SECOND SYMPOSIUM ON NOVEL TECHNOLOGY OF X-RAY IMAGING

Liu, P [ed.]; Xiao, T [ed.]; Tian, Y [ed.]

English Scientific
Published: International Society for Optics and Photonics (SPIE), Bellingham (WA), United States of America 2019
Series: Proceedings of SPIE - The International Society for Optical Engineering 1996-756X
    Identifiers
    • MTMT: 30962038
    Chapters
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    2025-04-16 20:28