Sixth International Symposium on Precision Engineering Measurements and Instrumentation

Tan, J [ed.]; Wen, Xianfang [ed.]

English Conference proceedings (Book) Scientific
Published: International Society for Optics and Photonics (SPIE), Bellingham (WA), United States of America 2011
Conference: 6th International Symposium on Precision Engineering Measurements and Instrumentation 2011-08-08 [Hangzhou, China]
Series: Proceedings of SPIE 0277-786X 1996-756X, 7544
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    2025-04-24 21:21