Speckle metrology, 2003

Gastinger, K [ed.]; Lokberg, O J [ed.]; Winther, S [ed.]

English Conference proceedings (Book) Scientific
Published: International Society for Optics and Photonics (SPIE), Bellingham (WA), United States of America 2003
Conference: Speckle metrology, 2003 2003-06-18 [Trondheim, Norway]
Series: Proceedings of SPIE 0277-786X 1996-756X, 4933
    Identifiers
    • MTMT: 2006305
    Citation styles: IEEEACMAPAChicagoHarvardCSLCopyPrint
    2025-04-16 15:56