In this series of articles, a method is presented that performs (semi) quantitative
phase analysis for nanocrystalline transmission electron microscope samples from selected
area electron diffraction (SAED) patterns. Volume fractions and degree of fiber texture
are determined for the nanocrystalline components. The effect of the amorphous component
is minimized by empirical background interpolation. First, the two-dimensional SAED
pattern is converted into a one-dimensional distribution similar to X-ray diffraction.
Volume fractions of the nanocrystalline components are determined by fitting the spectral
components, calculated for the previously identified phases with a priori known structures.
These Markers are calculated not only for kinematic conditions, but the Blackwell
correction is also applied to take into account dynamic effects for medium thicknesses.
Peak shapes and experimental parameters (camera length, etc.) are refined during the
fitting iterations. Parameter space is explored with the help of the Downhill-SIMPLEX.
The method is implemented in a computer program that runs under the Windows operating
system. Part I presented the principles, while part II elaborated current implementation.
The present part III demonstrates the usage and efficiency of the computer program
by numerous examples. The suggested experimental protocol should be of benefit in
experiments aimed at phase analysis using electron diffraction methods.