Standard accelerated degradation tests provide benchmarks of power semiconductors
performance, availability and reliability in terms of design loops. To fasten up such
design loops, as well as product release, accompanying tracking of temperature sensitive
electrical parameters (TSEPs) are in great demand. In this paper, a real-time tracking
concept is presented, based on the periodically measured TSEP of a power device. A
time-resolved temperature dependent voltage signal is used as a tracking parameter.
This is measured using a portable setup: a multifunction lab instrument board -Red
Pitaya v1.1- senses and analyses the voltage while a daughter board -TT Frontend-
increases the sensitivity to the sensor signal. The combination of continuously measured
TSEP and the determined changes in the time constant spectra allows early failure
detection and accelerated reliability predication in addition to analysing the performance
of different design loops under service.
