The purpose of this study was to investigate the usefulness of slurry sampling for
total reflection X-ray fluorescence (TXRF) analysis of freshwater algae. Slurry samples
were prepared from freeze-dried algae by sonication. Solution samples were prepared
by vapour-phase microwave digestion. TXRF analyses of 20-200 mu g of specimens made
From freeze-dried algal samples are reported. The concentrations of P, K, Ca, Mn,
Fe, Cu, Zn and Pb were determined in the range 5-40000 mu g g(-1); similar values
have been published by other investigations for marine and freshwater algae samples.
Good agreement was found between the results of the TXRF analysis of the slurries
and the digested samples, and also the results of an additional inductively coupled
plasma atomic emission spectrometric analysis of the digested samples. Student's t-test
was used to demonstrate the applicability of slurry sampling. It is concluded that
the slurry preparation simplifies the sample treatment and is suitable for TXRF measurement.