30},
	orcid-numbers = {Poppe, András/0000-0002-9381-6716; Kerecsen Istvánné Rencz, Márta/0000-0003-4183-3853}
}

@inproceedings{MTMT:3378564,
	title = {LED Characterization within the Delphi4LED Project},
	url = {https://m2.mtmt.hu/api/publication/3378564},
	author = {Farkas, Gábor and Lajos, Gaál and Bein, Márton and Poppe, András and Ress, Sándor László and Kerecsen Istvánné Rencz, Márta},
	booktitle = {Proceedings of The 17th Intersociety Conference on Thermomechanical Phenomena in Electronic Systems (ITHERM'18)},
	doi = {10.1109/ITHERM.2018.8419602},
	unique-id = {3378564},
	abstract = {The European Delphi4LED consortium intensively works on measurement, modeling and simulation techniques to cope with the lack of standardized methodologies to describe the strongly temperature and current dependent characteristics of  LEDs. The paper presents some of the efforts and results in 
		 making the lighting design of luminaires an automated, model based process; similarly to the design practice in electronics. To achieve this target, validated and standardized multiphysics LED models are needed. 
		
		In this paper results in comparing standard LED measurement methods and the realized upgraded testing and modeling procedures are shown, as the authors see it after one and half year of intensive collaboration in the subject.},
	year = {2018},
	pages = {262-271},
	orcid-numbers = {Poppe, András/0000-0002-9381-6716; Ress, Sándor László/0000-0003-4611-0718; Kerecsen Istvánné Rencz, Márta/0000-0003-4183-3853}
}

@inproceedings{MTMT:3257748,
	title = {Comparison of Two Alternate Junction Temperature Setting Methods aimed for Thermal and Optical Testing of High Power LEDs},
	url = {https://m2.mtmt.hu/api/publication/3257748},
	author = {Bein, Márton and Hegedüs, János and Hantos, Gusztáv and Gaál, Lajos and Farkas, Gábor and Kerecsen Istvánné Rencz, Márta and Poppe, András},
	booktitle = {2017 23rd International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC'17)},
	doi = {10.1109/THERMINIC.2017.8233838},
	unique-id = {3257748},
	abstract = {Characterization of LEDs and other semiconductor devices 
		demands at least accurate junction temperature (Tj) monitoring 
		and also control in more sophisticated cases. One of the most 
		common causes is that in practical LED lighting appliances 
		“hot lumens” are meaningful – most lamps are used in power on 
		steady state and cold analysis provides only indirect 
		information about intended operation. On the other hand direct 
		TJ measurement is not trivial – the most viable way is to 
		measure the forward voltage (VF) which is a function of 
		junction temperature. In this paper we compare two ways of VF-
		based TJ regulation of LEDs capable for electrical-optical-
		thermal characterization in a single session in terms of 
		accuracy and time consumption.},
	year = {2017},
	pages = {0-4},
	orcid-numbers = {Hegedüs, János/0000-0003-4792-6225; Hantos, Gusztáv/0000-0002-0401-2098; Kerecsen Istvánné Rencz, Márta/0000-0003-4183-3853; Poppe, András/0000-0002-9381-6716}
}

@inproceedings{MTMT:3285479,
	title = {Measurement issues in LED characterization for Delphi4LED style combined electrical-optical-thermal LED modeling},
	url = {https://m2.mtmt.hu/api/publication/3285479},
	author = {Hantos, Gusztáv and Hegedüs, János and Bein, Márton and L, Gaál and Farkas, Gábor and Sárkány, Zoltán and Ress, Sándor László and Poppe, András and Kerecsen Istvánné Rencz, Márta},
	booktitle = {2017 IEEE 19th Electronics Packaging Technology Conference (EPTC)},
	doi = {10.1109/EPTC.2017.8277493},
	unique-id = {3285479},
	abstract = {Traditionally incandescent and fluorescent light sources were 
		mostly used in a single operation point and their relevant 
		characteristics was described by a few parameters in a 
		datasheet. The emitted light of LED products depends on 
		current and temperature heavily and the behavior of LEDs in 
		actual use can be predicted only by complex models of 
		physical roots. The paper summarizes the targets and 
		methodology of the European Delphi4LED project aiming the 
		elaboration of relevant measurements for identifying 
		parameters of electrical-optical-thermal LED models. 
		Measurement examples of high power LEDs are shown and the 
		state-of-art of the modeling efforts is demonstrated in case 
		studies. 
		
		The two-diode Spice-like electro-thermal-optical model of 
		LEDs is proposed to be extended with a serial resistor in the 
		branch describing the light emission.},
	year = {2017},
	orcid-numbers = {Hantos, Gusztáv/0000-0002-0401-2098; Hegedüs, János/0000-0003-4792-6225; Ress, Sándor László/0000-0003-4611-0718; Poppe, András/0000-0002-9381-6716; Kerecsen Istvánné Rencz, Márta/0000-0003-4183-3853}
}

@inproceedings{MTMT:3213229,
	title = {Multi domain modelling of power LEDs based on measured isothermal and transient I-V-L characteristics},
	url = {https://m2.mtmt.hu/api/publication/3213229},
	author = {Farkas, Gábor and Bein, Márton and Lajos, Gaál},
	booktitle = {2016 22nd International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC'16)},
	doi = {10.1109/THERMINIC.2016.7749049},
	unique-id = {3213229},
	abstract = {Recent research has already proved that the characteristics of LED systems can be analyzed creating multi-domain models with tightly coupled electrical, thermal and optical operation. Transient models of the electric and thermal effects have been already successfully established but experimental verification of the dynamic optical behavior was neglected as fast radiometric and photometric measurements have not been available. The present paper outlines two measurement techniques which extend the methodology towards radiometric transients, calibrated by isothermal results. It proposes adequate instrumentation and highlights metrology problems through a measurement example.},
	year = {2016},
	pages = {181-186}
}

@inproceedings{MTMT:2911926,
	title = {Mission profile driven component design for adjusting product lifetime on system level},
	url = {https://m2.mtmt.hu/api/publication/2911926},
	author = {Attila, Szel and Sárkány, Zoltán and Bein, Márton and Robin, Bornoff and Vass-Várnai, András and Kerecsen Istvánné Rencz, Márta},
	booktitle = {Proceedings of International Conference on Electronics Packaging},
	doi = {10.1109/ICEP-IAAC.2015.7111041},
	unique-id = {2911926},
	year = {2015},
	pages = {385-389},
	orcid-numbers = {Kerecsen Istvánné Rencz, Márta/0000-0003-4183-3853}
}

@inproceedings{MTMT:2911949,
	title = {Lifetime estimation of power electronics modules considering the target application},
	url = {https://m2.mtmt.hu/api/publication/2911949},
	author = {Attila, Szel and Sárkány, Zoltán and Bein, Márton and Robin, Bornoff and Vass-Várnai, András and Kerecsen Istvánné Rencz, Márta},
	booktitle = {Proceedings of the 31st IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM'15)},
	doi = {10.1109/SEMI-THERM.2015.7100183},
	unique-id = {2911949},
	year = {2015},
	pages = {332-335},
	orcid-numbers = {Kerecsen Istvánné Rencz, Márta/0000-0003-4183-3853}
}

@misc{MTMT:2906520,
	title = {Thermal nanoelectronics},
	url = {https://m2.mtmt.hu/api/publication/2906520},
	author = {Mizsei, János and Juhász, László and Bein, Márton},
	unique-id = {2906520},
	year = {2015},
	orcid-numbers = {Mizsei, János/0000-0003-3411-1502}
}

@inproceedings{MTMT:2953874,
	title = {Thermal-Electronic Circuits: Basics, Simulations, Experiments},
	url = {https://m2.mtmt.hu/api/publication/2953874},
	author = {Mizsei, János and Bein, Márton and Jyrki, Lappalainen and Juhász, László},
	booktitle = {2015 21st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)},
	doi = {10.1109/THERMINIC.2015.7389599},
	unique-id = {2953874},
	abstract = {Semiconductor devices are sensitive on temperature, and they produce a lot of heat because of the high power density. Therefore thermal effects have high importance in the operation of the semiconductor based microsystems. The thermal management has key importance in the microsystem construction, however thermal effects has been treated as parasitic phenomena until now. Recent research demonstrated that beside the electrical signal the thermal signal can also be treated as logic variable. In order to get closer to both the construction aspects and modeling questions of thermal-electronic devices lateral thin film semiconductor devices were constructed by laser ablation (vanadium dioxide, VO2) and cathode sputtering technology (Pt electrodes). The high temperature sensitivity of semiconductor-metal transition (SMT) semiconductor resulted in promising switching characteristics. A model was constructed and thermal-electric simulations were performed; the results are in good correlation with the measurements validating both the model and the explanation of the behavior.},
	keywords = {METAL-INSULATOR-TRANSITION; VO2},
	year = {2015},
	orcid-numbers = {Mizsei, János/0000-0003-3411-1502}
}

@article{MTMT:2976582,
	title = {Thermal-electronic logic circuits: Scaling down},
	url = {https://m2.mtmt.hu/api/publication/2976582},
	author = {Mizsei, János and Bein, Márton and J, Lappalainen and Juhász, László},
	doi = {10.1016/j.mejo.2015.10.003},
	journal-iso = {MICROELECTRON J},
	journal = {MICROELECTRONICS JOURNAL},
	volume = {46},
	unique-id = {2976582},
	issn = {0959-8324},
	year = {2015},
	eissn = {1879-2391},
	pages = {1175-1178},
	orcid-numbers = {Mizsei, János/0000-0003-3411-1502}
}