https://m2.mtmt.hu/ eng 2026-08-25 11:46 BookChapter 36296141 VALIDATED true 0 false 2026-05-17T18:45:59.236+0000 2026-03-31T12:25:36.881+0000 2025-08-22T18:27:10.862+0000 true 10042053 Géczy Attila /api/author/10042053 Author true 10042053 2026-04-21T23:23:52.984+0000 2026-04-21T23:23:52.984+0000 2026-01-28T10:21:40.651+0000 true 10051300 Háromszéki-Virág Fruzsina /api/admin/10051300 Admin true 10051300 2026-01-28T10:21:43.711+0000 true 10051300 Háromszéki-Virág Fruzsina /api/admin/10051300 Admin true 10051300 Admin 10003141 /api/admin/10003141 Aggod Zsuzsa true 10003141 true 2026-03-25T08:22:37.424+0000 true false true 25 25 /api/publicationtype/25 PublicationType 2 true 25 BookChapter true 10000312 Conference paper true 25 25 /api/publicationtype/25 PublicationType 2 true 25 BookChapter /api/subtype/10000312 Konferenciaközlemény SubType 228 true 10000312 true 1 /api/category/1 Category true 1 Wodak, Irina Investigation of Electromigration in Cu-Sn Interfaces under the Condition of High-Current Pulses 11121002 11121002 5 2025 As electronic devices become more compact and power-dense, the reliability of solder joints, particularly those using lead-free solders such as Sn−3.5Ag, faces significant challenges due to electromigration (EM) and intermetallic compound (IMC) growth. This study investigates the effects of high-current pulses (100−200 A) on Cu−Sn solder joints, focusing on the impact of Fe nanoparticle (NP)-doped flux on mitigating electromigration under accelerated conditions. Solder joints were subjected to pulsed current stressing at a sample temperature of approximately 75∘C, and the resulting microstructural changes were examined. Results showed significant IMC growth, particularly at the anode side of solder joints, with morphological transitions from scalloped to planar IMC structures. After pulsed current stressing, some joints exhibited IMC degradation at the cathode side. The influence of Fe NP doping on EM effects was less clear, with variability in the microstructural response observed across different solder bridges. These results demonstrate that pulsed high-current loading induces distinct microstructural changes and is a viable approach for studying accelerated electromigration. true INTERNATIONAL 2025 true true true true true false NONE 2026-05-17 false 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 false false false false 2025-08-31T08:27:53.302+0000 Elektronikai Technológia Tanszék (BME / VIK) 2 3 1 7 0 true true 10002 English /api/language/10002 Angol Language true 2 false true 10939 true 10017 /api/country/10017 Country true 13 /api/city/10939 City true 2054246 true 31289922 IDENTICAL /api/publicationidentifier/31289922 https://doi.org/10.1109/ISSE65583.2025 10.1109/ISSE65583.2025 PublicationIdentifier true 6 DOI https://doi.org/@@@ /api/publicationsource/6 DOI PlainSource true true 10001 /api/publicationsourcetype/10001 PublicationSourceType true true 6 true true true 29726224 IDENTICAL /api/publicationidentifier/29726224 https://www.worldcat.org/search?q=isbn%3A9798331512163 9798331512163 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false 10003141 Language 10002 /api/language/10002 Angol English true 2 true PersonAuthorship 127574924 /api/authorship/127574924 1 0.14285715 true false false Wodak Irina true false false AuthorshipType 1 /api/authorshiptype/1 0 true 0 true false true PersonAuthorship 127574925 /api/authorship/127574925 2 0.14285715 false false false Khatibti Golta true false false AuthorshipType 1 /api/authorshiptype/1 0 true 0 true false true PersonAuthorship 127574926 /api/authorship/127574926 3 0.14285715 false false false Yakymovych Andriy true false false AuthorshipType 1 /api/authorshiptype/1 0 true 0 true false true PersonAuthorship 127574927 /api/authorship/127574927 4 0.14285715 false false false Walter Thomas true false false AuthorshipType 1 /api/authorshiptype/1 0 true 0 true false true PersonAuthorship 127574928 /api/authorship/127574928 5 0.14285715 false false false Nicolics Johann true false false AuthorshipType 1 /api/authorshiptype/1 0 true 0 true false true PersonAuthorship 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67549358 /api/reference/67549358 2 10.1080/14686996.2019.1640072 false true Reference 67549359 /api/reference/67549359 3 10.1016/j.jallcom.2008.11.052 false true Reference 67549360 /api/reference/67549360 4 10.23919/ICEP55381.2022.9795439 false true Reference 67549361 /api/reference/67549361 5 10.1016/j.jallcom.2017.12.328 false true Reference 67549362 /api/reference/67549362 6 10.1007/s11664-017-5591-9 false true Reference 67549363 /api/reference/67549363 7 10.1016/j.intermet.2012.09.016 false true Reference 67549364 /api/reference/67549364 8 10.1007/s40195-024-01691-3 false true Reference 67549365 /api/reference/67549365 9 10.1016/j.matchar.2024.114247 false true Reference 67549366 /api/reference/67549366 10 10.1109/ISSE57496.2023.10168365 false true Reference 67549367 /api/reference/67549367 11 10.1533/9780081002254.515 false true Reference 67549368 /api/reference/67549368 12 10.1007/978-0-387-38892-2 false true Reference 67549369 /api/reference/67549369 13 false true Reference 67549370 /api/reference/67549370 14 false true Reference 67549371 /api/reference/67549371 15 10.1002/9781119418344.ch10 false true Reference 67549372 /api/reference/67549372 16 10.1109/SIITME63973.2024.10814758 false true /api/publication/36296141 <div class="BookChapter Publication long-list"> <div class="authors"> <img title="Forrásközlemény" style="float: left" src="/frontend/resources/grid/publication-core-icon.png"> <div class="autype autype0"> <span class="author-name" >Wodak Irina </span> ;&nbsp;&nbsp;&nbsp; <span class="author-name" >Khatibti Golta </span> ;&nbsp;&nbsp;&nbsp; <span class="author-name" >Yakymovych Andriy </span> ;&nbsp;&nbsp;&nbsp; <span class="author-name" >Walter Thomas </span> ;&nbsp;&nbsp;&nbsp; <span class="author-name" >Nicolics Johann </span> ;&nbsp;&nbsp;&nbsp; <span class="author-name" mtid="10042053"><a href="/gui2/?type=authors&mode=browse&sel=10042053" target="_blank">Géczy Attila (<span class="authorship-author-name">Géczy Attila</span> <span class="authorAux-mtmt"> Elektronikai technológia</span>) </a> </span> <span class="author-affil"><span title="Budapest University of Technology and Economics">BUTE</span>/<span title="Faculty of Electrical Engineering and Informatics">FEEI</span>/Department of Electronics Technology</span> ;&nbsp;&nbsp;&nbsp; <span class="author-name" mtid="10019053"><a href="/gui2/?type=authors&mode=browse&sel=10019053" target="_blank">Krammer Oliver (<span class="authorship-author-name">Krammer Olivér</span> <span class="authorAux-mtmt"> Elektronikai technológia</span>) </a> </span> <span class="author-affil"><span title="Budapest University of Technology and Economics">BUTE</span>/<span title="Faculty of Electrical Engineering and Informatics">FEEI</span>/Department of Electronics Technology</span> </div> </div> <div class="title"><a href="/gui2/?mode=browse&params=publication;36296141" target="_blank">Investigation of Electromigration in Cu-Sn Interfaces under the Condition of High-Current Pulses</a></div> <div class="InBook"><div class="chapter-in">In:</div> <div class="authors"> <div class="autype autype-1"> <span class="author-affil">IEEE</span> (eds.) </div> </div> <div class="booktitle"><a href="/gui2/?mode=browse&params=publication;36293175" target="_blank">2025 International Spring Seminar on Electronics Technology (ISSE) </a></div> <div class="conference"> Conference: <span class="location">Bp, Hungary <span class="conference-date">2025.05.14. - 2025.05.18.</span> </div> <span class="publishedAt">Piscataway (NJ): <span class="publishers">IEEE</span>, <span class="page"> Paper 11121002. 5 p. </span> <span class="year">(2025)</span> ( <span class="seriesTitle">International Spring Seminar on Electronics Technology ISSE</span> <span class="issn">2161-2528</span> <span class="issn">2161-2536</span> ) </div> <div class="pub-footer"> <span class="language" xmlns="http://www.w3.org/1999/html">Language: English | </span> <span class="identifiers"> <span class="id identifier oa_none" title="none"> <a style="color:blue" title="10.1109/ISSE65583.2025.11121002" target="_blank" href="https://doi.org/10.1109/ISSE65583.2025.11121002"> DOI </a> </span> <span class="id identifier oa_none" title="none"> <a style="color:blue" title="001585293500062" target="_blank" href="https://www.webofscience.com/wos/woscc/full-record/001585293500062"> WoS </a> </span> <span class="id identifier oa_none" title="none"> <a style="color:blue" title="105015732616" target="_blank" href="http://www.scopus.com/record/display.url?origin=inward&eid=2-s2.0-105015732616"> Scopus </a> </span> <span class="id identifier oa_none" title="none"> <a style="color:blue" title="https://ieeexplore.ieee.org/document/11121002/" target="_blank" href="https://ieeexplore.ieee.org/document/11121002/"> Other URL </a> </span> </span> <span class="bookchapter-ids">Book link(s):</span> <span class="identifiers"> <span class="id identifier oa_none" title="none"> <a style="color:blue" title="10.1109/ISSE65583.2025" target="_blank" href="https://doi.org/10.1109/ISSE65583.2025"> DOI </a> </span> <span class="id identifier oa_none" title="none"> <span class="isbnOrIssn"> ISBN: </span> <a style="color:blue" title="9798331512163" target="_blank" href="https://www.worldcat.org/search?q=isbn%3A9798331512163"> 9798331512163 </a> </span> <span class="id identifier oa_none" title="none"> <span class="isbnOrIssn"> ISBN: </span> <a style="color:blue" title="9798331512170" target="_blank" href="https://www.worldcat.org/search?q=isbn%3A9798331512170"> 9798331512170 </a> </span> </span> <div class="mtid"><span class="long-pub-mtid">Publication: 36296141</span> | <span class="status-data status-VALIDATED"> Validated </span> <span class="long-book-mtid">Book: 36293175</span> Core | <span class="type-subtype">Chapter in Book ( Conference paper ) </span> | <span class="pub-category">Scientific</span> | <span class="publication-sourceOfData"></span> </div> <div class="lastModified">Last Modified: 2026.03.31. 14:25 András Balázs (MTMT Központ, admin) </div> <div class="lockedBy">Centrally managed 2026.03.25. 09:22 Zsuzsa Aggod (MTMT 2-3, admin) </div> </div> </div>