{ "labelLang" : "hun", "responseDate" : "2024-03-29 07:37", "content" : { "otype" : "Citation", "mtid" : 26178416, "status" : "APPROVED", "published" : true, "unhandledTickets" : 0, "oldTimestamp" : "2016-12-29T18:47:29.000+0000", "deleted" : false, "oldId" : 16178416, "lastRefresh" : "2024-02-11T17:10:19.904+0000", "lastModified" : "2016-12-29T18:47:29.000+0000", "created" : "2016-11-23T14:42:41.000+0000", "adminApproved" : "2016-12-29T18:47:29.000+0000", "adminApprover" : { "otype" : "Admin", "mtid" : 10014559, "link" : "/api/admin/10014559", "label" : "Bolgár Andrea (MFA admin 4)", "familyName" : "Bolgár", "givenName" : "Andrea", "published" : true, "oldId" : 10014559, "snippet" : true }, "publication" : { "otype" : "JournalArticle", "mtid" : 2364142, "link" : "/api/publication/2364142", "label" : "Petrik P et al. Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry. (2013) THIN SOLID FILMS 0040-6090 1879-2731 541 131-135", "core" : true, "citation" : true, "publicationPending" : false, "type" : { "otype" : "PublicationType", "mtid" : 24, "link" : "/api/publicationtype/24", "label" : "Folyóiratcikk", "code" : 24, "otypeName" : "JournalArticle", "listPosition" : 1, "published" : true, "oldId" : 24, "snippet" : true }, "subType" : { "otype" : "SubType", "mtid" : 10000059, "link" : "/api/subtype/10000059", "label" : "Szakcikk (Folyóiratcikk)", "name" : "Szakcikk", "nameEng" : "Article", "docType" : { "otype" : "PublicationType", "mtid" : 24, "link" : "/api/publicationtype/24", "label" : "Folyóiratcikk", "code" : 24, "otypeName" : "JournalArticle", "listPosition" : 1, "published" : true, "oldId" : 24, "snippet" : true }, "listPosition" : 101, "published" : true, "oldId" : 10000059, "snippet" : true }, "category" : { "otype" : "Category", "mtid" : 1, "link" : "/api/category/1", "label" : "Tudományos", "published" : true, "oldId" : 1, "snippet" : true }, "languages" : [ { "otype" : "Language", "mtid" : 10002, "link" : "/api/language/10002", "label" : "Angol", "name" : "Angol", "nameEng" : "English", "published" : true, "oldId" : 2, "snippet" : true } ], "title" : "Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry", "identifiers" : [ { "otype" : "PublicationIdentifier", "mtid" : 691010, "link" : "/api/publicationidentifier/691010", "label" : "DOI: 10.1016/j.tsf.2012.12.091", "source" : { "otype" : "PlainSource", "mtid" : 6, "link" : "/api/publicationsource/6", "label" : "DOI", "type" : { "otype" : "PublicationSourceType", "mtid" : 10001, "link" : "/api/publicationsourcetype/10001", "label" : "DOI", "mayHaveOa" : true, "published" : true, "snippet" : true }, "name" : "DOI", "nameEng" : "DOI", "linkPattern" : "https://doi.org/@@@", "publiclyVisible" : true, "published" : true, "oldId" : 6, "snippet" : true }, "oaFree" : false, "validState" : "IDENTICAL", "idValue" : "10.1016/j.tsf.2012.12.091", "realUrl" : "https://doi.org/10.1016/j.tsf.2012.12.091", "published" : false, "oldId" : 458216, "snippet" : true }, { "otype" : "PublicationIdentifier", "mtid" : 691011, "link" : "/api/publicationidentifier/691011", "label" : "REAL: 6058", "source" : { "otype" : "SwordSource", "mtid" : 36, "link" : "/api/publicationsource/36", "label" : "REAL", "type" : { "otype" : "PublicationSourceType", "mtid" : 10007, "link" : "/api/publicationsourcetype/10007", "label" : "Repozitórium", "mayHaveOa" : true, "published" : true, "snippet" : true }, "name" : "REAL", "nameEng" : "REAL", "linkPattern" : "http://real.mtak.hu/@@@", "publiclyVisible" : true, "published" : true, "oldId" : 36, "snippet" : true }, "oaType" : "RESTRICTED", "oaFree" : false, "validState" : "IDENTICAL", "idValue" : "6058", "realUrl" : "http://real.mtak.hu/6058", "published" : false, "oldId" : 460441, "snippet" : true }, { "otype" : "PublicationIdentifier", "mtid" : 691008, "link" : "/api/publicationidentifier/691008", "label" : "WoS: 000323140600029", "source" : { "otype" : "PlainSource", "mtid" : 1, "link" : "/api/publicationsource/1", "label" : "WoS", "type" : { "otype" : "PublicationSourceType", "mtid" : 10003, "link" : "/api/publicationsourcetype/10003", "label" : "Indexelő adatbázis", "mayHaveOa" : false, "published" : true, "snippet" : true }, "name" : "WoS", "nameEng" : "WoS", "linkPattern" : "https://www.webofscience.com/wos/woscc/full-record/@@@", "publiclyVisible" : true, "published" : true, "oldId" : 1, "snippet" : true }, "oaFree" : false, "validState" : "IDENTICAL", "idValue" : "000323140600029", "realUrl" : "https://www.webofscience.com/wos/woscc/full-record/000323140600029", "published" : false, "oldId" : 487958, "snippet" : true }, { "otype" : "PublicationIdentifier", "mtid" : 691009, "link" : "/api/publicationidentifier/691009", "label" : "Scopus: 84880774181", "source" : { "otype" : "PlainSource", "mtid" : 3, "link" : "/api/publicationsource/3", "label" : "Scopus", "type" : { "otype" : "PublicationSourceType", "mtid" : 10003, "link" : "/api/publicationsourcetype/10003", "label" : "Indexelő adatbázis", "mayHaveOa" : false, "published" : true, "snippet" : true }, "name" : "Scopus", "linkPattern" : "http://www.scopus.com/record/display.url?origin=inward&eid=2-s2.0-@@@", "publiclyVisible" : true, "published" : true, "oldId" : 3, "snippet" : true }, "oaFree" : false, "validState" : "IDENTICAL", "idValue" : "84880774181", "realUrl" : "http://www.scopus.com/record/display.url?origin=inward&eid=2-s2.0-84880774181", "published" : false, "oldId" : 458220, "snippet" : true }, { "otype" : "PublicationIdentifier", "mtid" : 18339112, "link" : "/api/publicationidentifier/18339112", "label" : "Google scholar: 11388709184798449526", "source" : { "otype" : "PlainSource", "mtid" : 12, "link" : "/api/publicationsource/12", "label" : "Google scholar", "type" : { "otype" : "PublicationSourceType", "mtid" : 10003, "link" : "/api/publicationsourcetype/10003", "label" : "Indexelő adatbázis", "mayHaveOa" : false, "published" : true, "snippet" : true }, "name" : "Google scholar", "linkPattern" : "http://scholar.Google.com/scholar?hl=en&lr=&cluster=@@@", "publiclyVisible" : true, "published" : true, "oldId" : 12, "snippet" : true }, "validState" : "IDENTICAL", "idValue" : "11388709184798449526", "realUrl" : "http://scholar.Google.com/scholar?hl=en&lr=&cluster=11388709184798449526", "published" : true, "snippet" : true } ], "journal" : { "otype" : "Journal", "mtid" : 1313615, "link" : "/api/journal/1313615", "label" : "THIN SOLID FILMS 0040-6090 1879-2731", "pIssn" : "0040-6090", "eIssn" : "1879-2731", "reviewType" : "REVIEWED", "noIF" : false, "sciIndexed" : true, "scopusIndexed" : true, "lang" : "FOREIGN", "hungarian" : false, "published" : true, "oldId" : 1313615, "snippet" : true }, "volume" : "541", "publishedAt" : [ ], "pageLength" : 5, "publishedYear" : 2013, "foreignEdition" : true, "foreignLanguage" : true, "fullPublication" : true, "conferencePublication" : false, "nationalOrigin" : true, "published" : true, "oldId" : 2364142, "snippet" : true }, "publicationMtid" : 2364142, "related" : { "otype" : "JournalArticle", "mtid" : 26178416, "link" : "/api/publication/26178416", "label" : "Barbos C et al. Al2O3 thin films deposited by thermal atomic layer deposition: Characterization for photovoltaic applications. (2016) THIN SOLID FILMS 0040-6090 1879-2731 617 108-113", "core" : false, "citation" : true, "publicationPending" : false, "type" : { "otype" : "PublicationType", "mtid" : 24, "link" : "/api/publicationtype/24", "label" : "Folyóiratcikk", "code" : 24, "otypeName" : "JournalArticle", "listPosition" : 1, "published" : true, "oldId" : 24, "snippet" : true }, "subType" : { "otype" : "SubType", "mtid" : 10000059, "link" : "/api/subtype/10000059", "label" : "Szakcikk (Folyóiratcikk)", "name" : "Szakcikk", "nameEng" : "Article", "docType" : { "otype" : "PublicationType", "mtid" : 24, "link" : "/api/publicationtype/24", "label" : "Folyóiratcikk", "code" : 24, "otypeName" : "JournalArticle", "listPosition" : 1, "published" : true, "oldId" : 24, "snippet" : true }, "listPosition" : 101, "published" : true, "oldId" : 10000059, "snippet" : true }, "category" : { "otype" : "Category", "mtid" : 1, "link" : "/api/category/1", "label" : "Tudományos", "published" : true, "oldId" : 1, "snippet" : true }, "languages" : [ { "otype" : "Language", "mtid" : 10002, "link" : "/api/language/10002", "label" : "Angol", "name" : "Angol", "nameEng" : "English", "published" : true, "oldId" : 2, "snippet" : true } ], "title" : "Al2O3 thin films deposited by thermal atomic layer deposition: Characterization for photovoltaic applications", "identifiers" : [ { "otype" : "PublicationIdentifier", "mtid" : 11711066, "link" : "/api/publicationidentifier/11711066", "label" : "DOI: 10.1016/j.tsf.2016.02.049", "source" : { "otype" : "PlainSource", "mtid" : 6, "link" : "/api/publicationsource/6", "label" : "DOI", "type" : { "otype" : "PublicationSourceType", "mtid" : 10001, "link" : "/api/publicationsourcetype/10001", "label" : "DOI", "mayHaveOa" : true, "published" : true, "snippet" : true }, "name" : "DOI", "nameEng" : "DOI", "linkPattern" : "https://doi.org/@@@", "publiclyVisible" : true, "published" : true, "oldId" : 6, "snippet" : true }, "validState" : "IDENTICAL", "idValue" : "10.1016/j.tsf.2016.02.049", "realUrl" : "https://doi.org/10.1016/j.tsf.2016.02.049", "published" : false, "oldId" : 13638458, "snippet" : true }, { "otype" : "PublicationIdentifier", "mtid" : 11711064, "link" : "/api/publicationidentifier/11711064", "label" : "WoS: 000389115000011", "source" : { "otype" : "PlainSource", "mtid" : 1, "link" : "/api/publicationsource/1", "label" : "WoS", "type" : { "otype" : "PublicationSourceType", "mtid" : 10003, "link" : "/api/publicationsourcetype/10003", "label" : "Indexelő adatbázis", "mayHaveOa" : false, "published" : true, "snippet" : true }, "name" : "WoS", "nameEng" : "WoS", "linkPattern" : "https://www.webofscience.com/wos/woscc/full-record/@@@", "publiclyVisible" : true, "published" : true, "oldId" : 1, "snippet" : true }, "validState" : "IDENTICAL", "idValue" : "000389115000011", "realUrl" : "https://www.webofscience.com/wos/woscc/full-record/000389115000011", "published" : false, "oldId" : 14267794, "snippet" : true }, { "otype" : "PublicationIdentifier", "mtid" : 11711065, "link" : "/api/publicationidentifier/11711065", "label" : "Scopus: 84975456370", "source" : { "otype" : "PlainSource", "mtid" : 3, "link" : "/api/publicationsource/3", "label" : "Scopus", "type" : { "otype" : "PublicationSourceType", "mtid" : 10003, "link" : "/api/publicationsourcetype/10003", "label" : "Indexelő adatbázis", "mayHaveOa" : false, "published" : true, "snippet" : true }, "name" : "Scopus", "linkPattern" : "http://www.scopus.com/record/display.url?origin=inward&eid=2-s2.0-@@@", "publiclyVisible" : true, "published" : true, "oldId" : 3, "snippet" : true }, "validState" : "IDENTICAL", "idValue" : "84975456370", "realUrl" : "http://www.scopus.com/record/display.url?origin=inward&eid=2-s2.0-84975456370", "published" : false, "oldId" : 13638457, "snippet" : true } ], "journal" : { "otype" : "Journal", "mtid" : 1313615, "link" : "/api/journal/1313615", "label" : "THIN SOLID FILMS 0040-6090 1879-2731", "pIssn" : "0040-6090", "eIssn" : "1879-2731", "reviewType" : "REVIEWED", "noIF" : false, "sciIndexed" : true, "scopusIndexed" : true, "lang" : "FOREIGN", "hungarian" : false, "published" : true, "oldId" : 1313615, "snippet" : true }, "volume" : "617", "publishedAt" : [ ], "pageLength" : 6, "publishedYear" : 2016, "foreignEdition" : true, "foreignLanguage" : true, "fullPublication" : true, "conferencePublication" : false, "nationalOrigin" : false, "published" : true, "oldId" : 16178416, "snippet" : true }, "relatedMtid" : 26178416, "source" : "Scopus-RIS", "externalCitation" : true, "externalCitationOK" : false, "mentionCount" : 1, "link" : "/api/citation/26178416", "label" : "Barbos C et al. Al2O3 thin films deposited by thermal atomic layer deposition: Characterization for photovoltaic applications. (2016) THIN SOLID FILMS 0040-6090 1879-2731 617 108-113", "template" : "