To accurately characterize an ADC using the sinewave histogram test the input signal
has to meet strict conditions: sampling has to be coherent, and the number of periods
has to be relative prime to the number of samples. Due to the limitations in the precision
of the sine and sampling frequency, such conditions can be checked only from the measured
signal. In this paper a new method is presented which is able to determine the meeting
of above conditions, and if the signal fails to do so, it can determine the number
of samples to be neglected in the measurement to improve the precision of the histogram
test result.
