https://m2.mtmt.hu/ hun 2026-04-29 22:06 BookChapter 34448273 ADMIN_APPROVED true Budapest University of Technology and Economics, Hungary Siemens Digital Industry Software, Budapest, Hungary Conference code: 194796 Export Date: 22 December 2023 Correspondence Address: Ress, S.; Budapest University of Technology and EconomicsHungary; email: sandor.ress@vik.bme.hu 0 false 2026-01-01T05:58:08.298+0000 2024-03-14T14:56:07.643+0000 2023-12-22T09:21:02.737+0000 true 10071696 Andódy Katalin /api/admin/10071696 Admin true 2024-03-14T14:56:08.560+0000 2024-03-14T14:56:08.560+0000 2023-12-22T11:57:01.833+0000 true 10071696 Andódy Katalin /api/admin/10071696 Admin true true false true 25 25 /api/publicationtype/25 PublicationType 2 true 25 BookChapter true 10000312 Conference paper true 25 25 /api/publicationtype/25 PublicationType 2 true 25 BookChapter /api/subtype/10000312 Konferenciaközlemény SubType 228 true 10000312 true 1 /api/category/1 Category true 1 Ress, S. Thermal Transient Tests with Programmed Powering on Wide Bandgap Power Devices of Non-Monotonous and Time-Variant Characteristics 10325869 10325869 8 2023 Thermal transient testing of semiconductor devices needs a well-defined power level for heating and proper data acquisition for recording the change of a thermally sensitive device parameter. While the latter is fully solved by up-to-date thermal testers, power level setting is typically limited to forcing varying current levels on two pin devices, such as diodes. Other proposed methods need trials for setting the power and have poor stability.The paper presents a methodology for applying power in various test arrangements, on devices with three pins such as MOSFETs, IGBTs, BJTs and HEMTs. A simple analog circuitry is proposed which ensures thermally and electrically stable powering and an exact operating voltage and current.Several simulation and measurement experiments prove that a novel solution based on fast drain-source voltage change at constant current ensures optimal powering in reliability tests and short electric distortion in transient tests. © 2023 IEEE. 2023 false true true true true false NONE 2026-01-01 false 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 2 2 false 10041004 false false false 2023-12-21T11:57:01.580+0000 Elektronikus Eszközök Tanszéke (BME / VIK) 4 8 1 4 0 true true 10002 English /api/language/10002 Angol Language true 2 false true 10003 true 10001 /api/country/10001 Country true 1 /api/city/10003 City true 10005024 true 25009370 DIFFERENT /api/publicationidentifier/25009370 https://doi.org/10.1109/THERMINIC60375.2023.10325898 10.1109/THERMINIC60375.2023.10325898 PublicationIdentifier true 6 DOI https://doi.org/@@@ /api/publicationsource/6 DOI 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Keyword 1669206 /api/keyword/1669206 true true Keyword 2174708 /api/keyword/2174708 true true Keyword 2381718 /api/keyword/2381718 true true Keyword 2529580 /api/keyword/2529580 true true Keyword 2576819 /api/keyword/2576819 true true Keyword 2733804 /api/keyword/2733804 true true Keyword 3266574 /api/keyword/3266574 true true Keyword 3266575 /api/keyword/3266575 true true Reference 48208831 /api/reference/48208831 1 false true Reference 48208832 /api/reference/48208832 2 false true Reference 48208833 /api/reference/48208833 3 false true Reference 48208834 /api/reference/48208834 4 false true Reference 48208835 /api/reference/48208835 5 false true Reference 48208836 /api/reference/48208836 6 false true Reference 48208837 /api/reference/48208837 7 false true Reference 48208838 /api/reference/48208838 8 false true Reference 48208839 /api/reference/48208839 9 false true /api/publication/34448273 <div class="BookChapter Publication long-list"> <div class="authors"> <img title="Forrásközlemény" style="float: left" src="/frontend/resources/grid/publication-core-icon.png"> <img title="Idézőközlemény" style="float: left" src="/frontend/resources/grid/publication-citation-icon.png"> <div class="autype autype0"> <span class="author-name" mtid="10041004"><a href="/gui2/?type=authors&mode=browse&sel=10041004" target="_blank">Ress S. ✉ (<span class="authorship-author-name">Ress Sándor László</span> <span class="authorAux-mtmt"> Elektronikus Eszközök</span>) </a> </span> <span class="author-affil"><span title="Budapesti Műszaki és Gazdaságtudományi Egyetem">BME</span>/<span title="Villamosmérnöki és Informatikai Kar">VIK</span>/Elektronikus Eszközök Tanszéke</span> ;&nbsp;&nbsp;&nbsp; <span class="author-name" mtid="10042699"><a href="/gui2/?type=authors&mode=browse&sel=10042699" target="_blank">Sarkany Z. (<span class="authorship-author-name">Sárkány Zoltán</span> <span class="authorAux-mtmt"> mikroelektronika, termikus tesztelés</span>) </a> </span> ;&nbsp;&nbsp;&nbsp; <span class="author-name" mtid="10010863"><a href="/gui2/?type=authors&mode=browse&sel=10010863" target="_blank">Rencz M. (<span class="authorship-author-name">Kerecsen Istvánné Rencz Márta</span> <span class="authorAux-mtmt"> Mikroelektronika</span>) </a> </span> <span class="author-affil"><span title="Budapesti Műszaki és Gazdaságtudományi Egyetem">BME</span>/<span title="Villamosmérnöki és Informatikai Kar">VIK</span>/Elektronikus Eszközök Tanszéke</span> ;&nbsp;&nbsp;&nbsp; <span class="author-name" mtid="10041313"><a href="/gui2/?type=authors&mode=browse&sel=10041313" target="_blank">Farkas G. (<span class="authorship-author-name">Farkas Gábor</span> <span class="authorAux-mtmt"> Elektronikus eszközök</span>) </a> </span> </div> </div> <div class="title"><a href="/gui2/?mode=browse&params=publication;34448273" target="_blank">Thermal Transient Tests with Programmed Powering on Wide Bandgap Power Devices of Non-Monotonous and Time-Variant Characteristics</a></div> <div class="InBook"><div class="chapter-in">In:</div> <div class="authors"> <div class="autype autype-1"> <span class="author-name" mtid="10001242"><a href="/gui2/?type=authors&mode=browse&sel=10001242" target="_blank">Poppe András (<span class="authorship-author-name">Poppe András</span> <span class="authorAux-mtmt"> Mikroelektronika</span>) </a> </span> <span class="author-affil"><span title="Budapesti Műszaki és Gazdaságtudományi Egyetem">BME</span>/<span title="Villamosmérnöki és Informatikai Kar">VIK</span>/Elektronikus Eszközök Tanszéke</span> (szerk.) </div> </div> <div class="booktitle"><a href="/gui2/?mode=browse&params=publication;34401813" target="_blank">Proceedings of the 29th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC'23) </a></div> <div class="conference"> Konferencia helye, ideje: <span class="location">Budapest, Magyarország <span class="conference-date">2023.09.27. - 2023.09.29.</span> </div> <span class="publishedAt">Budapest: <span class="publishers">Institute of Electrical and Electronics Engineers (IEEE)</span>, <span class="page"> Paper 10325869. 8 p. </span> <span class="year">(2023)</span> </div> <div class="pub-footer"> <span class="language" xmlns="http://www.w3.org/1999/html">Nyelv: Angol | </span> <span class="identifiers"> <span class="id identifier oa_none" title="none"> <a style="color:black" title="10.1109/THERMINIC60375.2023.10325869" target="_blank" href="https://doi.org/10.1109/THERMINIC60375.2023.10325869"> DOI </a> </span> <span class="id identifier oa_none" title="none"> <a style="color:blue" title="10325869" target="_blank" href="http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=10325869"> IEEE Xplore </a> </span> <span class="id identifier oa_none" title="none"> <a style="color:blue" title="001108606800012" target="_blank" href="https://www.webofscience.com/wos/woscc/full-record/001108606800012"> WoS </a> </span> <span class="id identifier oa_none" title="none"> <a style="color:black" title="85179625571" target="_blank" href="http://www.scopus.com/record/display.url?origin=inward&eid=2-s2.0-85179625571"> Scopus </a> </span> </span> <span class="bookchapter-ids">Befoglaló link(ek):</span> <span class="identifiers"> <span class="id identifier oa_none" title="none"> <a style="color:blue" title="10.1109/THERMINIC60375.2023.10325898" target="_blank" href="https://doi.org/10.1109/THERMINIC60375.2023.10325898"> DOI </a> </span> <span class="id identifier oa_none" title="none"> <span class="isbnOrIssn"> ISBN: </span> <a style="color:black" title="9798350318623" target="_blank" href="https://www.worldcat.org/search?q=isbn%3A9798350318623"> 9798350318623 </a> </span> <span class="id identifier oa_none" title="none"> <a style="color:blue" title="10325898" target="_blank" href="http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=10325898"> IEEE Xplore </a> </span> <span class="id identifier oa_none" title="none"> <a style="color:black" title="https://ieeexplore.ieee.org/document/10325898" target="_blank" href="https://ieeexplore.ieee.org/document/10325898"> Egyéb URL </a> </span> </span> <div class="publication-citation"> <a target="_blank" href="/api/publication?cond=citations.related;eq;34448273&sort=publishedYear,desc&sort=title"> Idézett közlemények száma: 2 </a> </div> <div class="mtid"><span class="long-pub-mtid">Közlemény: 34448273</span> | <span class="status-data status-ADMIN_APPROVED"> Admin láttamozott </span> <span class="long-book-mtid">Befoglaló: 34401813</span> Forrás Idéző | <span class="type-subtype">Könyvrészlet ( Konferenciaközlemény ) </span> | <span class="pub-category">Tudományos</span> | <span class="publication-sourceOfData">Scopus</span> </div> <div class="lastModified">Utolsó módosítás: 2024.03.14. 15:56 Szatmári Erika (BME admin4) </div> <pre class="comment" style="margin-top: 0; margin-bottom: 0;"><u>Megjegyzés</u>: Budapest University of Technology and Economics, Hungary Siemens Digital Industry Software, Budapest, Hungary Conference code: 194796 Export Date: 22 December 2023 Correspondence Address: Ress, S.; Budapest University of Technology and EconomicsHungary; email: sandor.ress@vik.bme.hu</pre> </div> </div>