{ "labelLang" : "hun", "responseDate" : "2024-03-29 12:34", "content" : { "otype" : "Citation", "mtid" : 27245540, "status" : "APPROVED", "published" : true, "unhandledTickets" : 0, "oldTimestamp" : "2018-04-07T18:42:47.000+0000", "deleted" : false, "oldId" : 17245540, "lastModified" : "2018-04-07T18:42:47.000+0000", "created" : "2018-04-07T18:03:00.000+0000", "lastDuplumOK" : "2019-10-24T13:47:13.285+0000", "lastDuplumSearch" : "2019-10-24T13:47:13.285+0000", "publication" : { "otype" : "BookChapter", "mtid" : 2694346, "link" : "/api/publication/2694346", "label" : "Villányi Balázs et al. Representative Subschema Extraction Method for Schemas in Technological Applications. (2013) Megjelent: 36th IEEE-ISSE International Spring Seminar on Electronics Technology pp. 268-273", "core" : true, "citation" : true, "publicationPending" : false, "type" : { "otype" : "PublicationType", "mtid" : 31, "link" : "/api/publicationtype/31", "label" : "Egyéb konferenciaközlemény", "code" : 31, "otypeName" : "BookChapter", "listPosition" : 4, "published" : true, "oldId" : 31, "snippet" : true }, "subType" : { "otype" : "SubType", "mtid" : 10000197, "link" : "/api/subtype/10000197", "label" : "Konferenciaközlemény (Egyéb konferenciaközlemény)", "name" : "Konferenciaközlemény", "nameEng" : "Conference paper", "docType" : { "otype" : "PublicationType", "mtid" : 31, "link" : "/api/publicationtype/31", "label" : "Egyéb konferenciaközlemény", "code" : 31, "otypeName" : "BookChapter", "listPosition" : 4, "published" : true, "oldId" : 31, "snippet" : true }, "listPosition" : 452, "published" : true, "oldId" : 10000197, "snippet" : true }, "category" : { "otype" : "Category", "mtid" : 1, "link" : "/api/category/1", "label" : "Tudományos", "published" : true, "oldId" : 1, "snippet" : true }, "languages" : [ { "otype" : "Language", "mtid" : 10002, "link" : "/api/language/10002", "label" : "Angol", "name" : "Angol", "nameEng" : "English", "published" : true, "oldId" : 2, "snippet" : true } ], "title" : "Representative Subschema Extraction Method for Schemas in Technological Applications", "identifiers" : [ { "otype" : "PublicationIdentifier", "mtid" : 866222, "link" : "/api/publicationidentifier/866222", "label" : "DOI: 10.1109/ISSE.2013.6648255", "source" : { "otype" : "PlainSource", "mtid" : 6, "link" : "/api/publicationsource/6", "label" : "DOI", "type" : { "otype" : "PublicationSourceType", "mtid" : 10001, "link" : "/api/publicationsourcetype/10001", "label" : "DOI", "mayHaveOa" : true, "published" : true, "snippet" : true }, "name" : "DOI", "nameEng" : "DOI", "linkPattern" : "https://doi.org/@@@", "publiclyVisible" : true, "published" : true, "oldId" : 6, "snippet" : true }, "oaType" : "PAY", "oaFree" : false, "validState" : "NO", "idValue" : "10.1109/ISSE.2013.6648255", "realUrl" : "https://doi.org/10.1109%2FISSE.2013.6648255", "published" : false, "oldId" : 1165873, "snippet" : true }, { "otype" : "PublicationIdentifier", "mtid" : 866223, "link" : "/api/publicationidentifier/866223", "label" : "IEEE Xplore: 6648255", "source" : { "otype" : "PlainSource", "mtid" : 22, "link" : "/api/publicationsource/22", "label" : "IEEE Xplore", "type" : { "otype" : "PublicationSourceType", "mtid" : 10004, "link" : "/api/publicationsourcetype/10004", "label" : "Kiadói adatbázis", "mayHaveOa" : false, "published" : true, "snippet" : true }, "name" : "IEEE Xplore", "linkPattern" : "http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=@@@", "publiclyVisible" : true, "published" : true, "oldId" : 22, "snippet" : true }, "oaType" : "PAY", "oaFree" : false, "validState" : "NO", "idValue" : "6648255", "realUrl" : "http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=6648255", "published" : false, "oldId" : 1709219, "snippet" : true }, { "otype" : "PublicationIdentifier", "mtid" : 866220, "link" : "/api/publicationidentifier/866220", "label" : "WoS: 000374113900051", "source" : { "otype" : "PlainSource", "mtid" : 1, "link" : "/api/publicationsource/1", "label" : "WoS", "type" : { "otype" : "PublicationSourceType", "mtid" : 10003, "link" : "/api/publicationsourcetype/10003", "label" : "Indexelő adatbázis", "mayHaveOa" : false, "published" : true, "snippet" : true }, "name" : "WoS", "nameEng" : "WoS", "linkPattern" : "http://gateway.isiknowledge.com/gateway/Gateway.cgi?&GWVersion=2&SrcAuth=CustomerName&SrcApp=CustomerName&DestLinkType=FullRecord&KeyUT=@@@&DestApp=WOS", "publiclyVisible" : true, "published" : true, "oldId" : 1, "snippet" : true }, "oaFree" : false, "validState" : "NO", "idValue" : "000374113900051", "realUrl" : "http://gateway.isiknowledge.com/gateway/Gateway.cgi?&GWVersion=2&SrcAuth=CustomerName&SrcApp=CustomerName&DestLinkType=FullRecord&KeyUT=000374113900051&DestApp=WOS", "published" : false, "oldId" : 1666768, "snippet" : true }, { "otype" : "PublicationIdentifier", "mtid" : 866221, "link" : "/api/publicationidentifier/866221", "label" : "Scopus: 84891333901", "source" : { "otype" : "PlainSource", "mtid" : 3, "link" : "/api/publicationsource/3", "label" : "Scopus", "type" : { "otype" : "PublicationSourceType", "mtid" : 10003, "link" : "/api/publicationsourcetype/10003", "label" : "Indexelő adatbázis", "mayHaveOa" : false, "published" : true, "snippet" : true }, "name" : "Scopus", "linkPattern" : "http://www.scopus.com/record/display.url?origin=inward&eid=2-s2.0-@@@", "publiclyVisible" : true, "published" : true, "oldId" : 3, "snippet" : true }, "oaFree" : false, "validState" : "NO", "idValue" : "84891333901", "realUrl" : "http://www.scopus.com/record/display.url?origin=inward&eid=2-s2.0-84891333901", "published" : false, "oldId" : 1709218, "snippet" : true }, { "otype" : "PublicationIdentifier", "mtid" : 7821944, "link" : "/api/publicationidentifier/7821944", "label" : "Google scholar: 9252005517715302307", "source" : { "otype" : "PlainSource", "mtid" : 12, "link" : "/api/publicationsource/12", "label" : "Google scholar", "type" : { "otype" : "PublicationSourceType", "mtid" : 10003, "link" : "/api/publicationsourcetype/10003", "label" : "Indexelő adatbázis", "mayHaveOa" : false, "published" : true, "snippet" : true }, "name" : "Google scholar", "linkPattern" : "http://scholar.Google.com/scholar?hl=en&lr=&cluster=@@@", "publiclyVisible" : true, "published" : true, "oldId" : 12, "snippet" : true }, "validState" : "NO", "idValue" : "9252005517715302307", "realUrl" : "http://scholar.Google.com/scholar?hl=en&lr=&cluster=9252005517715302307", "published" : false, "oldId" : 14048786, "snippet" : true }, { "otype" : "PublicationIdentifier", "mtid" : 7821945, "link" : "/api/publicationidentifier/7821945", "label" : "Google scholar hash: o-dfx_-5ZYAJ", "source" : { "otype" : "PlainSource", "mtid" : 13, "link" : "/api/publicationsource/13", "label" : "Google scholar hash", "type" : { "otype" : "PublicationSourceType", "mtid" : 10003, "link" : "/api/publicationsourcetype/10003", "label" : "Indexelő adatbázis", "mayHaveOa" : false, "published" : true, "snippet" : true }, "name" : "Google scholar hash", "nameEng" : "Google scholar hash", "linkPattern" : "http://scholar.Google.com/scholar?hl=en&lr=&cluster=@@@", "publiclyVisible" : true, "published" : true, "oldId" : 13, "snippet" : true }, "validState" : "NO", "idValue" : "o-dfx_-5ZYAJ", "realUrl" : "http://scholar.Google.com/scholar?hl=en&lr=&cluster=o-dfx_-5ZYAJ", "published" : false, "oldId" : 8114313, "snippet" : true } ], "publishedAt" : [ ], "pageLength" : 6, "publishedYear" : 2013, "foreignEdition" : true, "foreignLanguage" : true, "fullPublication" : true, "conferencePublication" : true, "nationalOrigin" : true, "published" : true, "oldId" : 2694346, "snippet" : true }, "publicationMtid" : 2694346, "related" : { "otype" : "JournalArticle", "mtid" : 3175515, "link" : "/api/publication/3175515", "label" : "O Krammer et al. New method for determining correction factors for pin-in-paste solder volumes. (2017) SOLDERING & SURFACE MOUNT TECHNOLOGY 0954-0911 29 1 2-9", "core" : true, "citation" : true, "publicationPending" : false, "type" : { "otype" : "PublicationType", "mtid" : 24, "link" : "/api/publicationtype/24", "label" : "Folyóiratcikk", "code" : 24, "otypeName" : "JournalArticle", "listPosition" : 1, "published" : true, "oldId" : 24, "snippet" : true }, "subType" : { "otype" : "SubType", "mtid" : 10000059, "link" : "/api/subtype/10000059", "label" : "Szakcikk (Folyóiratcikk)", "name" : "Szakcikk", "nameEng" : "Article", "docType" : { "otype" : "PublicationType", "mtid" : 24, "link" : "/api/publicationtype/24", "label" : "Folyóiratcikk", "code" : 24, "otypeName" : "JournalArticle", "listPosition" : 1, "published" : true, "oldId" : 24, "snippet" : true }, "listPosition" : 101, "published" : true, "oldId" : 10000059, "snippet" : true }, "category" : { "otype" : "Category", "mtid" : 1, "link" : "/api/category/1", "label" : "Tudományos", "published" : true, "oldId" : 1, "snippet" : true }, "languages" : [ { "otype" : "Language", "mtid" : 10002, "link" : "/api/language/10002", "label" : "Angol", "name" : "Angol", "nameEng" : "English", "published" : true, "oldId" : 2, "snippet" : true } ], "title" : "New method for determining correction factors for pin-in-paste solder volumes", "identifiers" : [ { "otype" : "PublicationIdentifier", "mtid" : 1169243, "link" : "/api/publicationidentifier/1169243", "label" : "DOI: 10.1108/SSMT-11-2016-0032", "source" : { "otype" : "PlainSource", "mtid" : 6, "link" : "/api/publicationsource/6", "label" : "DOI", "type" : { "otype" : "PublicationSourceType", "mtid" : 10001, "link" : "/api/publicationsourcetype/10001", "label" : "DOI", "mayHaveOa" : true, "published" : true, "snippet" : true }, "name" : "DOI", "nameEng" : "DOI", "linkPattern" : "https://doi.org/@@@", "publiclyVisible" : true, "published" : true, "oldId" : 6, "snippet" : true }, "oaType" : "PAY", "oaFree" : false, "validState" : "IDENTICAL", "idValue" : "10.1108/SSMT-11-2016-0032", "realUrl" : "https://doi.org/10.1108%2FSSMT-11-2016-0032", "published" : false, "oldId" : 1532110, "snippet" : true }, { "otype" : "PublicationIdentifier", "mtid" : 1169244, "link" : "/api/publicationidentifier/1169244", "label" : "Kiadónál: http://www.emeraldinsight.com/doi/full/10.1108/SSMT-11-2016-0032", "source" : { "otype" : "PlainSource", "mtid" : 141, "link" : "/api/publicationsource/141", "label" : "Kiadónál", "type" : { "otype" : "PublicationSourceType", "mtid" : 10006, "link" : "/api/publicationsourcetype/10006", "label" : "Link", "mayHaveOa" : true, "published" : true, "snippet" : true }, "name" : "Kiadónál", "linkPattern" : "@@@", "publiclyVisible" : true, "published" : true, "oldId" : 141, "snippet" : true }, "oaFree" : false, "validState" : "NO", "idValue" : "http://www.emeraldinsight.com/doi/full/10.1108/SSMT-11-2016-0032", "realUrl" : "http://www.emeraldinsight.com/doi/full/10.1108/SSMT-11-2016-0032", "published" : false, "oldId" : 1532111, "snippet" : true }, { "otype" : "PublicationIdentifier", "mtid" : 1169241, "link" : "/api/publicationidentifier/1169241", "label" : "WoS: 000396464600002", "source" : { "otype" : "PlainSource", "mtid" : 1, "link" : "/api/publicationsource/1", "label" : "WoS", "type" : { "otype" : "PublicationSourceType", "mtid" : 10003, "link" : "/api/publicationsourcetype/10003", "label" : "Indexelő adatbázis", "mayHaveOa" : false, "published" : true, "snippet" : true }, "name" : "WoS", "nameEng" : "WoS", "linkPattern" : "http://gateway.isiknowledge.com/gateway/Gateway.cgi?&GWVersion=2&SrcAuth=CustomerName&SrcApp=CustomerName&DestLinkType=FullRecord&KeyUT=@@@&DestApp=WOS", "publiclyVisible" : true, "published" : true, "oldId" : 1, "snippet" : true }, "oaFree" : false, "validState" : "DIFFERENT", "idValue" : "000396464600002", "realUrl" : "http://gateway.isiknowledge.com/gateway/Gateway.cgi?&GWVersion=2&SrcAuth=CustomerName&SrcApp=CustomerName&DestLinkType=FullRecord&KeyUT=000396464600002&DestApp=WOS", "published" : false, "oldId" : 1580771, "snippet" : true }, { "otype" : "PublicationIdentifier", "mtid" : 1169242, "link" : "/api/publicationidentifier/1169242", "label" : "Scopus: 85011092186", "source" : { "otype" : "PlainSource", "mtid" : 3, "link" : "/api/publicationsource/3", "label" : "Scopus", "type" : { "otype" : "PublicationSourceType", "mtid" : 10003, "link" : "/api/publicationsourcetype/10003", "label" : "Indexelő adatbázis", "mayHaveOa" : false, "published" : true, "snippet" : true }, "name" : "Scopus", "linkPattern" : "http://www.scopus.com/record/display.url?origin=inward&eid=2-s2.0-@@@", "publiclyVisible" : true, "published" : true, "oldId" : 3, "snippet" : true }, "oaFree" : false, "validState" : "NO", "idValue" : "85011092186", "realUrl" : "http://www.scopus.com/record/display.url?origin=inward&eid=2-s2.0-85011092186", "published" : false, "oldId" : 1584120, "snippet" : true } ], "journal" : { "otype" : "Journal", "mtid" : 31722, "link" : "/api/journal/31722", "label" : "SOLDERING & SURFACE MOUNT TECHNOLOGY 0954-0911", "pIssn" : "0954-0911", "reviewType" : "REVIEWED", "noIF" : false, "sciIndexed" : true, "scopusIndexed" : true, "hungarian" : false, "published" : true, "oldId" : 31722, "snippet" : true }, "volume" : "29", "issue" : "1", "publishedAt" : [ ], "pageLength" : 8, "publishedYear" : 2017, "foreignEdition" : true, "foreignLanguage" : true, "fullPublication" : true, "conferencePublication" : false, "nationalOrigin" : true, "published" : true, "oldId" : 3175515, "snippet" : true }, "relatedMtid" : 3175515, "source" : "RIS-Endnote", "externalCitation" : true, "externalCitationOK" : false, "mentionCount" : 1, "link" : "/api/citation/27245540", "label" : "O Krammer et al. New method for determining correction factors for pin-in-paste solder volumes. (2017) SOLDERING & SURFACE MOUNT TECHNOLOGY 0954-0911 29 1 2-9", "template" : "