ARTIFICIAL INTELLIGENCE AND MACHINE LEARNING IN DEFENSE APPLICATIONS II

Dijk, J [ed.]

English Conference proceedings (Book) Scientific

Published: International Society for Optics and Photonics (SPIE), Bellingham (WA), United States of America 2020

Conference: Conference on Artificial Intelligence and Machine Learning in Defense Applications II 2020-09-21

Series: Proceedings of SPIE 0277-786X 1996-756X

Identifiers

MTMT: 35561653
ISBN: 9781510639003

Chapters

Voronin V. et al. Image enhancement in a quaternion framework for remote sensing applications. (2020) In: ARTIFICIAL INTELLIGENCE AND MACHINE LEARNING IN DEFENSE APPLICATIONS II

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2025-04-16 17:04