1.
Bein, Marton C. ; Bornoff, Robin ; Farkas, Gabor ; Gaal, Lajos ; Poppe, Andras ; Rencz, Marta ✉
Measurement-Based Multi-Domain Modeling of LEDs for “Industry 4.0”
In: Proceedings of The 18th Intersociety Conference on Thermomechanical Phenomena in Electronic Systems (ITHERM'19)
Las Vegas, United States of America : IEEE (2019) pp. 23-30. , 8 p.
DOI ISSN: 1936-3958 IEEE Xplore WoS Scopus Other URL
Publication:30881278 Validated Core Citing Conference paper (Conference paper ) Scientific
Citing papers: 2 | Independent citation: 2 | Self citation: 0 | Unknown citation: 0 | Number of citations in WoS: 2 | Number of citations in Scopus: 2 | WoS/Scopus assigned: 2 | Number of citations with DOI: 2
Conference paper (Conference paper) | Scientific[30881278] [Validated]
All citations+mentions: 2, External citations: 2, Self citations: 0, Unhandled citations: 0
2.
Gábor, Farkas ; Lajos, Gaál ; Márton, Bein ; András, Poppe ; Sándor, Ress ; Márta, Rencz
LED Characterization within the Delphi4LED Project
In: Jeffrey, C Suhling (eds.) Proceedings of The 17th Intersociety Conference on Thermomechanical Phenomena in Electronic Systems (ITHERM'18)
San Diego, United States of America : IEEE (2018) 1,410 p. p. 262 Paper: p393 , 9 p.
DOI IEEE Xplore WoS Scopus
Publication:3378564 Published Core Chapter in Book (Conference paper ) Scientific
Citing papers: 4 | Independent citation: 4 | Self citation: 0 | Unknown citation: 0 | Number of citations in WoS: 4 | Number of citations in Scopus: 4 | WoS/Scopus assigned: 4 | Number of citations with DOI: 4
Conference paper (Chapter in Book) | Scientific[3378564] [Approved]
All citations+mentions: 4, External citations: 4, Self citations: 0, Unhandled citations: 0
3.
Bein, Márton C ; Hegedűs, János ; Hantos, Gusztáv ; Gaál, Lajos ; Farkas, Gábor ; Rencz, Márta ; Poppe, András
Comparison of Two Alternate Junction Temperature Setting Methods aimed for Thermal and Optical Testing of High Power LEDs
In: W, Luiten; J, Janssen; G, Martin (eds.) 2017 23rd International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC'17)
Amszterdam, Netherlands : IEEE (2017) Paper: Paper_164 , 4 p.
DOI IEEE Xplore WoS
Publication:3257748 Published Core Chapter in Book (Conference paper ) Scientific
Citing papers: 2 | Independent citation: 2 | Self citation: 0 | Unknown citation: 0 | Number of citations in WoS: 2 | Number of citations in Scopus: 1 | WoS/Scopus assigned: 2 | Number of citations with DOI: 2
Conference paper (Chapter in Book) | Scientific[3257748] [Approved]
All citations+mentions: 2, External citations: 2, Self citations: 0, Unhandled citations: 0
4.
G, Hantos ; J, Hegedüs ; M C, Bein ; L, Gaál ; G, Farkas ; Z, Sarkany ; S, Ress ; A, Poppe ; M, Rencz
Measurement issues in LED characterization for Delphi4LED style combined electrical-optical-thermal LED modeling
In: IEEE (eds.) 2017 IEEE 19th Electronics Packaging Technology Conference (EPTC)
New York City, United States of America : IEEE (2017) Paper: 173 , 7 p.
DOI IEEE Xplore WoS Scopus
Publication:3285479 Published Core Citing Chapter in Book (Conference paper ) Scientific
Citing papers: 3 | Independent citation: 2 | Self citation: 1 | Unknown citation: 0 | Number of citations in WoS: 3 | Number of citations in Scopus: 3 | WoS/Scopus assigned: 3 | Number of citations with DOI: 3
Conference paper (Chapter in Book) | Scientific[3285479] [Approved]
All citations+mentions: 3, External citations: 2, Self citations: 1, Unhandled citations: 0
5.
Gabor, Farkas ; Marton, C Bein ; Lajos, Gaál
Multi domain modelling of power LEDs based on measured isothermal and transient I-V-L characteristics
In: András, Poppe (eds.) 2016 22nd International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC'16)
New York City, United States of America : IEEE (2016) 349 p. pp. 181-186. , 6 p.
DOI IEEE Xplore WoS Scopus
Publication:3213229 Validated Core Citing Chapter in Book (Conference paper ) Scientific
Citing papers: 8 | Independent citation: 8 | Self citation: 0 | Unknown citation: 0 | Number of citations in WoS: 8 | Number of citations in Scopus: 2 | WoS/Scopus assigned: 8 | Number of citations with DOI: 8
Conference paper (Chapter in Book) | Scientific[3213229] [Validated]
All citations+mentions: 8, External citations: 8, Self citations: 0, Unhandled citations: 0
6.
Attila, Szel ; Zoltan, Sarkany ; Marton, Bein ; Robin, Bornoff ; Andras, Vass-Varnai ; Marta, Rencz
Mission profile driven component design for adjusting product lifetime on system level
In: IEEE (eds.) Proceedings of International Conference on Electronics Packaging
New York City, United States of America : IEEE (2015) pp. 385-389. , 5 p.
DOI WoS Scopus
Publication:2911926 Validated Core Citing Chapter in Book (Conference paper ) Scientific
Citing papers: 1 | Independent citation: 1 | Self citation: 0 | Unknown citation: 0 | Number of citations in Scopus: 1 | WoS/Scopus assigned: 1 | Number of citations with DOI: 1
Conference paper (Chapter in Book) | Scientific[2911926] [Validated]
All citations+mentions: 1, External citations: 1, Self citations: 0, Unhandled citations: 0
7.
Attila, Szel ; Zoltan, Sarkany ; Marton, Bein ; Robin, Bornoff ; Andras, Vass-Varnai ; Marta, Rencz
Lifetime estimation of power electronics modules considering the target application
In: Paul, Wesling (eds.) Proceedings of the 31st IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM'15)
New York City, United States of America : IEEE (2015) pp. 332-335. , 4 p.
DOI WoS Scopus
Publication:2911949 Validated Core Citing Chapter in Book (Conference paper ) Scientific
Citing papers: 3 | Independent citation: 3 | Self citation: 0 | Unknown citation: 0 | Number of citations in WoS: 1 | Number of citations in Scopus: 1 | WoS/Scopus assigned: 2 | Number of citations with DOI: 3
Conference paper (Chapter in Book) | Scientific[2911949] [Validated]
All citations+mentions: 3, External citations: 3, Self citations: 0, Unhandled citations: 0
8.
Janos, Mizsei ; Laszlo, Juhasz ; Marton, C Bein
Thermal nanoelectronics (2015)
EuroNanoForum 2015 conference (ENF 2015), 10-12 June 2015, Riga, Latvia (poszter, 1A-29, Best Poster Award), Country: Latvia,
Publication:2906520 Approved Core Miscellaneous (Not classified )
Not classified (Miscellaneous) | Scientific[2906520] [Approved]
9.
János, Mizsei ; Márton, C Bein ; Jyrki, Lappalainen ; László, Juhász
Thermal-Electronic Circuits: Basics, Simulations, Experiments
In: Chris, Bailey; Bernhard, Wunderle; Sebastian, Volz (eds.) 2015 21st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
New York City, United States of America : IEEE (2015) Paper: 7389599 , 6 p.
DOI WoS Scopus
Publication:2953874 Published Core Citing Chapter in Book (Conference paper ) Scientific
Citing papers: 2 | Independent citation: 2 | Self citation: 0 | Unknown citation: 0 | Number of citations in WoS: 1 | Number of citations in Scopus: 2 | WoS/Scopus assigned: 2 | Number of citations with DOI: 2
Conference paper (Chapter in Book) | Scientific[2953874] [Approved]
All citations+mentions: 2, External citations: 2, Self citations: 0, Unhandled citations: 0
10.
J, Mizsei ; M C, Bein ; J, Lappalainen ; L, Juhász
Thermal-electronic logic circuits: Scaling down
MICROELECTRONICS JOURNAL 46 : 12 A pp. 1175-1178. , 4 p. (2015)
DOI ScienceDirect WoS Scopus
Publication:2976582 Validated Core Citing Journal Article (Article ) Scientific
Citing papers: 8 | Independent citation: 2 | Self citation: 6 | Unknown citation: 0 | Number of citations in WoS: 7 | Number of citations in Scopus: 6 | WoS/Scopus assigned: 8 | Number of citations with DOI: 8
Article (Journal Article) | Scientific[2976582] [Validated]
All citations+mentions: 8, External citations: 2, Self citations: 6, Unhandled citations: 0
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