MACHINE VISION APPLICATIONS IN INDUSTRIAL INSPECTION VIII

Tobin, KW [ed.]

English
Published: 2000
Conference: MACHINE VISION APPLICATIONS IN INDUSTRIAL INSPECTION VIII 2000-01-24 [San Jose, CA *]
Series: Proceedings of SPIE 0277-786X 1996-756X, 3966
    Identifiers
    • MTMT: 30047998
    Chapters
    Citation styles: IEEEACMAPAChicagoHarvardCSLCopyPrint
    2025-04-25 17:58