THIRTEENTH INTERNATIONAL CONFERENCE ON QUALITY CONTROL BY ARTIFICIAL VISION 2017

Nagahara, H [ed.]; Umeda, K [ed.]; Yamashita, A [ed.]

English Conference proceedings (Book) Scientific
Published: International Society for Optics and Photonics (SPIE), Bellingham (WA), United States of America 2017
Conference: 13th International Conference on Quality Control by Artificial Vision 2017-05-14 [Tokyo, Japan]
Series: Proceedings of SPIE 0277-786X 1996-756X
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    2025-04-16 17:52