The present status of the Tokyo electron beam ion trap

Nakamura, N; Asada, J; Currell, FJ; Fukami, T; Hirayama, T; Kato, D; Motohashi, K; Nojikawa, E; Ohtani, S; Okazaki, K; Sakurai, M; Shimizu, H; Tada, N; Tsurubuchi, S; Watanabe, H

English Scientific
Published: REVIEW OF SCIENTIFIC INSTRUMENTS 0034-6748 1089-7623 69 (2) pp. 694-696 1998
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    2021-11-29 03:24