Thermal-electronic logic circuits: Scaling down

J, Mizsei [Mizsei, János (Félvezető eszközö...), author] Department of Electron Devices (BUTE / FEEI); M C, Bein [Bein, Márton (Villamosmérnök), author] Department of Electron Devices (BUTE / FEEI); J, Lappalainen; L, Juhász [Juhász, László (Elektronikus eszk...), author] Department of Electron Devices (BUTE / FEEI)

English Article (Journal Article) Scientific
Published: MICROELECTRONICS JOURNAL 0959-8324 1879-2391 46 (12 A) pp. 1175-1178 2015
  • SJR Scopus - Electrical and Electronic Engineering: Q2
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Subjects:
  • Physical sciences
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2026-02-12 08:19