{ "labelLang" : "hun", "responseDate" : "2024-03-28 14:16", "content" : { "otype" : "Citation", "mtid" : 23371459, "status" : "APPROVED", "published" : true, "unhandledTickets" : 0, "oldTimestamp" : "2014-05-10T20:03:30.000+0000", "deleted" : false, "oldId" : 13371459, "lastRefresh" : "2023-04-02T11:46:59.597+0000", "lastModified" : "2014-05-10T20:03:30.000+0000", "created" : "2013-10-10T14:45:49.000+0000", "adminApproved" : "2014-01-20T16:42:34.000+0000", "adminApprover" : { "otype" : "Admin", "mtid" : 10023327, "link" : "/api/admin/10023327", "label" : "Hubay Miklós (SZE Szakreferens (inaktív), admin)", "familyName" : "Hubay", "givenName" : "Miklós", "published" : true, "oldId" : 10023327, "snippet" : true }, "publication" : { "otype" : "BookChapter", "mtid" : 2431569, "link" : "/api/publication/2431569", "label" : "B Benyó et al. The Use of VHDL Models for Design Verification. (2000) Megjelent: IEEE European Test Workshop pp. 289-290", "core" : true, "citation" : false, "publicationPending" : false, "type" : { "otype" : "PublicationType", "mtid" : 31, "link" : "/api/publicationtype/31", "label" : "Egyéb konferenciaközlemény", "code" : 31, "otypeName" : "BookChapter", "listPosition" : 4, "published" : true, "oldId" : 31, "snippet" : true }, "subType" : { "otype" : "SubType", "mtid" : 10000175, "link" : "/api/subtype/10000175", "label" : "Absztrakt / Kivonat (Egyéb konferenciaközlemény)", "name" : "Absztrakt / Kivonat", "nameEng" : "Abstract", "docType" : { "otype" : "PublicationType", "mtid" : 31, "link" : "/api/publicationtype/31", "label" : "Egyéb konferenciaközlemény", "code" : 31, "otypeName" : "BookChapter", "listPosition" : 4, "published" : true, "oldId" : 31, "snippet" : true }, "listPosition" : 453, "published" : true, "oldId" : 10000175, "snippet" : true }, "category" : { "otype" : "Category", "mtid" : 1, "link" : "/api/category/1", "label" : "Tudományos", "published" : true, "oldId" : 1, "snippet" : true }, "languages" : [ { "otype" : "Language", "mtid" : 10002, "link" : "/api/language/10002", "label" : "Angol", "name" : "Angol", "nameEng" : "English", "published" : true, "oldId" : 2, "snippet" : true } ], "title" : "The Use of VHDL Models for Design Verification", "identifiers" : [ { "otype" : "PublicationIdentifier", "mtid" : 723817, "link" : "/api/publicationidentifier/723817", "label" : "Google scholar: 13609574615880809436", "source" : { "otype" : "PlainSource", "mtid" : 12, "link" : "/api/publicationsource/12", "label" : "Google scholar", "type" : { "otype" : "PublicationSourceType", "mtid" : 10003, "link" : "/api/publicationsourcetype/10003", "label" : "Indexelő adatbázis", "mayHaveOa" : false, "published" : true, "snippet" : true }, "name" : "Google scholar", "linkPattern" : "http://scholar.Google.com/scholar?hl=en&lr=&cluster=@@@", "publiclyVisible" : true, "published" : true, "oldId" : 12, "snippet" : true }, "oaFree" : false, "validState" : "NO", "idValue" : "13609574615880809436", "realUrl" : "http://scholar.Google.com/scholar?hl=en&lr=&cluster=13609574615880809436", "published" : false, "oldId" : 924537, "snippet" : true }, { "otype" : "PublicationIdentifier", "mtid" : 723818, "link" : "/api/publicationidentifier/723818", "label" : "Google scholar hash: 3Lu_qwHs3rwJ", "source" : { "otype" : "PlainSource", "mtid" : 13, "link" : "/api/publicationsource/13", "label" : "Google scholar hash", "type" : { "otype" : "PublicationSourceType", "mtid" : 10003, "link" : "/api/publicationsourcetype/10003", "label" : "Indexelő adatbázis", "mayHaveOa" : false, "published" : true, "snippet" : true }, "name" : "Google scholar hash", "nameEng" : "Google scholar hash", "linkPattern" : "http://scholar.Google.com/scholar?hl=en&lr=&cluster=@@@", "publiclyVisible" : true, "published" : true, "oldId" : 13, "snippet" : true }, "oaFree" : false, "validState" : "NO", "idValue" : "3Lu_qwHs3rwJ", "realUrl" : "http://scholar.Google.com/scholar?hl=en&lr=&cluster=3Lu_qwHs3rwJ", "published" : false, "oldId" : 924538, "snippet" : true } ], "publishedAt" : [ ], "pageLength" : 2, "publishedYear" : 2000, "foreignEdition" : true, "foreignLanguage" : true, "fullPublication" : false, "conferencePublication" : true, "nationalOrigin" : true, "published" : true, "oldId" : 2431569, "snippet" : true }, "publicationMtid" : 2431569, "related" : { "otype" : "BookChapter", "mtid" : 23371459, "link" : "/api/publication/23371459", "label" : "J Stefanovic et al. Test Pattern Generation Using a New VHDL Open Platform at the Behavioural Level. (2001) Megjelent: IEEE European Test Workshop (ETW2001) pp. 289-291", "core" : false, "citation" : true, "publicationPending" : false, "type" : { "otype" : "PublicationType", "mtid" : 25, "link" : "/api/publicationtype/25", "label" : "Könyvrészlet", "code" : 25, "otypeName" : "BookChapter", "listPosition" : 2, "published" : true, "oldId" : 25, "snippet" : true }, "subType" : { "otype" : "SubType", "mtid" : 10000170, "link" : "/api/subtype/10000170", "label" : "Absztrakt / Kivonat (Könyvrészlet)", "name" : "Absztrakt / Kivonat", "nameEng" : "Abstract", "docType" : { "otype" : "PublicationType", "mtid" : 25, "link" : "/api/publicationtype/25", "label" : "Könyvrészlet", "code" : 25, "otypeName" : "BookChapter", "listPosition" : 2, "published" : true, "oldId" : 25, "snippet" : true }, "listPosition" : 234, "published" : true, "oldId" : 10000170, "snippet" : true }, "category" : { "otype" : "Category", "mtid" : 1, "link" : "/api/category/1", "label" : "Tudományos", "published" : true, "oldId" : 1, "snippet" : true }, "languages" : [ { "otype" : "Language", "mtid" : 10002, "link" : "/api/language/10002", "label" : "Angol", "name" : "Angol", "nameEng" : "English", "published" : true, "oldId" : 2, "snippet" : true } ], "title" : "Test Pattern Generation Using a New VHDL Open Platform at the Behavioural Level", "identifiers" : [ { "otype" : "PublicationIdentifier", "mtid" : 6668760, "link" : "/api/publicationidentifier/6668760", "label" : "Google scholar: 673289196496050121", "source" : { "otype" : "PlainSource", "mtid" : 12, "link" : "/api/publicationsource/12", "label" : "Google scholar", "type" : { "otype" : "PublicationSourceType", "mtid" : 10003, "link" : "/api/publicationsourcetype/10003", "label" : "Indexelő adatbázis", "mayHaveOa" : false, "published" : true, "snippet" : true }, "name" : "Google scholar", "linkPattern" : "http://scholar.Google.com/scholar?hl=en&lr=&cluster=@@@", "publiclyVisible" : true, "published" : true, "oldId" : 12, "snippet" : true }, "validState" : "NO", "idValue" : "673289196496050121", "realUrl" : "http://scholar.Google.com/scholar?hl=en&lr=&cluster=673289196496050121", "published" : false, "oldId" : 16718429, "snippet" : true } ], "publishedAt" : [ ], "pageLength" : 3, "publishedYear" : 2001, "foreignLanguage" : true, "fullPublication" : false, "conferencePublication" : false, "nationalOrigin" : false, "duplumRole" : "DUPLUM", "published" : true, "oldId" : 13371459, "snippet" : true }, "relatedMtid" : 23371459, "source" : "kézi felvitel", "externalCitation" : true, "externalCitationOK" : false, "mentionCount" : 1, "link" : "/api/citation/23371459", "label" : "J Stefanovic et al. Test Pattern Generation Using a New VHDL Open Platform at the Behavioural Level. (2001) Megjelent: IEEE European Test Workshop (ETW2001) pp. 289-291", "template" : "