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2013 Micro- and Nanotechnology Sensors, Systems, and Applications V Conference

English Scientific

Published: , Baltimore (MD), United States of America 2013

Conference: SPIE Defense, Security + Sensing Symposium: Micro- and Nanotechnology Sensors, Systems, and Applications V Conference 2013-04-29 [Baltimore (MD), United States of America]

Series: Proceedings of SPIE 0277-786X 1996-756X, 8725

Identifiers

MTMT: 30120768

Chapters

Jakšić M et al. Radiation tolerance of silicon and diamond detectors exposed to MeV ion beams - Characterization using IBIC technique. (2013) In: 2013 Micro- and Nanotechnology Sensors, Systems, and Applications V Conference
Pastuović Ž et al. Ion beam induced charge analysis of radiation damage in silicon photodiodes. (2013) In: 2013 Micro- and Nanotechnology Sensors, Systems, and Applications V Conference

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2025-04-17 02:20

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