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      <label>Sárkány Zoltán et al. Thermal Transient Testing Alternatives for the Characterisation of GaN HEMT Power Devices. (2022) Megjelent: Proceedings of the 28th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC'22) pp. 1-4</label><template>&lt;div class=&quot;BookChapter Publication short-list&quot;&gt; &lt;div class=&quot;authors&quot;&gt; &lt;span class=&quot;author-name&quot; mtid=&quot;10042699&quot;&gt; &lt;a href=&quot;/gui2/?type=authors&amp;mode=browse&amp;sel=10042699&quot; target=&quot;_blank&quot;&gt;Sárkány, Zoltán&lt;/a&gt; &lt;/span&gt; &lt;span class=&quot;author-type&quot;&gt; &lt;/span&gt; ; &lt;span class=&quot;author-name&quot; &gt; Musolino, Mattia &lt;/span&gt; &lt;span class=&quot;author-type&quot;&gt; &lt;/span&gt; ; &lt;span class=&quot;author-name&quot; &gt; Sitta, Alessandro &lt;/span&gt; &lt;span class=&quot;author-type&quot;&gt; &lt;/span&gt; ; &lt;span class=&quot;author-name&quot; &gt; Calabretta, Michele &lt;/span&gt; &lt;span class=&quot;author-type&quot;&gt; &lt;/span&gt; ; &lt;span class=&quot;author-name&quot; mtid=&quot;10041313&quot;&gt; &lt;a href=&quot;/gui2/?type=authors&amp;mode=browse&amp;sel=10041313&quot; target=&quot;_blank&quot;&gt;Farkas, Gábor&lt;/a&gt; &lt;/span&gt; &lt;span class=&quot;author-type&quot;&gt; &lt;/span&gt; ; &lt;span class=&quot;author-name&quot; &gt; Németh, Márk &lt;/span&gt; &lt;span class=&quot;author-type&quot;&gt; &lt;/span&gt; ; &lt;span class=&quot;author-name&quot; mtid=&quot;10010863&quot;&gt; &lt;a href=&quot;/gui2/?type=authors&amp;mode=browse&amp;sel=10010863&quot; target=&quot;_blank&quot;&gt;Rencz, Márta&lt;/a&gt; &lt;/span&gt; &lt;span class=&quot;author-type&quot;&gt; &lt;/span&gt; &lt;/div &gt;&lt;div class=&quot;title&quot;&gt;&lt;a href=&quot;/gui2/?mode=browse&amp;params=publication;33085919&quot; mtid=&quot;33085919&quot; target=&quot;_blank&quot;&gt;Thermal Transient Testing Alternatives for the Characterisation of GaN HEMT Power Devices&lt;/a&gt;&lt;/div&gt; &lt;div class=&quot;InBook&quot;&gt;In: &lt;span class=&quot;booktitle&quot;&gt;&lt;a href=&quot;/gui2/?mode=browse&amp;params=publication;33085579&quot; target=&quot;_blank&quot;&gt;Proceedings of the 28th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC&apos;22) &lt;/a&gt;&lt;/span &gt; &lt;/div&gt;&lt;div class=&quot;pub-info&quot;&gt; &lt;span class=&quot;publishedAt&quot;&gt;Dublin, Írország : &lt;span class=&quot;publisher&quot;&gt;Institute of Electrical and Electronics Engineers (IEEE)&lt;/span&gt; &lt;span class=&quot;year&quot;&gt;(2022)&lt;/span&gt; &lt;span class=&quot;page&quot;&gt; pp. 1-4. , 4 p. &lt;/span&gt; &lt;/div&gt; &lt;div class=&quot;pub-end&quot;&gt;&lt;div class=&quot;identifier-list&quot;&gt; &lt;span class=&quot;identifiers&quot;&gt; &lt;span class=&quot;id identifier oa_none&quot; title=&quot;none&quot;&gt; &lt;a style=&quot;color:black&quot; title=&quot;10.1109/THERMINIC57263.2022.9950647&quot; target=&quot;_blank&quot; href=&quot;https://doi.org/10.1109/THERMINIC57263.2022.9950647&quot;&gt; DOI &lt;/a&gt; &lt;/span&gt; &lt;span class=&quot;id identifier oa_none&quot; title=&quot;none&quot;&gt; &lt;a style=&quot;color:black&quot; title=&quot;https://www.eet.bme.hu/~poppe/MTMT-DOCs/THERMINIC_2022-HEMT-2022159133.pdf&quot; target=&quot;_blank&quot; href=&quot;https://www.eet.bme.hu/~poppe/MTMT-DOCs/THERMINIC_2022-HEMT-2022159133.pdf&quot;&gt; Egyéb URL &lt;/a&gt; &lt;/span&gt; &lt;/span&gt; &lt;/div&gt; &lt;div class=&quot;short-pub-prop-list&quot;&gt; &lt;span class=&quot;short-pub-mtid&quot;&gt; Közlemény:33085919 &lt;/span&gt; &lt;span class=&quot;status-holder&quot;&gt;&lt;span class=&quot;status-data status-APPROVED&quot;&gt; Nyilvános &lt;/span&gt;&lt;/span&gt; &lt;span class=&quot;pub-core&quot;&gt;Forrás &lt;/span&gt; &lt;span class=&quot;pub-type&quot;&gt;Könyvrészlet (Konferenciaközlemény ) &lt;/span&gt; &lt;!-- &amp;&amp; !record.category.scientific --&gt; &lt;span class=&quot;pub-category&quot;&gt;Tudományos&lt;/span&gt; &lt;/div&gt; &lt;/div&gt; &lt;/div&gt;</template><template2>&lt;div class=&quot;BookChapter Publication long-list&quot;&gt; &lt;div class=&quot;authors&quot;&gt; &lt;img title=&quot;Forrásközlemény&quot; style=&quot;float: left&quot; src=&quot;/frontend/resources/grid/publication-core-icon.png&quot;&gt; &lt;div class=&quot;autype autype0&quot;&gt; &lt;span class=&quot;author-name&quot; mtid=&quot;10042699&quot;&gt;&lt;a href=&quot;/gui2/?type=authors&amp;mode=browse&amp;sel=10042699&quot; target=&quot;_blank&quot;&gt;Sárkány Zoltán (&lt;span class=&quot;authorship-author-name&quot;&gt;Sárkány Zoltán&lt;/span&gt; &lt;span class=&quot;authorAux-mtmt&quot;&gt; mikroelektronika, termikus tesztelés&lt;/span&gt;) &lt;/a&gt; &lt;/span&gt; ;&amp;nbsp;&amp;nbsp;&amp;nbsp; &lt;span class=&quot;author-name&quot; &gt;Musolino Mattia &lt;/span&gt; ;&amp;nbsp;&amp;nbsp;&amp;nbsp; &lt;span class=&quot;author-name&quot; &gt;Sitta Alessandro &lt;/span&gt; ;&amp;nbsp;&amp;nbsp;&amp;nbsp; &lt;span class=&quot;author-name&quot; &gt;Calabretta Michele &lt;/span&gt; ;&amp;nbsp;&amp;nbsp;&amp;nbsp; &lt;span class=&quot;author-name&quot; mtid=&quot;10041313&quot;&gt;&lt;a href=&quot;/gui2/?type=authors&amp;mode=browse&amp;sel=10041313&quot; target=&quot;_blank&quot;&gt;Farkas Gábor (&lt;span class=&quot;authorship-author-name&quot;&gt;Farkas Gábor&lt;/span&gt; &lt;span class=&quot;authorAux-mtmt&quot;&gt; Elektronikus eszközök&lt;/span&gt;) &lt;/a&gt; &lt;/span&gt; ;&amp;nbsp;&amp;nbsp;&amp;nbsp; &lt;span class=&quot;author-name&quot; &gt;Németh Márk &lt;/span&gt; ;&amp;nbsp;&amp;nbsp;&amp;nbsp; &lt;span class=&quot;author-name&quot; mtid=&quot;10010863&quot;&gt;&lt;a href=&quot;/gui2/?type=authors&amp;mode=browse&amp;sel=10010863&quot; target=&quot;_blank&quot;&gt;Rencz Márta (&lt;span class=&quot;authorship-author-name&quot;&gt;Kerecsen Istvánné Rencz Márta&lt;/span&gt; &lt;span class=&quot;authorAux-mtmt&quot;&gt; Mikroelektronika&lt;/span&gt;) &lt;/a&gt; &lt;/span&gt; &lt;/div&gt; &lt;/div&gt; &lt;div class=&quot;title&quot;&gt;&lt;a href=&quot;/gui2/?mode=browse&amp;params=publication;33085919&quot; target=&quot;_blank&quot;&gt;Thermal Transient Testing Alternatives for the Characterisation of GaN HEMT Power Devices&lt;/a&gt;&lt;/div&gt; &lt;div class=&quot;InBook&quot;&gt;&lt;div class=&quot;chapter-in&quot;&gt;In:&lt;/div&gt; &lt;div class=&quot;authors&quot;&gt; &lt;/div&gt; &lt;div class=&quot;booktitle&quot;&gt;&lt;a href=&quot;/gui2/?mode=browse&amp;params=publication;33085579&quot; target=&quot;_blank&quot;&gt;Proceedings of the 28th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC&apos;22) &lt;/a&gt;&lt;/div&gt; &lt;div class=&quot;conference&quot;&gt; Konferencia helye, ideje: &lt;span class=&quot;location&quot;&gt;Dublin, Írország &lt;span class=&quot;conference-date&quot;&gt;2022.09.28. - 2022.09.30.&lt;/span&gt; &lt;/div&gt; &lt;span class=&quot;publishedAt&quot;&gt;Dublin: &lt;span class=&quot;publishers&quot;&gt;Institute of Electrical and Electronics Engineers (IEEE)&lt;/span&gt;, &lt;span class=&quot;page&quot;&gt; pp 1-4 &lt;/span&gt; &lt;span class=&quot;year&quot;&gt;(2022)&lt;/span&gt; &lt;/div&gt; &lt;div class=&quot;pub-footer&quot;&gt; &lt;span class=&quot;language&quot; xmlns=&quot;http://www.w3.org/1999/html&quot;&gt;Nyelv: Angol | &lt;/span&gt; &lt;span class=&quot;identifiers&quot;&gt; &lt;span class=&quot;id identifier oa_none&quot; title=&quot;none&quot;&gt; &lt;a style=&quot;color:black&quot; title=&quot;10.1109/THERMINIC57263.2022.9950647&quot; target=&quot;_blank&quot; href=&quot;https://doi.org/10.1109/THERMINIC57263.2022.9950647&quot;&gt; DOI &lt;/a&gt; &lt;/span&gt; &lt;span class=&quot;id identifier oa_none&quot; title=&quot;none&quot;&gt; &lt;a style=&quot;color:black&quot; title=&quot;https://www.eet.bme.hu/~poppe/MTMT-DOCs/THERMINIC_2022-HEMT-2022159133.pdf&quot; target=&quot;_blank&quot; href=&quot;https://www.eet.bme.hu/~poppe/MTMT-DOCs/THERMINIC_2022-HEMT-2022159133.pdf&quot;&gt; Egyéb URL &lt;/a&gt; &lt;/span&gt; &lt;/span&gt; &lt;span class=&quot;bookchapter-ids&quot;&gt;Befoglaló link(ek):&lt;/span&gt; &lt;span class=&quot;identifiers&quot;&gt; &lt;span class=&quot;id identifier oa_none&quot; title=&quot;none&quot;&gt; &lt;a style=&quot;color:black&quot; title=&quot;10.1109/THERMINIC57263.2022&quot; target=&quot;_blank&quot; href=&quot;https://doi.org/10.1109/THERMINIC57263.2022&quot;&gt; DOI &lt;/a&gt; &lt;/span&gt; &lt;span class=&quot;id identifier oa_none&quot; title=&quot;none&quot;&gt; &lt;span class=&quot;isbnOrIssn&quot;&gt; ISBN: &lt;/span&gt; &lt;a style=&quot;color:black&quot; title=&quot;9781665492294&quot; target=&quot;_blank&quot; href=&quot;https://www.worldcat.org/search?q=isbn%3A9781665492294&quot;&gt; 9781665492294 &lt;/a&gt; &lt;/span&gt; &lt;/span&gt; &lt;div class=&quot;mtid&quot;&gt;&lt;span class=&quot;long-pub-mtid&quot;&gt;Közlemény: 33085919&lt;/span&gt; | &lt;span class=&quot;status-data status-APPROVED&quot;&gt; Nyilvános &lt;/span&gt; &lt;span class=&quot;long-book-mtid&quot;&gt;Befoglaló: 33085579&lt;/span&gt; Forrás | &lt;span class=&quot;type-subtype&quot;&gt;Könyvrészlet ( Konferenciaközlemény ) &lt;/span&gt; | &lt;span class=&quot;pub-category&quot;&gt;Tudományos&lt;/span&gt; | &lt;span class=&quot;publication-sourceOfData&quot;&gt;kézi felvitel&lt;/span&gt; &lt;/div&gt; &lt;div class=&quot;lastModified&quot;&gt;Utolsó módosítás: 2025.11.07. 13:25 Szatmári Erika (BME admin4) &lt;/div&gt; &lt;/div&gt; &lt;/div&gt;</template2>
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