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Proceedings of the 4th International Conference on Material Sience and Material Properties for Infrared Optoelectronics

English Scientific

Published: Society for Photo-Optical Instrumentation Engineers 1999

Conference: 4th International Conference on Material Sience and Material Properties for Infrared Optoelectronics 1998-09-29 [Kijev, Kyiv, Київ, Ukraine]

Series: Proceedings of SPIE 0277-786X 1996-756X, 3890

Identifiers

MTMT: 2961697

Chapters

Kikineshi Alexander et al. Material dispersion in (As2S3)x(AsI3)1-x glasses. (1999) In: Proceedings of the 4th International Conference on Material Sience and Material Properties for Infrared Optoelectronics pp. 502-506
Dovgoshey NI et al. Thermodiffusion in Si-X-Ge33As12Se55 (X: Sb, Bi) interface. (1999) In: Proceedings of the 4th International Conference on Material Sience and Material Properties for Infrared Optoelectronics pp. 512-518

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2025-04-25 08:49

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