On Attacking Deep Image Quality Evaluator Via Spatial Transform

Lu, N.; Dong, L.; Yan, D.; Jiang, X.

English Conference paper (Chapter in Book) Scientific
Published: IEEE [ed.]. 2022 IEEE International Conference on Systems, Man, and Cybernetics (SMC). (2022) ISBN:9781665452588 pp. 2876-2881
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    2025-04-25 10:43