Measurement-Based Multi-Domain Modeling of LEDs for “Industry 4.0”

Bein, Marton C. [Bein, Márton (Villamosmérnök), author] Department of Electron Devices (BUTE / FEEI); Bornoff, Robin; Farkas, Gabor [Farkas, Gábor (Elektronikus eszk...), author] Department of Electron Devices (BUTE / FEEI); Gaal, Lajos; Poppe, Andras [Poppe, András (Mikroelektronika), author] Department of Electron Devices (BUTE / FEEI); Rencz, Marta ✉ [Kerecsen Istvánné Rencz, Márta (Mikroelektronika), author] Department of Electron Devices (BUTE / FEEI)

English Conference paper (Conference paper) Scientific
    Identifiers
    Fundings:
    • Delphi4LED ECSEL(H2020 ECSEL 692465) Funder: ECSEL
    • Delphi4LED(NEMZ_16-1-2017-0002) Funder: NKFIH
    The Industry 4.0 initiative targets the digitalization of design and manufacturing processes. The aim of the Delphi4LED project is to trigger this transition in the solid-state lighting industry by developing testing and modelling methodologies aimed at multi-domain characterization of LED based products. The multi-domain model sums up the following parts: the electrical and optical domain is based on semiconductor physics, for the latter the key is the balance of diffusion and recombination effects realistically representing the low-current and high-current decay of efficiency. The geometry domain defines the thermal boundary and supposed to be temperature independent. For the thermal domain compact modeling and model order reduction are discussed; the suggested model is based on the one previously proposed in DELPHI project. Finally a new JEDEC standard is proposed encompassing multiple thermal test environments for a power LED which enable identifying case boundaries.
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    2026-02-11 01:27