<?xml version="1.0" encoding="UTF-8"?>
<?xml-stylesheet type="text/xsl" href="https://m2.mtmt.hu/xsl/gui3.xsl" ?>
<myciteResult>
  <serverUrl>https://m2.mtmt.hu/</serverUrl>
  <labelLang>hun</labelLang>
  <responseDate>2026-05-25 22:55</responseDate>
  <content>
    <publication>
      <otype>BookChapter</otype>
      <mtid>34448277</mtid>
      <status>APPROVED</status>
      <published>true</published>
      <comment>Conference code: 194796            
            Export Date: 22 December 2023            
            Correspondence Address: Poppe, A.; Budapest University of Technology and Economics, Hungary; email: poppe.andras@vik.bme.hu
Funding Agency and Grant Number: European Union [101007319]; Hungarian government of the National Research, Development and Innovation Fund [2019-2.1.3-NEMZ_ECSEL-2021-00008]; Hungarian National Research, Development and Innovation Fund [K_128315]; Key Digital Technologies Joint Undertaking (KDT JU); Horizon Europe (HORIZON) [101096387]
            Funding text: The work presented has received funding from the European Union's Horizon 2020 research and innovation programme through the H2020 ECSEL project AI-TWILIGHT (grant agreement number: 101007319) co-financed by the national funding authorities of countries of the consortium members. Thus, co-financing of the AI-TWILIGHT project by the Hungarian government through the 2019-2.1.3-NEMZ_ECSEL-2021-00008 grant of the National Research, Development and Innovation Fund is also acknowledged. Part of this work was also supported by the K_128315 (OTKA) project of the Hungarian National Research, Development and Innovation Fund.; The research presented here is also connected to the workplan of the PowerizeD project that has been accepted for funding within the Key Digital Technologies Joint Undertaking (KDT JU), a public-private partnership in collaboration with the Horizon Europe (HORIZON) Framework Programme and the national funding authorities of the countries of the PowerizeD consortium members, under grant agreement number 101096387.</comment>
      <unhandledTickets>0</unhandledTickets>
      <deleted>false</deleted>
      <lastRefresh>2026-05-23T11:04:27.698+0000</lastRefresh>
      <lastModified>2024-03-14T15:03:13.762+0000</lastModified>
      <created>2023-12-22T09:21:16.905+0000</created>
      <creator>
        <snippet>true</snippet>
        <mtid>10071696</mtid>
        <familyName>Andódy</familyName>
        <givenName>Katalin</givenName>
        <link>/api/admin/10071696</link>
        <otype>Admin</otype>
        <label>Andódy Katalin (BME admin5)</label>
        <published>true</published>
      </creator>
      <lastDuplumOK>2024-03-14T15:03:23.430+0000</lastDuplumOK>
      <lastDuplumSearch>2024-03-14T15:03:23.430+0000</lastDuplumSearch>
      <core>true</core>
      <publicationPending>false</publicationPending>
      <type>
        <snippet>true</snippet>
        <mtid>25</mtid>
        <code>25</code>
        <link>/api/publicationtype/25</link>
        <otype>PublicationType</otype>
        <label>Könyvrészlet</label>
        <listPosition>2</listPosition>
        <published>true</published>
        <oldId>25</oldId>
        <otypeName>BookChapter</otypeName>
      </type>
      <subType>
        <snippet>true</snippet>
        <mtid>10000312</mtid>
        <nameEng>Conference paper</nameEng>
        <docType>
          <snippet>true</snippet>
          <mtid>25</mtid>
          <code>25</code>
          <link>/api/publicationtype/25</link>
          <otype>PublicationType</otype>
          <label>Könyvrészlet</label>
          <listPosition>2</listPosition>
          <published>true</published>
          <oldId>25</oldId>
          <otypeName>BookChapter</otypeName>
        </docType>
        <link>/api/subtype/10000312</link>
        <name>Konferenciaközlemény</name>
        <otype>SubType</otype>
        <label>Konferenciaközlemény (Könyvrészlet)</label>
        <listPosition>228</listPosition>
        <published>true</published>
        <oldId>10000312</oldId>
      </subType>
      <category>
        <snippet>true</snippet>
        <mtid>1</mtid>
        <link>/api/category/1</link>
        <otype>Category</otype>
        <label>Tudományos</label>
        <published>true</published>
        <oldId>1</oldId>
      </category>
      <firstAuthor>Poppe, A.</firstAuthor>
      <title>An Automated Method for Creating Compact Dynamic Thermal Models for In-situ Prognostics of Power Electronics and Power LED Packages</title>
      <internalId>10325882</internalId>
      <firstPageOrInternalIdForSort>10325882</firstPageOrInternalIdForSort>
      <pageLength>7</pageLength>
      <publishedYear>2023</publishedYear>
      <abstractText>In their typical application domains, power electronics components (power MOSFETs, IGBTs) as well as high power LEDs are subjects to cyclic operation. The subsequent on-off cycles result in cyclic changes of the junction temperature, resulting in thermo-mechanical stresses at critical thermal interfaces such as the die-Attach layer. Ultimately, in long-Term, these stresses lead to the degradation of such interfaces, causing a continuous increase of the corresponding partial thermal resistances of the overall heat-flow path of such packaged devices. Further thermal interfaces on system level may also be subject of degradation as a result of ageing during the product lifespan.Over the last two decades, structure function analysis has proven to be a powerful tool in laboratory testing to detect the resulting failures such as die attach voiding or delamination. Combining power-cycling tests with thermal transient measurements resulted in commercial test equipment widely used nowadays in reliability testing of power electronics components, but as of today, no embedded, in-situ solution was published that is aimed at health-monitoring and prognostics purposes of such components during field operation. The aim of this paper is to present a method that could automatically generate time series of element values of a Cauer-Type compact thermal model of the heat-flow path power electronics components and power LEDs during their operation. The series of partial thermal resistance values obtained this way allows a quasi-real-Time analysis of the mission profile dependent degradation of the heat-flow path, allowing prognostics purposes, such as estimation of the remaining useful lifetime (RUL) from the perspective of the thermal properties. © 2023 IEEE.</abstractText>
      <fundings>
        <funding>
          <otype>Funding</otype>
          <mtid>2031877</mtid>
          <link>/api/funding/2031877</link>
          <label>AI-TWILIGHT(H2020 ECSEL RIA 101007319) Támogató: ECSEL</label>
          <published>false</published>
          <snippet>true</snippet>
        </funding>
        <funding>
          <otype>Funding</otype>
          <mtid>2031878</mtid>
          <link>/api/funding/2031878</link>
          <label>AI-TWILIGHT_NEMZ(2019-2.1.3-NEMZ_ECSEL-2021-00008) Támogató: NKFIH</label>
          <published>false</published>
          <snippet>true</snippet>
        </funding>
        <funding>
          <otype>Funding</otype>
          <mtid>2031884</mtid>
          <link>/api/funding/2031884</link>
          <label>LED-REL(K 128315) Támogató: NKFIH</label>
          <published>false</published>
          <snippet>true</snippet>
        </funding>
        <funding>
          <otype>Funding</otype>
          <mtid>2031879</mtid>
          <link>/api/funding/2031879</link>
          <label>PowerizeD KDT EU(PowerizeD Horizone Europe KDT 101096387 project) Támogató: Horizone Europe</label>
          <published>false</published>
          <snippet>true</snippet>
        </funding>
        <funding>
          <otype>Funding</otype>
          <mtid>2031890</mtid>
          <link>/api/funding/2031890</link>
          <label>PowerizeD NEMZ(2022-1.2.8-KDT-2022-00001) Támogató: NKFIH</label>
          <published>false</published>
          <snippet>true</snippet>
        </funding>
      </fundings>
      <digital>true</digital>
      <printed>false</printed>
      <sourceYear>2023</sourceYear>
      <foreignEdition>false</foreignEdition>
      <foreignLanguage>true</foreignLanguage>
      <fullPublication>true</fullPublication>
      <conferencePublication>true</conferencePublication>
      <nationalOrigin>true</nationalOrigin>
      <missingAuthor>false</missingAuthor>
      <oaType>NONE</oaType>
      <oaCheckDate>2026-05-23</oaCheckDate>
      <oaFree>false</oaFree>
      <citationCount>0</citationCount>
      <citationCountUnpublished>0</citationCountUnpublished>
      <citationCountWoOther>0</citationCountWoOther>
      <independentCitCountWoOther>0</independentCitCountWoOther>
      <nationalOriginCitationCount>0</nationalOriginCitationCount>
      <foreignEditionCitationCount>0</foreignEditionCitationCount>
      <doiCitationCount>0</doiCitationCount>
      <wosCitationCount>0</wosCitationCount>
      <scopusCitationCount>0</scopusCitationCount>
      <wosScopusCitationCount>0</wosScopusCitationCount>
      <wosScopusCitationCountWoOther>0</wosScopusCitationCountWoOther>
      <wosScopusIndependentCitationCount>0</wosScopusIndependentCitationCount>
      <wosScopusIndependentCitationCountWoOther>0</wosScopusIndependentCitationCountWoOther>
      <independentCitationCount>0</independentCitationCount>
      <selfCitationCount>0</selfCitationCount>
      <unhandledCitationCount>0</unhandledCitationCount>
      <citingPubCount>0</citingPubCount>
      <independentCitingPubCount>0</independentCitingPubCount>
      <citingPubCountWoOther>0</citingPubCountWoOther>
      <independentCitingPubCountWoOther>0</independentCitingPubCountWoOther>
      <unhandledCitingPubCount>0</unhandledCitingPubCount>
      <citedPubCount>9</citedPubCount>
      <citedCount>9</citedCount>
      <hasCitationDuplums>false</hasCitationDuplums>
      <inSelectedPubs>10001242,10042119</inSelectedPubs>
      <importDuplum>false</importDuplum>
      <importOverwritten>false</importOverwritten>
      <importSkipped>false</importSkipped>
      <userChangeableUntil>2023-12-21T11:37:23.572+0000</userChangeableUntil>
      <directInstitutesForSort>Elektronikus Eszközök Tanszéke (BME / VIK)</directInstitutesForSort>
      <ownerAuthorCount>4</ownerAuthorCount>
      <ownerInstituteCount>4</ownerInstituteCount>
      <directInstituteCount>1</directInstituteCount>
      <authorCount>4</authorCount>
      <contributorCount>0</contributorCount>
      <book>
        <snippet>true</snippet>
        <languages>
          <language>
            <snippet>true</snippet>
            <mtid>10002</mtid>
            <nameEng>English</nameEng>
            <link>/api/language/10002</link>
            <name>Angol</name>
            <otype>Language</otype>
            <label>Angol</label>
            <published>true</published>
            <oldId>2</oldId>
          </language>
        </languages>
        <citation>false</citation>
        <publishedAt>
          <city>
            <snippet>true</snippet>
            <mtid>10003</mtid>
            <partOf>
              <snippet>true</snippet>
              <mtid>10001</mtid>
              <link>/api/country/10001</link>
              <otype>Country</otype>
              <label>Magyarország</label>
              <published>true</published>
              <oldId>1</oldId>
            </partOf>
            <link>/api/city/10003</link>
            <otype>City</otype>
            <label>Budapest, Magyarország</label>
            <published>true</published>
            <oldId>10005024</oldId>
          </city>
        </publishedAt>
        <identifiers>
          <identifier>
            <snippet>true</snippet>
            <mtid>25009370</mtid>
            <validState>DIFFERENT</validState>
            <link>/api/publicationidentifier/25009370</link>
            <realUrl>https://doi.org/10.1109/THERMINIC60375.2023.10325898</realUrl>
            <idValue>10.1109/THERMINIC60375.2023.10325898</idValue>
            <otype>PublicationIdentifier</otype>
            <label>DOI: 10.1109/THERMINIC60375.2023.10325898</label>
            <source>
              <snippet>true</snippet>
              <mtid>6</mtid>
              <nameEng>DOI</nameEng>
              <linkPattern>https://doi.org/@@@</linkPattern>
              <link>/api/publicationsource/6</link>
              <name>DOI</name>
              <otype>PlainSource</otype>
              <label>DOI</label>
              <published>true</published>
              <type>
                <snippet>true</snippet>
                <mtid>10001</mtid>
                <link>/api/publicationsourcetype/10001</link>
                <otype>PublicationSourceType</otype>
                <label>DOI</label>
                <published>true</published>
                <mayHaveOa>true</mayHaveOa>
              </type>
              <oldId>6</oldId>
              <publiclyVisible>true</publiclyVisible>
            </source>
            <published>false</published>
          </identifier>
          <identifier>
            <snippet>true</snippet>
            <mtid>25011880</mtid>
            <link>/api/publicationidentifier/25011880</link>
            <realUrl>https://www.worldcat.org/search?q=isbn%3A9798350318623</realUrl>
            <idValue>9798350318623</idValue>
            <otype>PublicationIdentifier</otype>
            <label>ISBN: 9798350318623</label>
            <source>
              <snippet>true</snippet>
              <mtid>122</mtid>
              <nameEng>ISBN</nameEng>
              <linkPattern>https://www.worldcat.org/search?q=isbn%3A@@@</linkPattern>
              <link>/api/publicationsource/122</link>
              <name>ISBN</name>
              <otype>PlainSource</otype>
              <label>ISBN</label>
              <published>true</published>
              <type>
                <snippet>true</snippet>
                <mtid>10002</mtid>
                <link>/api/publicationsourcetype/10002</link>
                <otype>PublicationSourceType</otype>
                <label>Egyéb</label>
                <published>true</published>
                <mayHaveOa>false</mayHaveOa>
              </type>
              <oldId>122</oldId>
              <publiclyVisible>true</publiclyVisible>
            </source>
            <published>false</published>
          </identifier>
          <identifier>
            <snippet>true</snippet>
            <mtid>25009369</mtid>
            <validState>DIFFERENT</validState>
            <link>/api/publicationidentifier/25009369</link>
            <realUrl>http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=10325898</realUrl>
            <idValue>10325898</idValue>
            <otype>PublicationIdentifier</otype>
            <label>IEEE Xplore: 10325898</label>
            <source>
              <snippet>true</snippet>
              <mtid>22</mtid>
              <linkPattern>http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=@@@</linkPattern>
              <link>/api/publicationsource/22</link>
              <name>IEEE Xplore</name>
              <otype>PlainSource</otype>
              <label>IEEE Xplore</label>
              <published>true</published>
              <type>
                <snippet>true</snippet>
                <mtid>10004</mtid>
                <link>/api/publicationsourcetype/10004</link>
                <otype>PublicationSourceType</otype>
                <label>Kiadói adatbázis</label>
                <published>true</published>
                <mayHaveOa>false</mayHaveOa>
              </type>
              <oldId>22</oldId>
              <publiclyVisible>true</publiclyVisible>
            </source>
            <published>false</published>
          </identifier>
          <identifier>
            <snippet>true</snippet>
            <mtid>25136202</mtid>
            <link>/api/publicationidentifier/25136202</link>
            <realUrl>https://ieeexplore.ieee.org/document/10325898</realUrl>
            <idValue>https://ieeexplore.ieee.org/document/10325898</idValue>
            <otype>PublicationIdentifier</otype>
            <label>Egyéb URL: https://ieeexplore.ieee.org/document/10325898</label>
            <source>
              <snippet>true</snippet>
              <mtid>40</mtid>
              <nameEng>Other URL</nameEng>
              <linkPattern>@@@</linkPattern>
              <link>/api/publicationsource/40</link>
              <name>Egyéb URL</name>
              <otype>PlainSource</otype>
              <label>Egyéb URL</label>
              <published>true</published>
              <type>
                <snippet>true</snippet>
                <mtid>10006</mtid>
                <link>/api/publicationsourcetype/10006</link>
                <otype>PublicationSourceType</otype>
                <label>Link</label>
                <published>true</published>
                <mayHaveOa>true</mayHaveOa>
              </type>
              <oldId>40</oldId>
              <publiclyVisible>true</publiclyVisible>
            </source>
            <published>false</published>
          </identifier>
        </identifiers>
        <link>/api/publication/34401813</link>
        <label>Poppe András. Proceedings of the 29th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC'23). (2023) ISBN:9798350318623</label>
        <published>true</published>
        <type>
          <snippet>true</snippet>
          <mtid>23</mtid>
          <code>23</code>
          <link>/api/publicationtype/23</link>
          <otype>PublicationType</otype>
          <label>Könyv</label>
          <listPosition>3</listPosition>
          <published>true</published>
          <oldId>23</oldId>
          <otypeName>Book</otypeName>
        </type>
        <title>Proceedings of the 29th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC'23)</title>
        <publicationPending>false</publicationPending>
        <nationalOrigin>true</nationalOrigin>
        <mtid>34401813</mtid>
        <core>true</core>
        <duplumRole>SUSPECT</duplumRole>
        <foreignEdition>false</foreignEdition>
        <conferencePublication>true</conferencePublication>
        <foreignLanguage>true</foreignLanguage>
        <subType>
          <snippet>true</snippet>
          <mtid>10000144</mtid>
          <nameEng>Conference proceedings</nameEng>
          <docType>
            <snippet>true</snippet>
            <mtid>23</mtid>
            <code>23</code>
            <link>/api/publicationtype/23</link>
            <otype>PublicationType</otype>
            <label>Könyv</label>
            <listPosition>3</listPosition>
            <published>true</published>
            <oldId>23</oldId>
            <otypeName>Book</otypeName>
          </docType>
          <link>/api/subtype/10000144</link>
          <name>Konferenciakötet</name>
          <otype>SubType</otype>
          <label>Konferenciakötet (Könyv)</label>
          <listPosition>345</listPosition>
          <published>true</published>
          <oldId>10000144</oldId>
        </subType>
        <fullPublication>false</fullPublication>
        <otype>Book</otype>
        <publishedYear>2023</publishedYear>
        <category>
          <snippet>true</snippet>
          <mtid>1</mtid>
          <link>/api/category/1</link>
          <otype>Category</otype>
          <label>Tudományos</label>
          <published>true</published>
          <oldId>1</oldId>
        </category>
      </book>
      <hasQualityFactor>false</hasQualityFactor>
      <languages>
        <language>
          <otype>Language</otype>
          <mtid>10002</mtid>
          <link>/api/language/10002</link>
          <label>Angol</label>
          <name>Angol</name>
          <nameEng>English</nameEng>
          <published>true</published>
          <oldId>2</oldId>
          <snippet>true</snippet>
        </language>
      </languages>
      <authorships>
        <authorship>
          <otype>PersonAuthorship</otype>
          <mtid>113402326</mtid>
          <link>/api/authorship/113402326</link>
          <label>Poppe, A. ✉ [Poppe, András (Mikroelektronika), szerző] Elektronikus Eszközök Tanszéke (BME / VIK)</label>
          <listPosition>1</listPosition>
          <share>0.25</share>
          <first>true</first>
          <last>false</last>
          <corresponding>true</corresponding>
          <author>
            <otype>Author</otype>
            <mtid>10001242</mtid>
            <link>/api/author/10001242</link>
            <label>Poppe András (Mikroelektronika)</label>
            <familyName>Poppe</familyName>
            <givenName>András</givenName>
            <published>true</published>
            <oldId>10001242</oldId>
            <snippet>true</snippet>
          </author>
          <familyName>Poppe</familyName>
          <givenName>A.</givenName>
          <authorTyped>true</authorTyped>
          <editorTyped>false</editorTyped>
          <otherTyped>false</otherTyped>
          <type>
            <otype>AuthorshipType</otype>
            <mtid>1</mtid>
            <link>/api/authorshiptype/1</link>
            <label>Szerző</label>
            <code>0</code>
            <published>true</published>
            <oldId>0</oldId>
            <snippet>true</snippet>
          </type>
          <published>false</published>
          <snippet>true</snippet>
        </authorship>
        <authorship>
          <otype>PersonAuthorship</otype>
          <mtid>113402327</mtid>
          <link>/api/authorship/113402327</link>
          <label>Hantos, G. [Hantos, Gusztáv (mikroelektronika), szerző] Elektronikus Eszközök Tanszéke (BME / VIK)</label>
          <listPosition>2</listPosition>
          <share>0.25</share>
          <first>false</first>
          <last>false</last>
          <corresponding>false</corresponding>
          <author>
            <otype>Author</otype>
            <mtid>10042770</mtid>
            <link>/api/author/10042770</link>
            <label>Hantos Gusztáv (mikroelektronika)</label>
            <familyName>Hantos</familyName>
            <givenName>Gusztáv</givenName>
            <published>true</published>
            <oldId>10042770</oldId>
            <snippet>true</snippet>
          </author>
          <familyName>Hantos</familyName>
          <givenName>G.</givenName>
          <authorTyped>true</authorTyped>
          <editorTyped>false</editorTyped>
          <otherTyped>false</otherTyped>
          <type>
            <otype>AuthorshipType</otype>
            <mtid>1</mtid>
            <link>/api/authorshiptype/1</link>
            <label>Szerző</label>
            <code>0</code>
            <published>true</published>
            <oldId>0</oldId>
            <snippet>true</snippet>
          </type>
          <published>false</published>
          <snippet>true</snippet>
        </authorship>
        <authorship>
          <otype>PersonAuthorship</otype>
          <mtid>113402328</mtid>
          <link>/api/authorship/113402328</link>
          <label>Hegedus, J. [Hegedüs, János (LED modellezés), szerző] Elektronikus Eszközök Tanszéke (BME / VIK)</label>
          <listPosition>3</listPosition>
          <share>0.25</share>
          <first>false</first>
          <last>false</last>
          <corresponding>false</corresponding>
          <author>
            <otype>Author</otype>
            <mtid>10051374</mtid>
            <link>/api/author/10051374</link>
            <label>Hegedüs János (LED modellezés)</label>
            <familyName>Hegedüs</familyName>
            <givenName>János</givenName>
            <published>true</published>
            <oldId>10051374</oldId>
            <snippet>true</snippet>
          </author>
          <familyName>Hegedus</familyName>
          <givenName>J.</givenName>
          <authorTyped>true</authorTyped>
          <editorTyped>false</editorTyped>
          <otherTyped>false</otherTyped>
          <type>
            <otype>AuthorshipType</otype>
            <mtid>1</mtid>
            <link>/api/authorshiptype/1</link>
            <label>Szerző</label>
            <code>0</code>
            <published>true</published>
            <oldId>0</oldId>
            <snippet>true</snippet>
          </type>
          <published>false</published>
          <snippet>true</snippet>
        </authorship>
        <authorship>
          <otype>PersonAuthorship</otype>
          <mtid>113402329</mtid>
          <link>/api/authorship/113402329</link>
          <label>Ender, F. [Ender, Ferenc (Elektronikus eszk...), szerző] Elektronikus Eszközök Tanszéke (BME / VIK)</label>
          <listPosition>4</listPosition>
          <share>0.25</share>
          <first>false</first>
          <last>true</last>
          <corresponding>false</corresponding>
          <author>
            <otype>Author</otype>
            <mtid>10042119</mtid>
            <link>/api/author/10042119</link>
            <label>Ender Ferenc (Elektronikus eszközök)</label>
            <familyName>Ender</familyName>
            <givenName>Ferenc</givenName>
            <published>true</published>
            <oldId>10042119</oldId>
            <snippet>true</snippet>
          </author>
          <familyName>Ender</familyName>
          <givenName>F.</givenName>
          <authorTyped>true</authorTyped>
          <editorTyped>false</editorTyped>
          <otherTyped>false</otherTyped>
          <type>
            <otype>AuthorshipType</otype>
            <mtid>1</mtid>
            <link>/api/authorshiptype/1</link>
            <label>Szerző</label>
            <code>0</code>
            <published>true</published>
            <oldId>0</oldId>
            <snippet>true</snippet>
          </type>
          <published>false</published>
          <snippet>true</snippet>
        </authorship>
      </authorships>
      <identifiers>
        <identifier>
          <otype>PublicationIdentifier</otype>
          <mtid>25135800</mtid>
          <link>/api/publicationidentifier/25135800</link>
          <label>DOI: 10.1109/THERMINIC60375.2023.10325882</label>
          <source>
            <otype>PlainSource</otype>
            <mtid>6</mtid>
            <link>/api/publicationsource/6</link>
            <label>DOI</label>
            <type>
              <otype>PublicationSourceType</otype>
              <mtid>10001</mtid>
              <link>/api/publicationsourcetype/10001</link>
              <label>DOI</label>
              <mayHaveOa>true</mayHaveOa>
              <published>true</published>
              <snippet>true</snippet>
            </type>
            <name>DOI</name>
            <nameEng>DOI</nameEng>
            <linkPattern>https://doi.org/@@@</linkPattern>
            <publiclyVisible>true</publiclyVisible>
            <published>true</published>
            <oldId>6</oldId>
            <snippet>true</snippet>
          </source>
          <idValue>10.1109/THERMINIC60375.2023.10325882</idValue>
          <realUrl>https://doi.org/10.1109/THERMINIC60375.2023.10325882</realUrl>
          <published>false</published>
          <snippet>true</snippet>
        </identifier>
        <identifier>
          <otype>PublicationIdentifier</otype>
          <mtid>25009394</mtid>
          <link>/api/publicationidentifier/25009394</link>
          <label>IEEE Xplore: 10325882</label>
          <source>
            <otype>PlainSource</otype>
            <mtid>22</mtid>
            <link>/api/publicationsource/22</link>
            <label>IEEE Xplore</label>
            <type>
              <otype>PublicationSourceType</otype>
              <mtid>10004</mtid>
              <link>/api/publicationsourcetype/10004</link>
              <label>Kiadói adatbázis</label>
              <mayHaveOa>false</mayHaveOa>
              <published>true</published>
              <snippet>true</snippet>
            </type>
            <name>IEEE Xplore</name>
            <linkPattern>http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=@@@</linkPattern>
            <publiclyVisible>true</publiclyVisible>
            <published>true</published>
            <oldId>22</oldId>
            <snippet>true</snippet>
          </source>
          <validState>DIFFERENT</validState>
          <idValue>10325882</idValue>
          <realUrl>http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=10325882</realUrl>
          <published>false</published>
          <snippet>true</snippet>
        </identifier>
        <identifier>
          <otype>PublicationIdentifier</otype>
          <mtid>25873231</mtid>
          <link>/api/publicationidentifier/25873231</link>
          <label>WoS: 001108606800025</label>
          <source>
            <otype>PlainSource</otype>
            <mtid>1</mtid>
            <link>/api/publicationsource/1</link>
            <label>WoS</label>
            <type>
              <otype>PublicationSourceType</otype>
              <mtid>10003</mtid>
              <link>/api/publicationsourcetype/10003</link>
              <label>Indexelő adatbázis</label>
              <mayHaveOa>false</mayHaveOa>
              <published>true</published>
              <snippet>true</snippet>
            </type>
            <name>WoS</name>
            <nameEng>WoS</nameEng>
            <linkPattern>https://www.webofscience.com/wos/woscc/full-record/@@@</linkPattern>
            <publiclyVisible>true</publiclyVisible>
            <published>true</published>
            <oldId>1</oldId>
            <snippet>true</snippet>
          </source>
          <validState>IDENTICAL</validState>
          <idValue>001108606800025</idValue>
          <realUrl>https://www.webofscience.com/wos/woscc/full-record/001108606800025</realUrl>
          <published>false</published>
          <snippet>true</snippet>
        </identifier>
        <identifier>
          <otype>PublicationIdentifier</otype>
          <mtid>25135799</mtid>
          <link>/api/publicationidentifier/25135799</link>
          <label>Scopus: 85179623499</label>
          <source>
            <otype>PlainSource</otype>
            <mtid>3</mtid>
            <link>/api/publicationsource/3</link>
            <label>Scopus</label>
            <type>
              <otype>PublicationSourceType</otype>
              <mtid>10003</mtid>
              <link>/api/publicationsourcetype/10003</link>
              <label>Indexelő adatbázis</label>
              <mayHaveOa>false</mayHaveOa>
              <published>true</published>
              <snippet>true</snippet>
            </type>
            <name>Scopus</name>
            <nameEng>Scopus</nameEng>
            <linkPattern>http://www.scopus.com/record/display.url?origin=inward&amp;eid=2-s2.0-@@@</linkPattern>
            <publiclyVisible>true</publiclyVisible>
            <published>true</published>
            <oldId>3</oldId>
            <snippet>true</snippet>
          </source>
          <idValue>85179623499</idValue>
          <realUrl>http://www.scopus.com/record/display.url?origin=inward&amp;eid=2-s2.0-85179623499</realUrl>
          <published>false</published>
          <snippet>true</snippet>
        </identifier>
      </identifiers>
      <subjects>
        <classification>
          <otype>Classification</otype>
          <mtid>10807</mtid>
          <link>/api/classification/10807</link>
          <label>Műszaki és technológiai tudományok</label>
          <published>true</published>
          <snippet>true</snippet>
        </classification>
      </subjects>
      <keywords>
        <keyword>
          <otype>Keyword</otype>
          <mtid>9715</mtid>
          <link>/api/keyword/9715</link>
          <label>THERMODYNAMICS</label>
          <published>true</published>
          <oldId>9715</oldId>
          <snippet>true</snippet>
        </keyword>
        <keyword>
          <otype>Keyword</otype>
          <mtid>1056944</mtid>
          <link>/api/keyword/1056944</link>
          <label>Heat Transfer</label>
          <published>true</published>
          <oldId>1056944</oldId>
          <snippet>true</snippet>
        </keyword>
        <keyword>
          <otype>Keyword</otype>
          <mtid>1086606</mtid>
          <link>/api/keyword/1086606</link>
          <label>Heat resistance</label>
          <published>true</published>
          <oldId>1086606</oldId>
          <snippet>true</snippet>
        </keyword>
        <keyword>
          <otype>Keyword</otype>
          <mtid>1087991</mtid>
          <link>/api/keyword/1087991</link>
          <label>POWER SEMICONDUCTORS</label>
          <published>true</published>
          <oldId>1087991</oldId>
          <snippet>true</snippet>
        </keyword>
        <keyword>
          <otype>Keyword</otype>
          <mtid>1089382</mtid>
          <link>/api/keyword/1089382</link>
          <label>Light emitting diodes</label>
          <published>true</published>
          <oldId>1089382</oldId>
          <snippet>true</snippet>
        </keyword>
        <keyword>
          <otype>Keyword</otype>
          <mtid>1172542</mtid>
          <link>/api/keyword/1172542</link>
          <label>Thermography (temperature measurement)</label>
          <published>true</published>
          <oldId>1172542</oldId>
          <snippet>true</snippet>
        </keyword>
        <keyword>
          <otype>Keyword</otype>
          <mtid>1319355</mtid>
          <link>/api/keyword/1319355</link>
          <label>Compact thermal models</label>
          <published>true</published>
          <oldId>1319355</oldId>
          <snippet>true</snippet>
        </keyword>
        <keyword>
          <otype>Keyword</otype>
          <mtid>1320980</mtid>
          <link>/api/keyword/1320980</link>
          <label>junction temperature</label>
          <published>true</published>
          <oldId>1320980</oldId>
          <snippet>true</snippet>
        </keyword>
        <keyword>
          <otype>Keyword</otype>
          <mtid>1392751</mtid>
          <link>/api/keyword/1392751</link>
          <label>POWER LEDS</label>
          <published>true</published>
          <oldId>1392751</oldId>
          <snippet>true</snippet>
        </keyword>
        <keyword>
          <otype>Keyword</otype>
          <mtid>1493582</mtid>
          <link>/api/keyword/1493582</link>
          <label>Engineering, Electrical &amp; Electronic</label>
          <published>true</published>
          <snippet>true</snippet>
        </keyword>
        <keyword>
          <otype>Keyword</otype>
          <mtid>1691065</mtid>
          <link>/api/keyword/1691065</link>
          <label>power semiconductor</label>
          <published>true</published>
          <snippet>true</snippet>
        </keyword>
        <keyword>
          <otype>Keyword</otype>
          <mtid>1724539</mtid>
          <link>/api/keyword/1724539</link>
          <label>Equipment testing</label>
          <published>true</published>
          <snippet>true</snippet>
        </keyword>
        <keyword>
          <otype>Keyword</otype>
          <mtid>1768672</mtid>
          <link>/api/keyword/1768672</link>
          <label>Automated methods</label>
          <published>true</published>
          <snippet>true</snippet>
        </keyword>
        <keyword>
          <otype>Keyword</otype>
          <mtid>2064061</mtid>
          <link>/api/keyword/2064061</link>
          <label>Compact thermal models (CTMs)</label>
          <published>true</published>
          <snippet>true</snippet>
        </keyword>
        <keyword>
          <otype>Keyword</otype>
          <mtid>2529580</mtid>
          <link>/api/keyword/2529580</link>
          <label>Power MOSFET</label>
          <published>true</published>
          <snippet>true</snippet>
        </keyword>
        <keyword>
          <otype>Keyword</otype>
          <mtid>2529706</mtid>
          <link>/api/keyword/2529706</link>
          <label>Power semiconductor device</label>
          <published>true</published>
          <snippet>true</snippet>
        </keyword>
        <keyword>
          <otype>Keyword</otype>
          <mtid>2539304</mtid>
          <link>/api/keyword/2539304</link>
          <label>Power electronic components</label>
          <published>true</published>
          <snippet>true</snippet>
        </keyword>
        <keyword>
          <otype>Keyword</otype>
          <mtid>3154704</mtid>
          <link>/api/keyword/3154704</link>
          <label>lifetime prognostics</label>
          <published>true</published>
          <snippet>true</snippet>
        </keyword>
        <keyword>
          <otype>Keyword</otype>
          <mtid>3266586</mtid>
          <link>/api/keyword/3266586</link>
          <label>power LED</label>
          <published>true</published>
          <snippet>true</snippet>
        </keyword>
        <keyword>
          <otype>Keyword</otype>
          <mtid>3266587</mtid>
          <link>/api/keyword/3266587</link>
          <label>Die-attach</label>
          <published>true</published>
          <snippet>true</snippet>
        </keyword>
        <keyword>
          <otype>Keyword</otype>
          <mtid>3266588</mtid>
          <link>/api/keyword/3266588</link>
          <label>Heat flow path</label>
          <published>true</published>
          <snippet>true</snippet>
        </keyword>
        <keyword>
          <otype>Keyword</otype>
          <mtid>3266589</mtid>
          <link>/api/keyword/3266589</link>
          <label>Lifetime prognostic</label>
          <published>true</published>
          <snippet>true</snippet>
        </keyword>
        <keyword>
          <otype>Keyword</otype>
          <mtid>3266590</mtid>
          <link>/api/keyword/3266590</link>
          <label>package compact thermal model</label>
          <published>true</published>
          <snippet>true</snippet>
        </keyword>
        <keyword>
          <otype>Keyword</otype>
          <mtid>3266592</mtid>
          <link>/api/keyword/3266592</link>
          <label>Thermal interfaces</label>
          <published>true</published>
          <snippet>true</snippet>
        </keyword>
      </keywords>
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          <snippet>true</snippet>
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          <snippet>true</snippet>
        </reference>
        <reference>
          <otype>Reference</otype>
          <mtid>48208914</mtid>
          <link>/api/reference/48208914</link>
          <label>25. Elger, G., Kandaswamy, S.V., Liu, E., Hanss, A., Schmid, M., Derix, R., Conti, F., Analysis of solder joint reliability of high power LEDs by transient thermal testing and transient finite element simulations (2015) Microelectronics Journal, 46 (12), pp. 1230-1238</label>
          <listPosition>25</listPosition>
          <published>false</published>
          <snippet>true</snippet>
        </reference>
        <reference>
          <otype>Reference</otype>
          <mtid>48208915</mtid>
          <link>/api/reference/48208915</link>
          <label>26. Liu, E., Hanss, A., Schmid, M., Elger, G., The Influence of Phosphor Layer and Sidecoating on the Thermal Performance and the Structure Function of Modern Waver Level High Power LEDs (2015) Proceedings of THERMINIC, , September-October 2015, Paris, France</label>
          <listPosition>26</listPosition>
          <published>false</published>
          <snippet>true</snippet>
        </reference>
        <reference>
          <otype>Reference</otype>
          <mtid>48208916</mtid>
          <link>/api/reference/48208916</link>
          <label>27. Elger, G., Möller, D., Hanss, A., Schmid, M., Liu, E., Karbowski, U., Derix, R., Transient thermal analysis for accelerated reliability testing of LEDs (2016) Microelectronics Reliability, 64 (9), pp. 605-609</label>
          <listPosition>27</listPosition>
          <published>false</published>
          <snippet>true</snippet>
        </reference>
        <reference>
          <otype>Reference</otype>
          <mtid>48208917</mtid>
          <link>/api/reference/48208917</link>
          <label>28. Hanss, A., Liu, E., Abdullah, M.R., Elger, G., Failure Identification in LED packages by Transient Thermal Analysis and Calibrated FE Models (2019) Proceedings of EurosimE, , 24-27 March 2019</label>
          <listPosition>28</listPosition>
          <published>false</published>
          <snippet>true</snippet>
        </reference>
      </references>
      <link>/api/publication/34448277</link>
      <label>Poppe A. et al. An Automated Method for Creating Compact Dynamic Thermal Models for In-situ Prognostics of Power Electronics and Power LED Packages. (2023) Megjelent: Proceedings of the 29th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC'23)</label><template>&lt;div class=&quot;BookChapter Publication short-list&quot;&gt; &lt;div class=&quot;authors&quot;&gt; &lt;span class=&quot;author-name&quot; mtid=&quot;10001242&quot;&gt; &lt;a href=&quot;/gui2/?type=authors&amp;mode=browse&amp;sel=10001242&quot; target=&quot;_blank&quot;&gt;Poppe, A. ✉&lt;/a&gt; &lt;/span&gt; &lt;span class=&quot;author-type&quot;&gt; &lt;/span&gt; ; &lt;span class=&quot;author-name&quot; mtid=&quot;10042770&quot;&gt; &lt;a href=&quot;/gui2/?type=authors&amp;mode=browse&amp;sel=10042770&quot; target=&quot;_blank&quot;&gt;Hantos, G.&lt;/a&gt; &lt;/span&gt; &lt;span class=&quot;author-type&quot;&gt; &lt;/span&gt; ; &lt;span class=&quot;author-name&quot; mtid=&quot;10051374&quot;&gt; &lt;a href=&quot;/gui2/?type=authors&amp;mode=browse&amp;sel=10051374&quot; target=&quot;_blank&quot;&gt;Hegedus, J.&lt;/a&gt; &lt;/span&gt; &lt;span class=&quot;author-type&quot;&gt; &lt;/span&gt; ; &lt;span class=&quot;author-name&quot; mtid=&quot;10042119&quot;&gt; &lt;a href=&quot;/gui2/?type=authors&amp;mode=browse&amp;sel=10042119&quot; target=&quot;_blank&quot;&gt;Ender, F.&lt;/a&gt; &lt;/span&gt; &lt;span class=&quot;author-type&quot;&gt; &lt;/span&gt; &lt;/div &gt;&lt;div class=&quot;title&quot;&gt;&lt;a href=&quot;/gui2/?mode=browse&amp;params=publication;34448277&quot; mtid=&quot;34448277&quot; target=&quot;_blank&quot;&gt;An Automated Method for Creating Compact Dynamic Thermal Models for In-situ Prognostics of Power Electronics and Power LED Packages&lt;/a&gt;&lt;/div&gt; &lt;div class=&quot;InBook&quot;&gt;In: Poppe, András (szerk.) &lt;span class=&quot;booktitle&quot;&gt;&lt;a href=&quot;/gui2/?mode=browse&amp;params=publication;34401813&quot; target=&quot;_blank&quot;&gt;Proceedings of the 29th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC&apos;23) &lt;/a&gt;&lt;/span &gt; &lt;/div&gt;&lt;div class=&quot;pub-info&quot;&gt; &lt;span class=&quot;publishedAt&quot;&gt;Budapest, Magyarország : &lt;span class=&quot;publisher&quot;&gt;Institute of Electrical and Electronics Engineers (IEEE)&lt;/span&gt; &lt;span class=&quot;year&quot;&gt;(2023)&lt;/span&gt; &lt;span class=&quot;page&quot;&gt; Paper: 10325882 , 7 p. &lt;/span&gt; &lt;/div&gt; &lt;div class=&quot;pub-end&quot;&gt;&lt;div class=&quot;identifier-list&quot;&gt; &lt;span class=&quot;identifiers&quot;&gt; &lt;span class=&quot;id identifier oa_none&quot; title=&quot;none&quot;&gt; &lt;a style=&quot;color:black&quot; title=&quot;10.1109/THERMINIC60375.2023.10325882&quot; target=&quot;_blank&quot; href=&quot;https://doi.org/10.1109/THERMINIC60375.2023.10325882&quot;&gt; DOI &lt;/a&gt; &lt;/span&gt; &lt;span class=&quot;id identifier oa_none&quot; title=&quot;none&quot;&gt; &lt;a style=&quot;color:blue&quot; title=&quot;10325882&quot; target=&quot;_blank&quot; href=&quot;http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=10325882&quot;&gt; IEEE Xplore &lt;/a&gt; &lt;/span&gt; &lt;span class=&quot;id identifier oa_none&quot; title=&quot;none&quot;&gt; &lt;a style=&quot;color:blue&quot; title=&quot;001108606800025&quot; target=&quot;_blank&quot; href=&quot;https://www.webofscience.com/wos/woscc/full-record/001108606800025&quot;&gt; WoS &lt;/a&gt; &lt;/span&gt; &lt;span class=&quot;id identifier oa_none&quot; title=&quot;none&quot;&gt; &lt;a style=&quot;color:black&quot; title=&quot;85179623499&quot; target=&quot;_blank&quot; href=&quot;http://www.scopus.com/record/display.url?origin=inward&amp;eid=2-s2.0-85179623499&quot;&gt; Scopus &lt;/a&gt; &lt;/span&gt; &lt;/span&gt; &lt;/div&gt; &lt;div class=&quot;short-pub-prop-list&quot;&gt; &lt;span class=&quot;short-pub-mtid&quot;&gt; Közlemény:34448277 &lt;/span&gt; &lt;span class=&quot;status-holder&quot;&gt;&lt;span class=&quot;status-data status-APPROVED&quot;&gt; Nyilvános &lt;/span&gt;&lt;/span&gt; &lt;span class=&quot;pub-core&quot;&gt;Forrás Idéző &lt;/span&gt; &lt;span class=&quot;pub-type&quot;&gt;Könyvrészlet (Konferenciaközlemény ) &lt;/span&gt; &lt;!-- &amp;&amp; !record.category.scientific --&gt; &lt;span class=&quot;pub-category&quot;&gt;Tudományos&lt;/span&gt; &lt;/div&gt; &lt;/div&gt; &lt;/div&gt;</template><template2>&lt;div class=&quot;BookChapter Publication long-list&quot;&gt;
&lt;div class=&quot;authors&quot;&gt;
	&lt;img title=&quot;Forrásközlemény&quot; style=&quot;float: left&quot; src=&quot;/frontend/resources/grid/publication-core-icon.png&quot;&gt;
	&lt;img title=&quot;Idézőközlemény&quot; style=&quot;float: left&quot; src=&quot;/frontend/resources/grid/publication-citation-icon.png&quot;&gt;

		&lt;div class=&quot;autype autype0&quot;&gt;				&lt;span class=&quot;author-name&quot; mtid=&quot;10001242&quot;&gt;&lt;a 
																				   href=&quot;/gui2/?type=authors&amp;mode=browse&amp;sel=10001242&quot; target=&quot;_blank&quot;&gt;Poppe A. ✉
            (&lt;span class=&quot;authorship-author-name&quot;&gt;Poppe András&lt;/span&gt;
            &lt;span class=&quot;authorAux-mtmt&quot;&gt; Mikroelektronika&lt;/span&gt;)
			&lt;/a&gt;
    &lt;/span&gt;
&lt;span class=&quot;author-affil&quot;&gt;&lt;span title=&quot;Budapesti Műszaki és Gazdaságtudományi Egyetem&quot;&gt;BME&lt;/span&gt;/&lt;span title=&quot;Villamosmérnöki és Informatikai Kar&quot;&gt;VIK&lt;/span&gt;/Elektronikus Eszközök Tanszéke&lt;/span&gt;
;&amp;nbsp;&amp;nbsp;&amp;nbsp;
							&lt;span class=&quot;author-name&quot; mtid=&quot;10042770&quot;&gt;&lt;a 
																				   href=&quot;/gui2/?type=authors&amp;mode=browse&amp;sel=10042770&quot; target=&quot;_blank&quot;&gt;Hantos G.
            (&lt;span class=&quot;authorship-author-name&quot;&gt;Hantos Gusztáv&lt;/span&gt;
            &lt;span class=&quot;authorAux-mtmt&quot;&gt; mikroelektronika&lt;/span&gt;)
			&lt;/a&gt;
    &lt;/span&gt;
&lt;span class=&quot;author-affil&quot;&gt;&lt;span title=&quot;Budapesti Műszaki és Gazdaságtudományi Egyetem&quot;&gt;BME&lt;/span&gt;/&lt;span title=&quot;Villamosmérnöki és Informatikai Kar&quot;&gt;VIK&lt;/span&gt;/Elektronikus Eszközök Tanszéke&lt;/span&gt;
;&amp;nbsp;&amp;nbsp;&amp;nbsp;
							&lt;span class=&quot;author-name&quot; mtid=&quot;10051374&quot;&gt;&lt;a 
																				   href=&quot;/gui2/?type=authors&amp;mode=browse&amp;sel=10051374&quot; target=&quot;_blank&quot;&gt;Hegedus J.
            (&lt;span class=&quot;authorship-author-name&quot;&gt;Hegedüs János&lt;/span&gt;
            &lt;span class=&quot;authorAux-mtmt&quot;&gt; LED modellezés&lt;/span&gt;)
			&lt;/a&gt;
    &lt;/span&gt;
&lt;span class=&quot;author-affil&quot;&gt;&lt;span title=&quot;Budapesti Műszaki és Gazdaságtudományi Egyetem&quot;&gt;BME&lt;/span&gt;/&lt;span title=&quot;Villamosmérnöki és Informatikai Kar&quot;&gt;VIK&lt;/span&gt;/Elektronikus Eszközök Tanszéke&lt;/span&gt;
;&amp;nbsp;&amp;nbsp;&amp;nbsp;
							&lt;span class=&quot;author-name&quot; mtid=&quot;10042119&quot;&gt;&lt;a 
																				   href=&quot;/gui2/?type=authors&amp;mode=browse&amp;sel=10042119&quot; target=&quot;_blank&quot;&gt;Ender F.
            (&lt;span class=&quot;authorship-author-name&quot;&gt;Ender Ferenc&lt;/span&gt;
            &lt;span class=&quot;authorAux-mtmt&quot;&gt; Elektronikus eszközök&lt;/span&gt;)
			&lt;/a&gt;
    &lt;/span&gt;
&lt;span class=&quot;author-affil&quot;&gt;&lt;span title=&quot;Budapesti Műszaki és Gazdaságtudományi Egyetem&quot;&gt;BME&lt;/span&gt;/&lt;span title=&quot;Villamosmérnöki és Informatikai Kar&quot;&gt;VIK&lt;/span&gt;/Elektronikus Eszközök Tanszéke&lt;/span&gt;

				    &lt;/div&gt;
&lt;/div&gt;
&lt;div class=&quot;title&quot;&gt;&lt;a href=&quot;/gui2/?mode=browse&amp;params=publication;34448277&quot; target=&quot;_blank&quot;&gt;An Automated Method for Creating Compact Dynamic Thermal Models for In-situ Prognostics of Power Electronics and Power LED Packages&lt;/a&gt;&lt;/div&gt;    &lt;div class=&quot;InBook&quot;&gt;&lt;div class=&quot;chapter-in&quot;&gt;In:&lt;/div&gt;         &lt;div class=&quot;authors&quot;&gt;

		&lt;div class=&quot;autype autype-1&quot;&gt;				&lt;span class=&quot;author-name&quot; mtid=&quot;10001242&quot;&gt;&lt;a 
																				   href=&quot;/gui2/?type=authors&amp;mode=browse&amp;sel=10001242&quot; target=&quot;_blank&quot;&gt;Poppe András
            (&lt;span class=&quot;authorship-author-name&quot;&gt;Poppe András&lt;/span&gt;
            &lt;span class=&quot;authorAux-mtmt&quot;&gt; Mikroelektronika&lt;/span&gt;)
			&lt;/a&gt;
    &lt;/span&gt;
&lt;span class=&quot;author-affil&quot;&gt;&lt;span title=&quot;Budapesti Műszaki és Gazdaságtudományi Egyetem&quot;&gt;BME&lt;/span&gt;/&lt;span title=&quot;Villamosmérnöki és Informatikai Kar&quot;&gt;VIK&lt;/span&gt;/Elektronikus Eszközök Tanszéke&lt;/span&gt;

			(szerk.)	    &lt;/div&gt;
        &lt;/div&gt;
        &lt;div class=&quot;booktitle&quot;&gt;&lt;a href=&quot;/gui2/?mode=browse&amp;params=publication;34401813&quot; target=&quot;_blank&quot;&gt;Proceedings of the 29th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC&apos;23) &lt;/a&gt;&lt;/div&gt;
&lt;div class=&quot;conference&quot;&gt;
	
	Konferencia helye, ideje: 
    &lt;span class=&quot;location&quot;&gt;Budapest, Magyarország
        &lt;span class=&quot;conference-date&quot;&gt;2023.09.27.
             - 
            2023.09.29.&lt;/span&gt;
    
&lt;/div&gt;        
         &lt;span class=&quot;publishedAt&quot;&gt;Budapest: 
            &lt;span class=&quot;publishers&quot;&gt;Institute of Electrical and Electronics Engineers (IEEE)&lt;/span&gt;,
&lt;span class=&quot;page&quot;&gt;
		Paper 10325882.
	 7 p. 
&lt;/span&gt;         &lt;span class=&quot;year&quot;&gt;(2023)&lt;/span&gt;  
    &lt;/div&gt;
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	&lt;span class=&quot;language&quot; xmlns=&quot;http://www.w3.org/1999/html&quot;&gt;Nyelv:
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							&lt;a style=&quot;color:black&quot; title=&quot;10.1109/THERMINIC60375.2023.10325882&quot; target=&quot;_blank&quot; href=&quot;https://doi.org/10.1109/THERMINIC60375.2023.10325882&quot;&gt;
									DOI
							&lt;/a&gt;
						&lt;/span&gt;
						&lt;span class=&quot;id identifier oa_none&quot; title=&quot;none&quot;&gt;
							
							&lt;a style=&quot;color:blue&quot; title=&quot;10325882&quot; target=&quot;_blank&quot; href=&quot;http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=10325882&quot;&gt;
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							&lt;/a&gt;
						&lt;/span&gt;
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							&lt;a style=&quot;color:blue&quot; title=&quot;10325898&quot; target=&quot;_blank&quot; href=&quot;http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=10325898&quot;&gt;
									IEEE Xplore
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						&lt;/span&gt;
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									Egyéb URL
							&lt;/a&gt;
						&lt;/span&gt;
	&lt;/span&gt;




    
    
	&lt;div class=&quot;publication-citation&quot;&gt;
		&lt;a target=&quot;_blank&quot; href=&quot;/api/publication?cond=citations.related;eq;34448277&amp;sort=publishedYear,desc&amp;sort=title&quot;&gt;
			Idézett közlemények száma: 9
		&lt;/a&gt;
	&lt;/div&gt;



    &lt;div class=&quot;mtid&quot;&gt;&lt;span class=&quot;long-pub-mtid&quot;&gt;Közlemény: 34448277&lt;/span&gt;
    | &lt;span class=&quot;status-data status-APPROVED&quot;&gt; 	Nyilvános
  &lt;/span&gt;
        &lt;span class=&quot;long-book-mtid&quot;&gt;Befoglaló: 34401813&lt;/span&gt;
	
	
Forrás	 Idéző
	
	
    | &lt;span class=&quot;type-subtype&quot;&gt;Könyvrészlet
			( Konferenciaközlemény
			
			)
		&lt;/span&gt;
      		| &lt;span class=&quot;pub-category&quot;&gt;Tudományos&lt;/span&gt;
	| &lt;span class=&quot;publication-sourceOfData&quot;&gt;Scopus&lt;/span&gt;
&lt;/div&gt;

&lt;div class=&quot;funder&quot;&gt; AI-TWILIGHT(H2020 ECSEL RIA 101007319) Támogató: ECSEL,    AI-TWILIGHT_NEMZ(2019-2.1.3-NEMZ_ECSEL-2021-00008) Támogató: NKFIH,    LED-REL(K 128315) Támogató: NKFIH,    PowerizeD KDT EU(PowerizeD Horizone Europe KDT 101096387 project) Támogató: Horizone Europe,    PowerizeD NEMZ(2022-1.2.8-KDT-2022-00001) Támogató: NKFIH   &lt;/div&gt;
&lt;div class=&quot;lastModified&quot;&gt;Utolsó módosítás: 2024.03.14. 16:03 Szatmári Erika (BME admin4)
&lt;/div&gt;




	&lt;pre class=&quot;comment&quot; style=&quot;margin-top: 0; margin-bottom: 0;&quot;&gt;&lt;u&gt;Megjegyzés&lt;/u&gt;: Conference code: 194796            
            Export Date: 22 December 2023            
            Correspondence Address: Poppe, A.; Budapest University of Technology and Economics, Hungary; email: poppe.andras@vik.bme.hu
Funding Agency and Grant Number: European Union [101007319]; Hungarian government of the National Research, Development and Innovation Fund [2019-2.1.3-NEMZ_ECSEL-2021-000...&lt;/pre&gt;
&lt;/div&gt;
&lt;/div&gt;</template2>
    </publication>
  </content>
</myciteResult>
