Electron Diffraction Based Analysis of Phase Fractions and Texture in Nanocrystalline Thin Films, Part II: Implementation

Lábár, JL [Lábár, János (Szilárdtest fizika), author] MTA KFKI Műszaki Fizikai és Anyagtudományi Kuta...

English Scientific Article (Journal Article)
Published: MICROSCOPY AND MICROANALYSIS 1431-9276 1435-8115 15 (1) pp. 20-29 2009
  • SJR Scopus - Instrumentation: Q3
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    2021-12-01 20:18