https://m2.mtmt.hu/ hun 2026-04-15 21:21 BookChapter 33892096 VALIDATED true 0 false 2023-07-25T06:09:31.920+0000 2023-05-27T17:27:19.200+0000 2023-05-27T17:27:17.338+0000 true 521 Szuper Admin /api/admin/521 Admin true 2023-05-27T17:27:17.232+0000 2023-05-27T17:27:17.232+0000 2023-05-27T17:27:17.571+0000 true 521 Szuper Admin /api/admin/521 Admin true false false true 25 25 /api/publicationtype/25 PublicationType 2 true 25 BookChapter true 10000312 Conference paper true 25 25 /api/publicationtype/25 PublicationType 2 true 25 BookChapter /api/subtype/10000312 Konferenciaközlemény SubType 228 true 10000312 true 1 /api/category/1 Category true 1 Schwan, Hannes Laser Stimulated Transient Thermal Analysis of Semiconductors 6 2022 In this paper a new measurement method for the transient thermal analysis (TTA), used to determine the transient thermal impedance of power semiconductors such as MOSFETs and LEDs, is proposed. The standard TTA measurement method is generally utilized for assessment of semiconductor interconnects, but shows deficiencies in resolving defects located at layers close to the junction, like the die attach of a LED. This is due to electrical disturbances of the pulsed thermal excitation occurring in the relevant time domain below 10 mu s. For this reason the proposed method of the laser stimulated transient thermal analysis (LTTA) relies on an external heating process of the device under test via a pulsed laser, allowing for undisturbed and immediate transitions of the thermal excitation.For experimental validation of the measurement method, a test-group of three high power LEDs differing in their internal structures are soldered with two different lead free pastes (SnAgCu305 and SnAgCu107) onto Aluminum Insulated Metal Substrate (Al-IMS) boards and thermal cycled. After 100 temperature cycles with an extended range from -55 degrees C to +150 degrees C, the time resolved thermal impedances obtained from the standard TTA and the new LTTA method are compared. The results of both methods show good compliance for the thermal impedance in the time domain above 50 mu s, whereas only the laser stimulated method is able to also provide information even below 1 mu s. 2023 true true true true false NONE 2023-07-25 false 0 0 0 0 0 0 0 0 0 0 0 0 1 1 false false false false 1 8 0 3 0 true true 10002 English /api/language/10002 Angol Language true 2 false true 10899 true 10038 /api/country/10038 Country true 2149092 /api/city/10899 City true 1412702 true 22139850 /api/publicationidentifier/22139850 https://doi.org/10.1109/THERMINIC57263.2022 10.1109/THERMINIC57263.2022 PublicationIdentifier true 6 DOI https://doi.org/@@@ /api/publicationsource/6 DOI PlainSource true true 10001 /api/publicationsourcetype/10001 PublicationSourceType true true 6 true false true 22139851 /api/publicationidentifier/22139851 https://www.worldcat.org/search?q=isbn%3A9781665492294 9781665492294 PublicationIdentifier true 122 ISBN https://www.worldcat.org/search?q=isbn%3A@@@ /api/publicationsource/122 ISBN PlainSource true true 10002 /api/publicationsourcetype/10002 PublicationSourceType true false 122 true false /api/publication/33085579 true true 23 23 /api/publicationtype/23 PublicationType 3 true 23 Book Proceedings of the 28th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC'22) false false 33085579 false true true true true 10000144 Conference proceedings true 23 23 /api/publicationtype/23 PublicationType 3 true 23 Book /api/subtype/10000144 Konferenciakötet SubType 345 true 10000144 false Book 2022 true 1 /api/category/1 Category true 1 false Language 10002 /api/language/10002 Angol English true 2 true PersonAuthorship 108161078 /api/authorship/108161078 1 0.33333334 true false true Schwan Hannes true false false AuthorshipType 1 /api/authorshiptype/1 0 true 0 true false true PersonAuthorship 108161079 /api/authorship/108161079 2 0.33333334 false false false Schmid Maximilian true false false AuthorshipType 1 /api/authorshiptype/1 0 true 0 true false true PersonAuthorship 108161080 /api/authorship/108161080 3 0.33333334 false true false Elger Gordon true false false AuthorshipType 1 /api/authorshiptype/1 0 true 0 true false true PublicationIdentifier 23744168 /api/publicationidentifier/23744168 PlainSource 6 /api/publicationsource/6 PublicationSourceType 10001 /api/publicationsourcetype/10001 true true true DOI DOI https://doi.org/@@@ true true 6 true 10.1109/THERMINIC57263.2022.9950672 https://doi.org/10.1109/THERMINIC57263.2022.9950672 false true PublicationIdentifier 23744167 /api/publicationidentifier/23744167 PlainSource 1 /api/publicationsource/1 PublicationSourceType 10003 /api/publicationsourcetype/10003 false true true WoS WoS https://www.webofscience.com/wos/woscc/full-record/@@@ true true 1 true IDENTICAL 000899338800050 https://www.webofscience.com/wos/woscc/full-record/000899338800050 false true Keyword 9658 /api/keyword/9658 true 9658 true Keyword 1004082 /api/keyword/1004082 true 1004082 true Keyword 1007168 /api/keyword/1007168 true 1007168 true Keyword 1124577 /api/keyword/1124577 true 1124577 true Keyword 1584143 /api/keyword/1584143 true true /api/publication/33892096 <div class="BookChapter Publication long-list"> <div class="authors"> <img title="Idézőközlemény" style="float: left" src="/frontend/resources/grid/publication-citation-icon.png"> <div class="autype autype0"> <span class="author-name" >Schwan Hannes ✉ </span> ;&nbsp;&nbsp;&nbsp; <span class="author-name" >Schmid Maximilian </span> ;&nbsp;&nbsp;&nbsp; <span class="author-name" >Elger Gordon </span> </div> </div> <div class="title"><a href="/gui2/?mode=browse&params=publication;33892096" target="_blank">Laser Stimulated Transient Thermal Analysis of Semiconductors</a></div> <div class="InBook"><div class="chapter-in">In:</div> <div class="authors"> </div> <div class="booktitle"><a href="/gui2/?mode=browse&params=publication;33085579" target="_blank">Proceedings of the 28th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC'22) </a></div> <div class="conference"> Konferencia helye, ideje: <span class="location">Dublin, Írország <span class="conference-date">2022.09.28. - 2022.09.30.</span> </div> <span class="publishedAt">Dublin: <span class="publishers">IEEE</span>, <span class="page"> 6 p. </span> <span class="year">(2022)</span> </div> <div class="pub-footer"> <span class="language" xmlns="http://www.w3.org/1999/html">Nyelv: Angol | </span> <span class="identifiers"> <span class="id identifier oa_none" title="none"> <a style="color:black" title="10.1109/THERMINIC57263.2022.9950672" target="_blank" href="https://doi.org/10.1109/THERMINIC57263.2022.9950672"> DOI </a> </span> <span class="id identifier oa_none" title="none"> <a style="color:blue" title="000899338800050" target="_blank" href="https://www.webofscience.com/wos/woscc/full-record/000899338800050"> WoS </a> </span> </span> <span class="bookchapter-ids">Befoglaló link(ek):</span> <span class="identifiers"> <span class="id identifier oa_none" title="none"> <a style="color:black" title="10.1109/THERMINIC57263.2022" target="_blank" href="https://doi.org/10.1109/THERMINIC57263.2022"> DOI </a> </span> <span class="id identifier oa_none" title="none"> <span class="isbnOrIssn"> ISBN: </span> <a style="color:black" title="9781665492294" target="_blank" href="https://www.worldcat.org/search?q=isbn%3A9781665492294"> 9781665492294 </a> </span> </span> <div class="publication-citation"> <a target="_blank" href="/api/publication?cond=citations.related;eq;33892096&sort=publishedYear,desc&sort=title"> Idézett közlemények száma: 1 </a> </div> <div class="mtid"><span class="long-pub-mtid">Közlemény: 33892096</span> | <span class="status-data status-VALIDATED"> Egyeztetett </span> <span class="long-book-mtid">Befoglaló: 33085579</span> Idéző | <span class="type-subtype">Könyvrészlet ( Konferenciaközlemény ) </span> | <span class="pub-category">Tudományos</span> | <span class="publication-sourceOfData">WoS-XML</span> </div> <div class="lastModified">Utolsó módosítás: 2023.05.27. 19:27 Szuper Admin (admin) </div> </div> </div>