https://m2.mtmt.hu/ hun 2026-05-02 15:37 JournalArticle 35133146 VALIDATED true Department of Electron Devices, Faculty of Electrical Engineering and Informatics, Budapest University of Technology and Economics, Műegyetem rkp. 3., Budapest, H-1111, Hungary Siemens Digital Industry Software, Lajos utca 48-66, Budapest, H-1036, Hungary Export Date: 15 July 2024 Correspondence Address: Ress, S.; Department of Electron Devices, Műegyetem rkp. 3., Hungary; email: ress.sandor@vik.bme.hu Funding details: European Commission, EC Funding text 1: This project is supported by the Chips Joint Undertaking and its members, including the top-up funding by the national Authorities of Germany, Belgium, Spain, Sweden, Netherlands, Austria, Italy, Greece, Latvia, Finland, Hungary, Romania, and Switzerland, under grant agreement number 101096387. Co-funded by European Union. The authors wish to thank Gerzson V\\u00E9gh Jr. for his help in the bath thermostat measurements. 0 false 2026-01-01T23:23:40.516+0000 2024-07-15T09:52:02.731+0000 2024-07-15T09:17:20.615+0000 true 10072271 Andódy Katalin /api/admin/10072271 Admin Andódy Katalin (BME admin4) true 2024-09-22T16:04:13.199+0000 2024-07-15T09:52:02.741+0000 true 10072271 Andódy Katalin /api/admin/10072271 Admin Andódy Katalin (BME admin4) true 2024-09-22T16:04:13.368+0000 true 521 Szuper Admin /api/admin/521 Admin Szuper Admin (admin) true true false true 24 24 /api/publicationtype/24 PublicationType Folyóiratcikk 1 true 24 JournalArticle true 10000059 Article true 24 24 /api/publicationtype/24 PublicationType Folyóiratcikk 1 true 24 JournalArticle /api/subtype/10000059 Szakcikk SubType Szakcikk (Folyóiratcikk) 101 true 10000059 true 1 /api/category/1 Category Tudományos true 1 Ress, Sandor true true /api/journal/10015664 REVIEWED ENERGIES 1996-1073 1996-1073 true false 10015664 false 10015664 true 1996-1073 1996-1073 Journal FOREIGN 17 12 2931 2931 23 2024 The thermal characterization of power devices is an inevitable task in the industry. Thermal transient testing is one of the major tools for this characterization, as it is not only capable of giving information about the actual thermal parameters but may also reveal the root cause of potential device failures. The testing may occur on single packages or modules on a dedicated standard test bench, or “in situ”, in an actual assembly. The testing process itself is very fast in both cases, on the order of seconds, but the transient measurement needs to be preceded by a calibration step to determine the temperature dependence of a temperature-sensitive parameter (TSP) of the semiconductor device. This may require a long time, as the device has to be measured at many stabilized temperatures, which in the case of power devices may take hours. It also has to be considered that, especially in “in situ” measurements, reaching the highest device temperatures of power devices may even damage other parts of the surrounding electronics. Moreover, the temperature distribution inside a module will be different at calibration time than during operation with the same junction temperature, as bond wires and copper traces do not reach the chip temperature in the latter case. This paper presents a methodology that can be used to replace the lengthy measurement of one parameter at many temperatures with a fast single I–V characteristics measurement at room temperature. Physics-based calculations assign a unique temperature-sensitive parameter to each item of interest in the system. After the presentation of the theoretical background, the usability of the method is demonstrated by verifying measurements on silicon power devices. © 2024 by the authors. 2024 true true true false true false GOLD 2026-01-02 true https://doi.org/10.3390/en17122931 1 0 1 1 0 1 1 1 0 1 1 1 1 1 0 0 1 1 1 1 0 1 1 Folyóiratcikk Journal Article 24 0 Könyvrészlet Chapter in Book 25 1 Könyv Book 23 0 Egyéb konferenciaközlemény Conference paper 31 0 Egyéb konferenciakötet Conference proceedings 32 0 Oltalmi formák Protection forms 26 0 Disszertáció Thesis 28 0 Egyéb Miscellaneous 29 0 Alkotás Achievement 22 0 Kutatási adat Research data 33 0 Folyóiratcikk Journal Article 24 0 0 0 Könyvrészlet Chapter in Book 25 0 0 0 Könyv Book 23 0 0 0 Egyéb konferenciaközlemény Conference paper 31 0 0 0 Egyéb konferenciakötet Conference proceedings 32 0 0 0 Oltalmi formák Protection forms 26 0 0 0 Disszertáció Thesis 28 0 0 0 Egyéb Miscellaneous 29 0 0 0 Alkotás Achievement 22 0 0 0 Kutatási adat Research data 33 0 0 0 2024 0 1 1 1 1 Q1 C nemzetközi false 10010863,10041004 false false false 2024-07-14T09:52:02.466+0000 Elektronikus Eszközök Tanszéke (BME / VIK) 2 8 1 3 0 true Language 10002 /api/language/10002 Angol Angol English true 2 true PersonAuthorship 118266676 /api/authorship/118266676 Ress, Sandor ✉ [Ress, Sándor László (Elektronikus Eszk...), szerző] Elektronikus Eszközök Tanszéke (BME / VIK) 1 0.333 true false true Author 10041004 /api/author/10041004 Ress Sándor László (Elektronikus Eszközök) Ress Sándor László true 10041004 true Ress Sandor true false false AuthorshipType 1 /api/authorshiptype/1 Szerző 0 true 0 true false true PersonAuthorship 118266677 /api/authorship/118266677 Farkas, Gabor 2 0.333 false false false Farkas Gabor true false false AuthorshipType 1 /api/authorshiptype/1 Szerző 0 true 0 true false true PersonAuthorship 118266678 /api/authorship/118266678 Rencz, Marta [Kerecsen Istvánné Rencz, Márta (Mikroelektronika), szerző] Elektronikus Eszközök Tanszéke (BME / VIK) 3 0.333 false true false Author 10010863 /api/author/10010863 Kerecsen Istvánné Rencz Márta (Mikroelektronika) Kerecsen Istvánné Rencz Márta true 10010863 true Rencz Marta true false false AuthorshipType 1 /api/authorshiptype/1 Szerző 0 true 0 true false true PublicationIdentifier 26833175 /api/publicationidentifier/26833175 DOI: 10.3390/en17122931 PlainSource 6 /api/publicationsource/6 DOI PublicationSourceType 10001 /api/publicationsourcetype/10001 DOI true true true DOI DOI https://doi.org/@@@ true true 6 true GOLD true IDENTICAL 10.3390/en17122931 https://doi.org/10.3390/en17122931 false true PublicationIdentifier 26833176 /api/publicationidentifier/26833176 WoS: 001256056700001 PlainSource 1 /api/publicationsource/1 WoS PublicationSourceType 10003 /api/publicationsourcetype/10003 Indexelő adatbázis false true true WoS WoS https://www.webofscience.com/wos/woscc/full-record/@@@ true true 1 true IDENTICAL 001256056700001 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1181775 true Keyword 1237827 /api/keyword/1237827 Analytical predictions true 1237827 true Keyword 1319346 /api/keyword/1319346 Thermal transient measurements true 1319346 true Keyword 1319374 /api/keyword/1319374 Thermal transient measurement true 1319374 true Keyword 1420333 /api/keyword/1420333 P-n junction true 1420333 true Keyword 1430264 /api/keyword/1430264 power semiconductor devices true 1430264 true Keyword 1533483 /api/keyword/1533483 Thermal behaviours true true Keyword 1619251 /api/keyword/1619251 temperature sensitive true true Keyword 1676987 /api/keyword/1676987 Power devices true true Keyword 1892412 /api/keyword/1892412 pn junction true true Keyword 3489640 /api/keyword/3489640 forward voltage true true Keyword 3489640 /api/keyword/3489640 forward voltage true true Keyword 3489641 /api/keyword/3489641 temperature sensitive parameters true true Keyword 3489644 /api/keyword/3489644 Temperature sensitive parameter true true Keyword 3489645 /api/keyword/3489645 temperature-to-voltage mapping true true Keyword 3489645 /api/keyword/3489645 temperature-to-voltage mapping true true MtaRating 11507822 /api/mtarating/11507822 IX. Szociológiai Tudományos Bizottság:C nemzetközi ENERGIES 1996-1073 1996-1073 RatingType 10007 /api/ratingtype/10007 IX. Szociológiai Tudományos Bizottság SZTB Institute 14102 /api/institute/14102 Szociológiai Tudományos Bizottság IXGJO SZTB [1901-] 0 false true false Szociológiai Tudományos Bizottság Committee on Sociology true 14102 true true true C nemzetközi false true SjrRating 11462911 /api/sjrrating/11462911 sjr:Q1 (2024) Scopus - Engineering (miscellaneous) ENERGIES 1996-1073 1996-1073 110 0.24 journal RatingType 10002 /api/ratingtype/10002 sjr sjr true true ClassificationExternal 2201 /api/classificationexternal/2201 Scopus - Engineering (miscellaneous) true 2201 true Q1 DIRECT true true Reference 55711594 /api/reference/55711594 1. Li, X., Wu, Z., Rzepa, G., Karner, M., Xu, G., Wu, Z., Wang, W., Wang, W., Overview of emerging semiconductor device model methodologies: From device physics to machine learning engines (2024) Fundam. 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(2024) ENERGIES 1996-1073 1996-1073 17 12<div class="JournalArticle Publication long-list"> <div class="authors"> <img title="Forrásközlemény" style="float: left" src="/frontend/resources/grid/publication-core-icon.png"> <img title="Idézőközlemény" style="float: left" src="/frontend/resources/grid/publication-citation-icon.png"> <div class="autype autype0"> <span class="author-name" mtid="10041004"><a href="/gui2/?type=authors&mode=browse&sel=10041004" target="_blank">Ress Sandor ✉ (<span class="authorship-author-name">Ress Sándor László</span> <span class="authorAux-mtmt"> Elektronikus Eszközök</span>) </a> </span> <span class="author-affil"><span title="Budapesti Műszaki és Gazdaságtudományi Egyetem">BME</span>/<span title="Villamosmérnöki és Informatikai Kar">VIK</span>/Elektronikus Eszközök Tanszéke</span> ;&nbsp;&nbsp;&nbsp; <span class="author-name" >Farkas Gabor </span> ;&nbsp;&nbsp;&nbsp; <span class="author-name" mtid="10010863"><a href="/gui2/?type=authors&mode=browse&sel=10010863" target="_blank">Rencz Marta (<span class="authorship-author-name">Kerecsen Istvánné Rencz Márta</span> <span class="authorAux-mtmt"> Mikroelektronika</span>) </a> </span> <span class="author-affil"><span title="Budapesti Műszaki és Gazdaságtudományi Egyetem">BME</span>/<span title="Villamosmérnöki és Informatikai Kar">VIK</span>/Elektronikus Eszközök Tanszéke</span> </div> </div> <div class="title"><a href="/gui2/?mode=browse&params=publication;35133146" target="_blank">Analytical Prediction of the Thermal Behavior of Semiconductor Power Devices from Room-Temperature I–V Measurements</a></div> <div> <span class="journal-title">ENERGIES</span> <span class="journal-issn">(<a target="_blank" href="https://portal.issn.org/resource/ISSN/1996-1073">1996-1073</a> <a target="_blank" href="https://portal.issn.org/resource/ISSN/1996-1073">1996-1073</a>)</span>: <span class="journal-volume">17</span> <span class="journal-issue">12</span> <span class="page"> Paper 2931. 23 p. </span> <span class="year">(2024)</span> </div> <div class="pub-footer"> <span class="language" xmlns="http://www.w3.org/1999/html">Nyelv: Angol | </span> <span class="identifiers"> <span class="id identifier oa_GOLD" title=" Gold "> <a style="color:blue" title="10.3390/en17122931" target="_blank" href="https://doi.org/10.3390/en17122931"> DOI </a> </span> <span class="id identifier oa_none" title="none"> <a style="color:blue" title="001256056700001" target="_blank" href="https://www.webofscience.com/wos/woscc/full-record/001256056700001"> WoS </a> </span> <span class="id identifier oa_none" title="none"> <a style="color:black" title="85197229149" target="_blank" href="http://www.scopus.com/record/display.url?origin=inward&eid=2-s2.0-85197229149"> Scopus </a> </span> </span> <OnlyViewableByAuthor><div class="ratings"> <div class="journal-subject">Folyóirat szakterülete: Scopus - Engineering (miscellaneous)&nbsp;&nbsp;&nbsp;SJR indikátor:&nbsp;Q1</div> <div class="journal-subject">Folyóirat szakterülete: Scopus - Control and Optimization&nbsp;&nbsp;&nbsp;SJR indikátor:&nbsp;Q2</div> <div class="journal-subject">Folyóirat szakterülete: Scopus - Electrical and Electronic Engineering&nbsp;&nbsp;&nbsp;SJR indikátor:&nbsp;Q2</div> <div class="journal-subject">Folyóirat szakterülete: Scopus - Energy (miscellaneous)&nbsp;&nbsp;&nbsp;SJR indikátor:&nbsp;Q2</div> <div class="journal-subject">Folyóirat szakterülete: Scopus - Energy Engineering and Power Technology&nbsp;&nbsp;&nbsp;SJR indikátor:&nbsp;Q2</div> <div class="journal-subject">Folyóirat szakterülete: Scopus - Fuel Technology&nbsp;&nbsp;&nbsp;SJR indikátor:&nbsp;Q2</div> <div class="journal-subject">Folyóirat szakterülete: Scopus - Renewable Energy, Sustainability and the Environment&nbsp;&nbsp;&nbsp;SJR indikátor:&nbsp;Q2</div> <div class="journal-subject">Szociológiai Tudományos Bizottság IXGJO SZTB [1901-]&nbsp;&nbsp;&nbsp;C nemzetközi</div> </div></OnlyViewableByAuthor> <div class="publication-citation" style="margin-left: 0.5cm;"> <span title="Nyilvános idézőközlemények összesen, említések nélkül" class="citingPub-count">Nyilvános idéző összesen: 1</span> | Független: 1 | Függő: 0 | Nem jelölt: 0 | WoS jelölt: 1 | WoS/Scopus jelölt:&nbsp;1 | DOI jelölt:&nbsp;1 </div> <div class="publication-citation"> <a target="_blank" href="/api/publication?cond=citations.related;eq;35133146&sort=publishedYear,desc&sort=title"> Idézett közlemények száma: 1 </a> </div> <div class="mtid"><span class="long-pub-mtid">Közlemény: 35133146</span> | <span class="status-data status-VALIDATED"> Egyeztetett </span> Forrás Idéző | <span class="type-subtype">Folyóiratcikk ( Szakcikk ) </span> | <span class="pub-category">Tudományos</span> | <span class="publication-sourceOfData">Scopus</span> </div> <div class="lastModified">Utolsó módosítás: 2024.07.15. 11:52 Andódy Katalin (BME admin4) </div> <pre class="comment" style="margin-top: 0; margin-bottom: 0;"><u>Megjegyzés</u>: Department of Electron Devices, Faculty of Electrical Engineering and Informatics, Budapest University of Technology and Economics, Műegyetem rkp. 3., Budapest, H-1111, Hungary Siemens Digital Industry Software, Lajos utca 48-66, Budapest, H-1036, Hungary Export Date: 15 July 2024 Correspondence Address: Ress, S.; Departmen...</pre> </div></div>