PATTERN RECOGNITION AND TRACKING XXIX

Alam, MS [ed.]

English Scientific
Published: International Society for Optics and Photonics (SPIE), Bellingham (WA), United States of America 2018
Series: Proceedings of SPIE 0277-786X 1996-756X
    Identifiers
    • MTMT: 31246586
    Citation styles: IEEEACMAPAChicagoHarvardCSLCopyPrint
    2025-04-10 19:21