TY - JOUR AU - Makedonski, Philip AU - Adamis, Gusztáv AU - Käärik, Martti AU - Kristoffersen, Finn AU - Carignani, Michele AU - Ulrich, Andreas AU - Grabowski, Jens TI - Test descriptions with ETSI TDL JF - SOFTWARE QUALITY JOURNAL J2 - SOFTWARE QUAL J VL - 27 PY - 2019 IS - 2 SP - 885 EP - 917 PG - 33 SN - 0963-9314 DO - 10.1007/s11219-018-9423-9 UR - https://m2.mtmt.hu/api/publication/30311636 ID - 30311636 LA - English DB - MTMT ER - TY - CONF AU - Philip, Makedonski AU - Adamis, Gusztáv AU - Martti, Käärik AU - Finn, Kristoffersen AU - György, Réthy TI - From TDL to TTCN-3: A Step by Step Tutorial T2 - User Conference on Advanced Automated Testing (UCAAT) 2017 C1 - Berlin PY - 2017 UR - https://m2.mtmt.hu/api/publication/3304499 ID - 3304499 N1 - 96 slides AB - Abstract This tutorial will briefly introduce both languages and showcase how executable TTCN-3 code can be derived from a higher level TDL test description by explaining the necessary steps and assumptions, as well as common challenges associated with mapping languages at different levels of abstraction. The tutorial is based on the currently ongoing work towards the standardised mapping of TDL to TTCN-3, which is expected to be finished in January 2018. The challenges faced during the mapping of the two languages, and corresponding solutions to common problems of bridging the gaps between languages and representations at different levels of abstraction may benefit users and tool vendors aiming to do the same with other technologies. The tutorial will also feature examples from a case study related to smartphone app user interface testing. The tutorial will share experiences and challenges with mapping TDL to TTCN-3, including identifying semantic gaps between the languages, as well as other challenges and common pitfalls, and lessons learnt from the experience, as well as suggestions for the design of future languages at different levels of abstraction. LA - English DB - MTMT ER - TY - CONF AU - Philip, Makedonski AU - Adamis, Gusztáv AU - Martti, Käärik AU - Finn, Kristoffersen AU - György, Réthy TI - Mapping TDL to TTCN-3 T2 - User Conference on Advanced Automated Testing (UCAAT) 2017 C1 - Berlin PY - 2017 UR - https://m2.mtmt.hu/api/publication/3304500 ID - 3304500 N1 - 21 slides AB - While continuing development of the “Test Description Language” (TDL), the Technical Committee “Methods for Testing and Specification” (TC-MTS) at ETSI is focused on bridging the gap between high level test purposes and test cases. The process of stepwise development of tests from requirement specifications is well established and used in both, standardization and industry. This process is supported by methods and languages, such as TTCN-3 and TDL. TDL bridges the gap between declarative test purpose specifications and imperative test case specifications. The lack of a standardized mapping of TDL to TTCN-3 may result in a proliferation of different and possibly incompatible tool- and user-specific mappings of TDL test descriptions to executable test cases. Facing these challenges and common problems of bridging the gaps between languages and representations, users and tool vendors aiming to do the same with other technologies may benefit. This presentation will showcase experiences and the currently ongoing work on the standardized mapping of TDL to TTCN-3. LA - English DB - MTMT ER - TY - CHAP AU - Philip, Makedonski AU - Adamis, Gusztáv AU - Martti, Käärik AU - Finn, Kristoffersen AU - Xavier, Zeitoun ED - Grabowski, Jens ED - Herbold, Steffen TI - Evolving the ETSI Test Description Language T2 - System Analysis and Modeling. Technology-Specific Aspects of Models PB - Springer Netherlands CY - Cham SN - 9783319466125 T3 - Lecture Notes in Computer Science, ISSN 0302-9743 ; 9959. PY - 2016 SP - 116 EP - 131 PG - 16 DO - 10.1007/978-3-319-46613-2_8 UR - https://m2.mtmt.hu/api/publication/3304496 ID - 3304496 N1 - #Könyv Szerző ismeretlen AB - Increasing software and system complexity due to the integration of more and more diverse sub-systems presents new testing challenges. Standardisation and certification requirements in certain domains such as telecommunication, automotive, aerospace, and health-care contribute further challenges for testing systems operating in these domains. Consequently, there is a need for suitable methodologies, processes, languages, and tools to address these testing challenges. To address some of these challenges, the Test Description Language (TDL) has been developed at the European Telecommunications Standards Institute (ETSI) over the past three years. TDL bridges the gap between declarative test purposes and imperative test cases by offering a standardised language for the specification of test descriptions. TDL started as a standardised meta-model, subsequently enriched with a graphical syntax, exchange format, and a UML profile. A reference implementation of TDL has been developed as a common platform to accelerate the adoption of TDL and lower the barrier to entry for both end-users and tool-vendors. This article tells the story of the evolution of TDL from its conception. LA - English DB - MTMT ER - TY - CONF AU - Philip, Makedonski AU - Adamis, Gusztáv AU - Martti, Käärik AU - Finn, Kristoffersen AU - Andreas, Ulrich AU - Xavier, Zeitoun TI - Testing and Domain-Specific Modelling with TDL T2 - User Conference on Advanced Automated Testing 2016 PY - 2016 SP - 1 EP - 87 PG - 87 UR - https://m2.mtmt.hu/api/publication/3304502 ID - 3304502 N1 - https://ucaat.etsi.org/2016/documents/TUTORIAL_MAKEDONSKI_TDL.p df LA - English DB - MTMT ER - TY - JOUR AU - Adamis, Gusztáv AU - Kovács, Gábor AU - Rethy, G TI - Generating Performance Test Model from Conformance Test Logs JF - LECTURE NOTES IN ARTIFICIAL INTELLIGENCE J2 - LECT NOTES ARTIF INT VL - 9369 PY - 2015 SP - 268 EP - 284 PG - 17 SN - 0302-9743 DO - 10.1007/978-3-319-24912-4_19 UR - https://m2.mtmt.hu/api/publication/3120413 ID - 3120413 AB - In this paper, we present a method that learns a deterministic finite state machine from the conformance test logs of a telecommunication protocol; then that machine is used as test model for performance testing. The learning process is in contrast to most theoretical methods automatic; it applies a sequential pattern mining algorithm on the test logs, and uses a recently proposed metric for finding frequent and significant transition sequences. The method aims to help and speed up test model design, and at the same time it may not provide an exact solution, the equivalence of some states may not be proven. In the paper, we show the results of experiments on random machines, and issues and considerations that arise when the method was applied to 3GGP Telephony Application Server test logs. LA - English DB - MTMT ER - TY - CONF AU - Erős, Levente AU - Kovács, Gábor AU - Adamis, Gusztáv AU - Réthy, György TI - Unsupervised Test Model Reconstruction from Conformance Test Logs T2 - Proceedings of Research in Adaptive and Convergent Systems 2015 PY - 2015 SP - 482 EP - 488 PG - 7 DO - 10.1145/2811411.2811552 UR - https://m2.mtmt.hu/api/publication/3038496 ID - 3038496 LA - English DB - MTMT ER - TY - CONF AU - Philip, Makedonski AU - Adamis, Gusztáv AU - Martti, Käärik AU - Finn, Kristoffersen AU - Xavier, Zeitoun TI - APPLYING TDL IN PRACTICE T2 - User Conference on Advanced Automated Testing 2015 PY - 2015 SP - 1 EP - 88 PG - 88 UR - https://m2.mtmt.hu/api/publication/3304505 ID - 3304505 N1 - https://ucaat.etsi.org/2015/presentations/TUTORIAL_TDL_MAKEDONS KI.pdf LA - English DB - MTMT ER - TY - CONF AU - Erős, Levente AU - Kovács, Gábor AU - Adamis, Gusztáv TI - Test modeling in TTCN-3 T2 - HUSTEF 2014 PY - 2014 SP - 45678 UR - https://m2.mtmt.hu/api/publication/3038523 ID - 3038523 LA - English DB - MTMT ER - TY - CHAP AU - Adamis, Gusztáv AU - Wu Hen Chang, Antal AU - Németh, Gábor Árpád AU - Erős, Levente AU - Kovács, Gábor ED - F, Khendek ED - M, Toeroe ED - A, Gherbi ED - R, Reed TI - Data Flow Testing in TTCN-3 with a Relational Database Schema T2 - SDL 2013 PB - Springer Netherlands CY - Berlin CY - Heidelberg SN - 9783642389108 PY - 2013 SP - 1 EP - 18 PG - 18 UR - https://m2.mtmt.hu/api/publication/2692822 ID - 2692822 LA - English DB - MTMT ER -