Percutaneous Superimposed O-Arm-MRI-Navigated Biopsy for Spinal Column Pathologies

Al-Smadi, M.W. [Al-Smadi, Mohammad Walid (Idegsebészet), szerző] Sebészeti Műtéttani Tanszék (DE / ÁOK); Dr. Manninger Jenő Baleseti Központ; Kozma, I.; Aslan, S. [Aslan, Siran (Radiological and ...), szerző] Traumatológiai Tanszék (SE / AOK / K); Bölöni, B.; Viola, Á. ✉ [Viola, Árpád (Idegsebészet), szerző] Traumatológiai Tanszék (SE / AOK / K); Dr. Manninger Jenő Baleseti Központ

Angol nyelvű Szakcikk (Folyóiratcikk) Tudományos
Megjelent: DIAGNOSTICS 2075-4418 2075-4418 13 (13) Paper: 2252 , 9 p. 2023
  • SJR Scopus - Clinical Biochemistry: Q2
Azonosítók
Szakterületek:
  • Idegsebészet
Classifying spinal tumors can be challenging due to nonspecific clinical and radiological qualities, and a precise biopsy is crucial for an accurate diagnosis and treatment planning. This study aimed to enhance the accuracy and efficiency of spinal biopsies integrating Cone Beam Computed Tomography (CBCT) and magnetic resonance imaging (MRI) modalities using an O-arm CT navigation system. Eighteen patients with different spinal lesions underwent 18 biopsies following the Stealth Station navigation system Spine 8 protocol. Preoperative MRI scans were merged with intraoperative CT navigation systems for continuous monitoring during the biopsy process. The combined imaging technique accurately identified the diseased lesion type in all biopsies, demonstrating 100% sensitivity and specificity. In conclusion, combining MRI and CT imaging modalities significantly improved spinal biopsy accuracy and efficiency, differentiating between pathological entities. However, large-scale studies are desired to validate these findings and investigate potential benefits in different clinical scenarios. Although this method requires general anesthesia, its potential profits in avoiding misdiagnosed lesions and decreasing the need for further invasive procedures make it a promising approach for improving spinal biopsy accuracy and efficiency. © 2023 by the authors.
Hivatkozás stílusok: IEEEACMAPAChicagoHarvardCSLMásolásNyomtatás
2025-04-03 11:25