OPTICS FOR EUV, X-RAY, AND GAMMA-RAY ASTRONOMY VIII

Pareschi, G [ed.]; ODell, SL [ed.]

English Scientific
Published: International Society for Optics and Photonics (SPIE), Bellingham (WA), United States of America 2017
Series: Proceedings of SPIE 0277-786X 1996-756X
    Identifiers
    • MTMT: 31563995
    Citation styles: IEEEACMAPAChicagoHarvardCSLCopyPrint
    2025-04-17 03:21